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1.发明授权Eddy current inspection method and system using multifrequency excitation and multifrequency phase analysis 有权涡流检测方法和使用多频激励和多频率相位分析的系统
公开(公告)号：EP1701157B1
公开(公告)日：2018-05-16
申请号：EP06251183.7
申请日：2006-03-06
IPC分类号： G01N27/90
CPC分类号： G01N27/9046 , G01N27/9086
摘要： An inspection system (10) is provided and includes an eddy current (EC) probe (12) configured to induce eddy currents in a part (18). The system (10) further includes an eddy current instrument (14) coupled to the EC probe (12) and configured to apply multifrequency excitation signals to the EC probe (12) to generate multifrequency response signals. The system (10) further includes a processor (16) configured to analyze the multifrequency response signals from the EC instrument (14) by performing a multifrequency phase analysis, to inspect a subsurface of the part (18).
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2.发明公开
公开(公告)号：EP3098600A4
公开(公告)日：2017-11-15
申请号：EP14878820
申请日：2014-09-19
申请人： SINTOKOGIO LTD
发明人： MAKINO YOSHIYASU , OTA KAZUHIRO , KAGA HIDEAKI
CPC分类号： G01N27/9046 , G01N27/90 , G01N27/9086
摘要： To provide a surface property inspection device and method capable of inspecting the surface treatment state of treated material subjected to surface treatments. A surface property inspection device 1 includes an AC power supply 10, an AC bridge circuit 20, and an evaluation apparatus 30, and the AC bridge circuit 20 is formed by a variable resistor 21 with a distribution ratio of ³, a reference detector 22, and an inspection detector 23. The inspection detector 23 includes a coil 23b wound so as to oppose the surface property inspection area of the test object M; an eddy current is excited in the test object M by supplying AC power to the coil 23b. A reference test object S with the same structure as the test object M is placed in the reference detector 22 to cancel inspection environment effects.
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3.发明公开
公开(公告)号：EP1848989A1
公开(公告)日：2007-10-31
申请号：EP06709453.2
申请日：2006-01-27
IPC分类号： G01N27/90
CPC分类号： G01N27/9086
摘要： The invention concerns a method for producing an assembly of at least one transmission coil (B1) and one reception coil (B2) for eddy current testing, the reception coil receiving in the absence of fault a complex amplitude signal VR, subjected to a variation δVR in the presence of a characteristic fault to be detected. The method consists in selecting the distance ΔER between the axes of the transmission coil and the reception coil so as to maximize the ratio I δVR/VR I.
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公开(公告)号：EP1087228A2
公开(公告)日：2001-03-28
申请号：EP00308313.6
申请日：2000-09-22
IPC分类号： G01N27/90
CPC分类号： G01N27/9086
摘要： A calibration standard for calibrating an eddy current inspection probe sized and shaped to inspect a preselected non-planar feature of a manufactured part. The feature extends in a longitudinal direction and in a lateral direction. Further, the feature has an end profile as viewed in the longitudinal direction having a substantially invariant shape and orientation. The calibration standard includes a body having a non-planar surface extending in a longitudinal direction and in a lateral direction. The standard also has an end profile as viewed in the longitudinal direction of the surface substantially identical to the profile of the feature. The surface of the body has an elongate narrow opening extending into the body substantially normal to the surface and traversing the surface of the body at a substantially constant angle with respect to the longitudinal direction of the surface as viewed normal to the surface. Methods of manufacturing a calibration standard are also disclosed.
