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公开(公告)号:EP4409511A1
公开(公告)日:2024-08-07
申请号:EP22790342.4
申请日:2022-09-28
Applicant: Smiths Detection France S.A.S.
Inventor: GADI, Najib , TOBIAS, Luis
CPC classification number: G06T3/4046 , G06T2207/1011620130101 , G06T2207/2008120130101 , G06T2207/2008420130101 , G06T2207/3010820130101 , G01N2223/63920130101 , G06V10/454 , G01N23/083 , G01N23/04 , G06V10/30 , G06V20/50 , G06V10/774 , G06V10/778 , G06V10/25 , G06T5/70 , G06T5/60
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公开(公告)号:EP3710814B1
公开(公告)日:2024-02-21
申请号:EP18878621.4
申请日:2018-11-19
Inventor: GORDON, Bernard, M. , JOHNSON, Olof
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公开(公告)号:EP4285401A1
公开(公告)日:2023-12-06
申请号:EP22746346.0
申请日:2022-01-19
Applicant: Scienta Omicron AB
Inventor: OLOFSSON, Mikael , KARLSSON, Patrik
IPC: H01J49/08 , G01N23/00 , G01N23/2273 , H01J37/12 , H01J49/00
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公开(公告)号:EP4277908A1
公开(公告)日:2023-11-22
申请号:EP22701562.5
申请日:2022-01-14
Applicant: Merck Patent GmbH
Inventor: KUEHN, Clemens
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公开(公告)号:EP4263147A1
公开(公告)日:2023-10-25
申请号:EP20966152.9
申请日:2020-12-17
Applicant: American Science and Engineering, Inc.
Inventor: COUTURE, Aaron , OZTAN, Basak
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公开(公告)号:EP4236806A1
公开(公告)日:2023-09-06
申请号:EP21810822.3
申请日:2021-10-25
Applicant: Illinois Tool Works Inc.
Inventor: GRENIER, Steve J. , CROSBY, John H. , AUZENNE, Curtis D.
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公开(公告)号:EP4229659A1
公开(公告)日:2023-08-23
申请号:EP21878775.2
申请日:2021-09-15
Applicant: Goya Dental Pty Ltd
Inventor: MERVIN, Kyle Andrew
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公开(公告)号:EP4227674A1
公开(公告)日:2023-08-16
申请号:EP22000032.7
申请日:2022-02-14
Applicant: Bauer, Volker
Inventor: Bauer, Volker
Abstract: The folowing pages are for both publication and patent and are for exploration of a physical principle that is to be claimed for patent in two classes A) and B) in the claim with the same title and AnmNr EP 22 000 032.7
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公开(公告)号:EP3770589B1
公开(公告)日:2023-04-26
申请号:EP20186786.8
申请日:2020-07-20
Inventor: TSUKAMOTO, Kazunori , HONDA, Shigeru
IPC: G01N23/00 , G01N23/2206 , G01N23/2209 , G01N23/2252
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公开(公告)号:EP4152249A1
公开(公告)日:2023-03-22
申请号:EP21215220.1
申请日:2021-12-16
Applicant: Wrightbrothers Co., Ltd.
Inventor: KIM, Hee Soo
Abstract: A non-destructive inspection apparatus is provided. The non-destructive inspection apparatus includes at least one memory configured to store commands for performing predetermined operations, and at least one processor operatively coupled to the at least one memory and configured to execute the commands. The at least one processor is configured to obtain information on a transmission amount of an X-ray by emitting the X-ray to a part of a bicycle, generate a gray scale image based on the information on the transmission, measure an amount of change in a gray value from one end to the other end of the part of the bicycle represented in the gray scale image along an extending direction of the part, and detect an area in which the amount of change in the gray value is equal to or greater than a threshold, as an abnormal area.
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