摘要:
An inspection system (10) is provided and includes an eddy current (EC) probe (12) configured to induce eddy currents in a part (18). The system (10) further includes an eddy current instrument (14) coupled to the EC probe (12) and configured to apply multifrequency excitation signals to the EC probe (12) to generate multifrequency response signals. The system (10) further includes a processor (16) configured to analyze the multifrequency response signals from the EC instrument (14) by performing a multifrequency phase analysis, to inspect a subsurface of the part (18).
摘要:
A method (100) of assembling an eddy current probe (50) for use in nondestructive testing of a sample is described. The method includes positioning (112) at least one substantially planar spiral drive coil (222) within the eddy current probe (50), such that the drive coil is at least one of adjacent to and at least partially within a flexible material. The method further includes coupling (114) at least one unpackaged solid-state magnetic field sensor (228) to the at least one drive coil.
摘要:
An eddy current testing device (50) is provided. The eddy current testing device includes an eddy current array probe (70) including a tip portion, and a plurality of differential side mount coils (130, 132, 134, 136, 138, 140, 142, 144) positioned at least partially within the tip portion (110) of the eddy current array probe, the plurality of differential side mount coils flexibly coupled together to form an array (128) of coils.
摘要:
An eddy current testing device (50) is provided. The eddy current testing device includes an eddy current array probe (70) including a tip portion, and a plurality of differential side mount coils (130, 132, 134, 136, 138, 140, 142, 144) positioned at least partially within the tip portion (110) of the eddy current array probe, the plurality of differential side mount coils flexibly coupled together to form an array (128) of coils.
摘要:
A non-planar part (32) has a non-planar surface (35) such as an edge, and may contain an anomaly such as a crack (40). The non-planar part (32) is inspected using an eddy current technique. The method includes providing the non-planar part (32) having the non-planar surface (35) thereon, driving an eddy current probe (22) at two or more frequencies, measuring an eddy current response signal of the non-planar part (32) at each frequency, and performing a multifrequency phase analysis on the eddy current response signals.
摘要:
An inspection system (10) is provided and includes an eddy current (EC) probe (12) configured to induce eddy currents in a part (18). The system (10) further includes an eddy current instrument (14) coupled to the EC probe (12) and configured to apply multifrequency excitation signals to the EC probe (12) to generate multifrequency response signals. The system (10) further includes a processor (16) configured to analyze the multifrequency response signals from the EC instrument (14) by performing a multifrequency phase analysis, to inspect a subsurface of the part (18).