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    Manufacture of engineering components with designed defects for analysis of production components
    2.
    发明公开
    Manufacture of engineering components with designed defects for analysis of production components 审中-公开
    与生产成分分析人工缺陷组件的生产

    公开(公告)号：EP2530460A2

    公开(公告)日：2012-12-05

    申请号：EP12169742.9

    申请日：2012-05-29

    申请人： General Electric Company

    发明人： Rose, Curtis Wayne ,  Deaton, Jr,, John Broddus

    IPC分类号： G01N27/00 ,  G01N29/30 ,  G01N29/44 ,  G01N21/93 ,  G01N23/00

    CPC分类号： G01N29/4436 ,  B33Y80/00 ,  G01N21/91 ,  G01N21/93 ,  G01N29/043 ,  G01N29/30 ,  G01N29/4427 ,  G01N2291/0258 ,  G05B19/401

    摘要： An engineering component (60) with a designed defect and use of an engineering component (60) with a designed defect to evaluate a production component are disclosed. A test component (70) having a known defect is manufactured. This known defect is a flaw that is intentionally included in the test component (70). The test component (70) is then analyzed to obtain a test profile (40) of the defect. In addition, the engineering component (60) to be tested is analyzed to obtain a production profile (40). This production profile (40) is compared with the test profile (40) to determine whether the engineering component (60) has a defect that corresponds to the known defect.

    摘要翻译： 工程构件（60）具有设计的缺陷和使用工程构件（60）的具有设计的缺陷，以评估制造组分是游离缺失盘。 具有已知的缺陷的测试元件（70）被制造。 这个缺陷是公知的缺陷没有被有意地包括在测试元件（70）。 然后将试验部件（70）进行分析，以获得缺陷的测试配置文件（40）。 此外，待测试的工程构件（60）进行分析，以获得生产轮廓（40）。 该生产轮廓（40）与测试轮廓（40），以确定是否矿的工程构件（60）具有一个缺陷确实对应于已知的缺陷进行比较。

    Method and apparatus for inspecting components
    7.
    发明公开
    Method and apparatus for inspecting components 有权
    用于检查部件的方法和装置

    公开(公告)号：EP1176420A3

    公开(公告)日：2004-04-07

    申请号：EP01306415.9

    申请日：2001-07-26

    申请人： GENERAL ELECTRIC COMPANY

    发明人： Nath, Shridhar Champaknath ,  Rose, Curtis Wayne ,  Batzinger, Thomas James ,  Stryjek, Paul Peter

    IPC分类号： G01N27/90

    CPC分类号： G01N27/9006

    摘要： A method of inspecting a preselected area (16) of an electrically conductive component (10) to determine whether flaws (14) are present. The method includes the steps of permanently mounting an eddy current element (22) on the component (10) over the preselected area (16) and energizing the element (22) to generate alternating magnetic fields proximate the component (10). An electrical signal generated by a secondary magnetic field formed proximate the component (10) is detected using the element (22) and the detected electrical signal is compared to a reference signal to determine whether the detected signal is different than the reference signal. Differences indicate the presence of a flaw (14) in the component (10). Inspection apparatus (12) for performing this method is also disclosed.

    Method and apparatus for inspecting components
    8.
    发明公开
    Method and apparatus for inspecting components 有权
    Methode undGerätzur Inspektion von Komponenten

    公开(公告)号：EP1176420A2

    公开(公告)日：2002-01-30

    申请号：EP01306415.9

    申请日：2001-07-26

    申请人： GENERAL ELECTRIC COMPANY

    发明人： Nath, Shridhar Champaknath ,  Rose, Curtis Wayne ,  Batzinger, Thomas James ,  Stryjek, Paul Peter

    IPC分类号： G01N27/90

    CPC分类号： G01N27/9006

    摘要： A method of inspecting a preselected area (16) of an electrically conductive component (10) to determine whether flaws (14) are present. The method includes the steps of permanently mounting an eddy current element (22) on the component (10) over the preselected area (16) and energizing the element (22) to generate alternating magnetic fields proximate the component (10). An electrical signal generated by a secondary magnetic field formed proximate the component (10) is detected using the element (22) and the detected electrical signal is compared to a reference signal to determine whether the detected signal is different than the reference signal. Differences indicate the presence of a flaw (14) in the component (10). Inspection apparatus (12) for performing this method is also disclosed.