摘要翻译： 用于校准涡流检查探头的校准标准，其尺寸和形状用于检查制造部件的预选的非平面特征。 该特征在纵向方向和横向方向上延伸。 此外，该特征具有沿纵向观察的具有基本上不变的形状和取向的端部轮廓。 校准标准包括具有在纵向方向和横向方向上延伸的非平面表面的主体。 该标准还具有在表面的纵向方向上观察的端部轮廓，其基本上与特征的轮廓相同。 主体的表面具有延伸到主体中的基本上垂直于表面的细长的狭窄开口，并且相对于垂直于表面的表面的纵向方向以基本上恒定的角度横过主体的表面。 还公开了制造校准标准的方法。
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5.发明公开System and method for normalizing and calibrating a sensor array 有权Vorrichtung und Verfahren zur Normalisierung und Eichung einer Sensormatrix
公开(公告)号：EP0969267A1
公开(公告)日：2000-01-05
申请号：EP99304814.9
申请日：1999-06-18
CPC分类号： G01N27/9086 , G01B21/042
摘要： The invention provides a system and method for normalizing and calibrating a sensor array (50). The sensor array can comprise differential element sensors (60), such as for example eddy current sensors, or absolute sensors. A single test specimen (10) is used to normalize and calibrate the sensor array using one or more scans of the test specimen. Notably, only one alignment of the sensor array to the test specimen is required. The test specimen is preferably made of the same or similar type of material as the part to be tested and is of a similar geometric shape that can have a simple flat surface or a more complex surface. A linear feature (12) and several notches (14) are machined into the surface of the specimen by using, for example, electro-discharge machining methods, to provide the necessary signals (51,53) when scanned by the sensor array. Signals from the linear feature on the test specimen are used to remove any bias and to normalize the dynamic ranges of all of the sensors in the array. Signals from the notches are used to establish the gain settings for the sensors in the array.
摘要翻译： 本发明提供了一种用于归一化和校准传感器阵列（50）的系统和方法。 传感器阵列可以包括差分元件传感器（60），例如涡流传感器或绝对传感器。 使用单个测试样本（10）来对传感器阵列进行一次或多次扫描来校正和校准。 值得注意的是，只需要将传感器阵列对准测试样本。 试样优选由与被测试部件相同或相似类型的材料制成，并且具有类似的几何形状，其可以具有简单的平坦表面或更复杂的表面。 通过使用例如放电加工方法将直线特征（12）和多个凹口（14）加工到样品的表面中，以在由传感器阵列扫描时提供必要的信号（51,53）。 来自测试样本上的线性特征的信号用于消除任何偏差并使阵列中所有传感器的动态范围归一化。 来自凹口的信号用于建立阵列中传感器的增益设置。
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公开(公告)号：EP0463509B1
公开(公告)日：1995-07-19
申请号：EP91109779.8
申请日：1991-06-14
发明人： Endress, Heribert
CPC分类号： G01N27/9086 , G01B3/30
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7.发明公开Calibration apparatus for inspecting metal tubes by eddy current techniques 失效Kalibriervorrichtung zur Untersuchung vonMetallröhrenmit Hilfe derWirbelstromprüftechnik。
公开(公告)号：EP0145899A2
公开(公告)日：1985-06-26
申请号：EP84112785.5
申请日：1984-10-24
IPC分类号： G01N27/90
CPC分类号： G01N27/9086
摘要： A calibration apparatus for simulating and calibrating, to analyze faults such as discontinuities in a metallic tube, using eddy current inspection techniques is disclosed. The simulation apparatus includes inner and outer tubular members arranged to define an annular chamber having a predetermined tubular configuration corresponding to the tubular configuration of a metallic tube under investigation. The outer tubular member has an opening through the wall thereof and the inner tubular member defines an axially extending hollow interior. A supply of electrically conductive liquid material is provided in the annular chamber, the quantity of liquid material being such as to substantially and completely fill the annular chamber in the vicinity of the opening through the wall of the outer tubular member. A defect-simulation member is supported in the opening in the outer tubular member for movement along a predetermined direction extending transverse to the axis of the inner tubular member. The defect simulator member includes a simulator portion adapted to be placed in the electrically conductive liquid material in the annular chamber. The simulator portion is made at least partially of a material having an electrical conductivity different from the electrical conductivity of the liquid material. Also, the simulator portion has a predetermined configuration corresponding to a predeter- mined type of discontinuity under investigation. Adjustment means are provided for adjusting the position of the simulator portion within the annular chamber along the predetermined direction. Further, an eddy current test probe is positioned in the hollow interior of the inner tubular member adjacent the position of the defect simulation member for generating eddy current responses which are representative of the eddy current responses which would be obtained for a tube having a configuration corresponding to the predetermined tubular configuration and having a discontinuity in the wall thereof corresponding to the predetermined type of discontinuity. The simulation apparatus is particularly useful in connection with establishing a correlation between eddy current inspection responses and the nature and extent of degradation which exists in actual tubes.
