公开(公告)号：EP3069120B1

公开(公告)日：2024-08-14

申请号：EP14861914.1

申请日：2014-11-14

IPC分类号： G01N21/17 ,  G01N21/3559 ,  G01N21/3581 ,  G01N21/3586 ,  G01N21/41 ,  G01N21/86 ,  G01B11/06 ,  G01N21/21

CPC分类号： G01N21/3581 ,  G01N21/86 ,  G01N2021/866320130101 ,  G01N21/3559 ,  G01N21/3586 ,  G01N21/21 ,  G01N21/41 ,  G01N2201/0611320130101 ,  G01N2201/069720130101 ,  G01N2201/0820130101 ,  G01B11/06 ,  G01B11/0625

公开(公告)号：EP3973269B1

公开(公告)日：2024-08-07

申请号：EP20743755.9

申请日：2020-05-20

IPC分类号： G01N21/27 ,  G01N21/41

CPC分类号： G01N21/278 ,  G01N21/41

公开(公告)号：EP4353441A1

公开(公告)日：2024-04-17

申请号：EP22201433.4

申请日：2022-10-13

申请人： SIKORA AG

发明人： BOLTE, Hilmar ,  SCHUH, Kolja Tobias ,  SIKORA, Harald ,  MIESNER, Sebastian

IPC分类号： B29C48/92 ,  B29C48/09 ,  B29C48/88 ,  G01B11/24 ,  G01N21/3581

CPC分类号： B29C48/92 ,  B29C2948/9215220190201 ,  B29C2948/9212320190201 ,  B29C2948/9242820190201 ,  B29C2948/9290420190201 ,  B29C2948/9266620190201 ,  B29C2948/9244720190201 ,  B29C48/9115 ,  B29C48/09 ,  G01B11/24 ,  G01N21/3581 ,  B29C48/302 ,  B29C2948/9270420190201 ,  G01N21/41 ,  B29C48/901

摘要： Die Erfindung betrifft ein Verfahren zum Überprüfen der Einstellung einer einen entlang seiner Längsrichtung geförderten rohrförmigen Strang erzeugenden Extrusionsvorrichtung, wobei die Austrittsweiten für extrudiertes Material an einer Oberseite und an einer Unterseite einer Extrusionsdüse der Extrusionsvorrichtung unterschiedlich eingestellt ist, wobei das Verfahren folgende Schritte umfasst:
• mittels einer Terahertz-Messeinrichtung wird an einer ersten Messposition stromab zumindest einer ersten Kühlstrecke für den rohrförmigen Strang, an der der rohrförmige Strang noch nicht vollständig erstarrt ist, der Brechungsindex über den Querschnitt mindestens einer Wand des rohrförmigen Strangs gemessen,
• mittels der Terahertz-Messeinrichtung werden an der ersten Messposition weiterhin an mindestens einem Messort an der Oberseite und an mindestens einem Messort an der Unterseite des rohrförmigen Strangs Geometriewerte gemessen, wobei die Geometriewerte die Wanddicke und/oder den Innen- und/oder Außendurchmesser des rohrförmigen Strangs umfassen,
• für den gemessenen Brechungsindex und für ein Verhältnis der an der Oberseite und an der Unterseite des rohrförmigen Strangs gemessenen Geometriewerte wird anhand eines zuvor bestimmten Kalibrierzusammenhangs zwischen dem Brechungsindex an der ersten Messposition und dem Verhältnis der Austrittsweiten für extrudiertes Material an der Oberseite und an der Unterseite der Extrusionsdüse das Verhältnis der an der Extrusionsvorrichtung eingestellten Austrittsweiten für extrudiertes Material an der Oberseite und an der Unterseite der Extrusionsdüse überprüft.
Die Erfindung betrifft außerdem eine Vorrichtung zur Durchführung des erfindungsgemäßen Verfahrens.

公开(公告)号：EP3411707A1

公开(公告)日：2018-12-12

申请号：EP17706052.2

申请日：2017-02-03

申请人： Baker Hughes, a GE company, LLC

发明人： RESPINI, Marco ,  DELLA SALA, Giuseppe ,  SANDU, Corina ,  MEDINE, Gavin Mark ,  PINAPPU, Sai, Reddy

IPC分类号： G01N33/28 ,  G01N21/83

CPC分类号： G01N13/00 ,  G01N21/41 ,  G01N21/4133 ,  G01N21/83 ,  G01N33/28 ,  G01N33/2823 ,  G01N2201/12

摘要： A method is provided for determining the solubility parameters for a process stream via the joint use of turbidimetric detection of asphaltenes flocculation, which is used to determine and detect the onset flocculation of asphaltenes of the process stream, and a refractive index to determine the process stream solubility parameters such as the solubility blending number and insolubility number.

公开(公告)号：EP3203214A4

公开(公告)日：2018-05-02

申请号：EP15843536

申请日：2015-09-07

申请人： KONICA MINOLTA INC

发明人： OKUMURA YOSHIHIRO ,  GOSHIMA TAKEHIKO ,  YUASA SEIJI

IPC分类号： G01N21/41 ,  G01N21/64

CPC分类号： G01N21/553 ,  B29C45/0025 ,  B29D11/0074 ,  G01N21/41 ,  G01N21/64 ,  G01N21/6428 ,  G01N33/54373 ,  G01N2021/6439

摘要： A prism (1090) is configured from a dielectric medium and is used in analysis using surface plasmons. The prism (1090) is provided with an incidence surface (1170) on which excitation light from outside is incident, a reflection surface (1172) on which excitation light having entered the incidence surface (1170) is reflected, an emission surface (1174) from which excitation light reflected by the reflection surface (1172) is emitted, and an opposing surface (1175) opposing the reflection surface (1172). A gold film (1092) is formed on the reflection surface (1172). The opposing surface (1175) has a sink-mark surface (1200), and the sink-mark surface (1200) is a transparent surface.