    摘要翻译： 检查导电部件（10）的预选区域（16）以确定是否存在缺陷（14）的方法。 该方法包括以下步骤：在预选区域（16）上将涡流元件（22）永久地安装在部件（10）上，并激励元件（22），以产生接近部件（10）的交变磁场。 使用元件（22）检测由靠近部件（10）形成的次级磁场产生的电信号，并将检测到的电信号与参考信号进行比较，以确定检测到的信号是否不同于参考信号。 差异表明组分（10）中存在缺陷（14）。 还公开了用于执行该方法的检查装置（12）。

    Manufacture of engineering components with designed defects for analysis of production components
    9.
    发明公开
    Manufacture of engineering components with designed defects for analysis of production components 审中-公开
    制造具有设计缺陷的工程组件，用于分析生产组件

    公开(公告)号：EP2530460A3

    公开(公告)日：2018-01-03

    申请号：EP12169742.9

    申请日：2012-05-29

    申请人： General Electric Company

    发明人： Rose, Curtis Wayne ,  Deaton, Jr., John Broddus

    IPC分类号： G01N27/00 ,  G01N29/30 ,  G01N29/44 ,  G01N21/93 ,  G01N23/00 ,  G01N29/04

    CPC分类号： G01N29/4436 ,  B33Y80/00 ,  G01N21/91 ,  G01N21/93 ,  G01N29/043 ,  G01N29/30 ,  G01N29/4427 ,  G01N2291/0258 ,  G05B19/401

    摘要： An engineering component (60) with a designed defect and use of an engineering component (60) with a designed defect to evaluate a production component are disclosed. A test component (70) having a known defect is manufactured. This known defect is a flaw that is intentionally included in the test component (70). The test component (70) is then analyzed to obtain a test profile (40) of the defect. In addition, the engineering component (60) to be tested is analyzed to obtain a production profile (40). This production profile (40) is compared with the test profile (40) to determine whether the engineering component (60) has a defect that corresponds to the known defect.

    摘要翻译： 公开了一种具有设计缺陷的工程部件（60）和具有设计缺陷的工程部件（60）的使用以评估生产部件。 制造具有已知缺陷的测试部件（70）。 这种已知缺陷是故意包含在测试部件（70）中的缺陷。 然后分析测试部件（70）以获得缺陷的测试轮廓（40）。 另外，分析要测试的工程部件（60）以获得生产简档（40）。 将该生产简档（40）与测试简档（40）进行比较以确定工程部件（60）是否具有与已知缺陷相对应的缺陷。

    Immersion inspection system for a machine and related method of operation
    10.
    发明公开
    Immersion inspection system for a machine and related method of operation 审中-公开
    Eintauchprüfsystemfüreine Maschine undzugehörigesBetriebsverfahren

    公开(公告)号：EP2801699A2

    公开(公告)日：2014-11-12

    申请号：EP14157570.4

    申请日：2014-03-04

    申请人： General Electric Company

    发明人： Lamberton, Gary Austin ,  Rose, Curtis Wayne

    IPC分类号： F01D1/04 ,  F01D25/24 ,  G01M3/02

    CPC分类号： G01M5/0025 ,  F01D21/003 ,  F05D2260/80 ,  F22B37/003 ,  G01M3/005 ,  G01M5/0033 ,  G01M5/0066 ,  G01M5/0075

    摘要： Systems, devices, and methods, adapted to immersively test/inspect machine components (e.g., tubes, conduits, etc.) in an in-situ manner are disclosed. In one embodiment, a system (100) includes: a first seal member (110) configured to sealingly engage a first portion (54) of a machine component (50); a base system (130) connected to the first seal member (110) and configured to extend within the machine component (50), the base system (130) including: a housing (140); and a inspection device (180) disposed within the housing (140) and configured to inspect the machine component (50); and a second seal member (120) connected to the base system (130) and configured to sealingly engage a second portion (56) of the machine component (50).

    摘要翻译： 公开了适于以原位方式沉浸式地测试/检查机器部件（例如管，导管等）的系统，装置和方法。 在一个实施例中，系统（100）包括：第一密封构件（110），其构造成密封地接合机器部件（50）的第一部分（54）; 连接到所述第一密封构件（110）并且构造成在所述机器部件（50）内延伸的基座系统（130），所述基座系统（130）包括：壳体（140）; 以及设置在所述壳体（140）内并且被配置为检查所述机器部件（50）的检查装置（180）。 以及第二密封构件（120），其连接到所述基座系统（130）并构造成密封地接合所述机器部件（50）的第二部分（56）。