摘要翻译： 公开了一种用于模拟和校准，用于分析诸如金属管中的不连续性的故障的校准装置，其使用涡流检测技术。 模拟装置包括内部和外部管状构件，其布置成限定具有对应于正在研究的金属管的管状构造的预定管状构造的环形室。 外部管状构件具有穿过其壁的开口，内部管状构件限定轴向延伸的中空内部。 在环形室中提供导电液体材料的供应，液体材料的量通过外部管状构件的壁基本上和完全地填充在开口附近的环形室。 缺损模拟构件被支撑在外部管状构件的开口中，用于沿着横向于内部管状构件的轴线延伸的预定方向移动。 缺陷模拟器构件包括适于放置在环形室中的导电液体材料中的模拟器部分。 模拟器部分至少部分地由具有不同于液体材料的电导率的导电性的材料制成。 此外，模拟器部分具有对应于正在调查的预定类型的不连续性的预定配置。 提供调节装置，用于沿着预定方向调节环形室内的模拟器部分的位置。 此外，涡流测试探针位于邻近于缺陷模拟构件的位置的内部管状构件的中空内部，用于产生涡流响应，其代表对于具有相应配置的管的涡流响应 到预定的管状构造并且在其壁上具有与预定类型的不连续性相对应的不连续性。 模拟装置在建立涡流检测响应与存在于实际管中的退化性质和程度之间的相关性方面特别有用。
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8.发明授权
公开(公告)号：EP2270420B1
公开(公告)日：2014-11-12
申请号：EP09290508.2
申请日：2009-06-30
申请人： Services Pétroliers Schlumberger , Schlumberger Technology B.V. , Schlumberger Holdings Limited , Prad Research And Development Limited
CPC分类号： G01N27/902 , E21B47/082 , E21B49/003 , G01B7/10 , G01N27/9046 , G01N27/9073 , G01N27/9086
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9.发明公开Eddy current inspection method and system using multifrequency excitation and multifrequency phase analysis 有权WirbelstromprüfverfahrenundPrüfsystemmittels Mehrfrequenzanregung und Mehrfrequenzphasenanalyse
公开(公告)号：EP1701157A1
公开(公告)日：2006-09-13
申请号：EP06251183.7
申请日：2006-03-06
IPC分类号： G01N27/90
CPC分类号： G01N27/9046 , G01N27/9086
摘要： An inspection system (10) is provided and includes an eddy current (EC) probe (12) configured to induce eddy currents in a part (18). The system (10) further includes an eddy current instrument (14) coupled to the EC probe (12) and configured to apply multifrequency excitation signals to the EC probe (12) to generate multifrequency response signals. The system (10) further includes a processor (16) configured to analyze the multifrequency response signals from the EC instrument (14) by performing a multifrequency phase analysis, to inspect a subsurface of the part (18).
摘要翻译： 提供检查系统（10）并且包括被配置为在部分（18）中感应涡流的涡流（EC）探针（12）。 系统（10）还包括耦合到EC探头（12）的涡流仪器（14）并被配置为向EC探头（12）施加多频激励信号以产生多频响应信号。 系统（10）还包括处理器（16），其被配置为通过执行多频相分析来分析来自EC仪器（14）的多频响应信号，以检查部分（18）的地下。
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公开(公告)号：EP1478899A2
公开(公告)日：2004-11-24
申请号：EP03709731.8
申请日：2003-02-26
CPC分类号： G01N27/9086 , G01B7/28 , G01B7/281 , G01N27/902
摘要： A method of determining a surface profile of an electrically conductive object, using probe comprising a transmitter/receiver arrangement for inducing transient eddy currents in the object, for providing a signal indicative of a magnetic field property, the method comprising: a) selecting a calibration point on the surface, and a number of calibration positions of the transmitter/receiver arrangement; b) determining a set of calibration values by determining, for each of the calibration positions, a characteristic value of the signal generated in the receiver in response to transient eddy currents induced in the object by the transmitter, wherein the characteristic value relates to the amplitude of the signal; c) determining a calibration function which relates the calibration values to the relative location of calibration position and calibration point; d) selecting a set of inspection points on the surface of the object, and a set of corresponding inspection positions of the transmitter/receiver arrangement; e) determining a set of inspection values by determining, for each of the inspection positions, a characteristic value of the signal generated in the receiver in response to transient eddy currents induced in the object by the transmitter; and f) determining the surface profile by interpreting the set of inspection values, using the calibration function, wherein the relative location of inspection points and corresponding inspection positions is derived.
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