公开(公告)号：EP3105566A4

公开(公告)日：2017-12-06

申请号：EP15749224

申请日：2015-02-15

申请人： THE COCA-COLA COMPANY

发明人： CAMPBALL DANIEL ,  CASPAIL JAYME ,  COBB-SULLIVAN JANET ,  JOHNSON KENNETH ,  JONES ROBERT ,  STARR LARRY ,  SLAWSON MICHAEL ,  WANG RUOYA

IPC分类号： G01N21/00 ,  G01N21/45 ,  G01N21/77 ,  G01N21/94 ,  G05D7/00

CPC分类号： G01N21/41 ,  G01N21/45 ,  G01N21/7703 ,  G01N21/94 ,  G01N33/004 ,  G01N33/0044 ,  G01N33/0047 ,  G01N2021/1765 ,  G01N2021/458 ,  G01N2021/7716 ,  G01N2021/773 ,  G01N2021/7776 ,  G01N2021/7779 ,  G01N2201/06113 ,  G01N2201/08 ,  G05D7/00

摘要： A system and method for the monitoring of carbon dioxide (CO2) for chemical contaminants. The carbon dioxide monitoring system includes a contaminant sensor that is configured to detect trace amounts of contaminants in CO2 that is pumped through it in real time. The contaminant sensor includes an interferometer configured to track the amount of contaminants.

公开(公告)号：EP3102716A4

公开(公告)日：2017-08-16

申请号：EP14891164

申请日：2014-05-08

申请人： HALLIBURTON ENERGY SERVICES INC

发明人： PRICE JAMES M ,  NAYAK ADITYA B ,  PERKINS DAVID L

IPC分类号： C23C14/54 ,  C23C14/22 ,  C23C14/32 ,  G01B11/06 ,  G01N21/41 ,  G02B1/12 ,  G02B5/28

CPC分类号： C23C14/54 ,  C23C14/22 ,  C23C14/30 ,  C23C14/545 ,  C23C14/547 ,  G01B11/06 ,  G01N21/41 ,  G02B1/12 ,  G02B5/285

摘要： Systems and methods of controlling a deposition rate during thin-film fabrication are provided. A system as provided may include a chamber, a material source contained within the chamber, an electrical component to activate the material source, a substrate holder to support the multilayer stack and at least one witness sample. The system may further include a measurement device and a computational unit. The material source provides a layer of material to the multilayer stack and to the witness sample at a deposition rate controlled at least partially by the electrical component and based on a correction value obtained in real-time by the computational unit. In some embodiments, the correction value is based on a measured value provided by the measurement device and a computed value provided by the computational unit according to a model.

摘要翻译： 提供了在薄膜制造期间控制沉积速率的系统和方法。 所提供的系统可以包括腔室，容纳在腔室内的材料源，激活材料源的电子部件，支撑多层叠堆的基板保持器以及至少一个见证样品。 该系统可以进一步包括测量装置和计算单元。 材料源以至少部分地由电气部件控制的沉积速率并且基于由计算单元实时获得的校正值向多层叠堆和证据样品提供材料层。 在一些实施例中，校正值基于由测量装置提供的测量值和由计算单元根据模型提供的计算值。

公开(公告)号：EP3137861A1

公开(公告)日：2017-03-08

申请号：EP15785223.7

申请日：2015-04-30

申请人： National University of Singapore

发明人： TRAU, Dieter Wilhelm ,  TAN, Bing Wen

IPC分类号： G01J3/02 ,  G01N21/62 ,  G01N21/03

CPC分类号： B01L3/0275 ,  B01L3/5027 ,  B01L2200/0668 ,  B01L2300/0883 ,  G01N15/06 ,  G01N21/0303 ,  G01N21/031 ,  G01N21/11 ,  G01N21/41 ,  G01N21/51 ,  G01N21/645 ,  G01N21/76 ,  G01N21/80 ,  G01N21/82 ,  G01N21/8507 ,  G01N31/221 ,  G01N2015/0687 ,  G01N2015/0693 ,  G01N2021/0314 ,  G01N2021/0346 ,  G01N2021/0382 ,  G01N2021/6434 ,  G01N2021/6482 ,  G01N2035/1062 ,  G01N2201/0221

摘要： A disposable measurement tip for an instrument for measuring at least one parameter of a sample, the measurement tip comprising; a tip body; a filling channel in the tip body for holding the sample to be analyzed and having an opening on one end of the tip body to receive the sample; a population of micro-particles held within the tip body filling channel and which can be mixed with the sample when the sample is received in the filling channel; wherein in use the sample in the tip is illuminated by the instrument and the illumination which impinges on the micro-particles is directed back, by the micro-particles, to the instrument to be detected and to thereby enable the at least one parameter to be determined.

摘要翻译： 用于测量样品至少一个参数的仪器的一次性测量尖端。 测量尖端包括尖端体（e）; 用于保持要分析的样品的尖端体中的填充通道（a） 在所述尖端体的一端上的开口（a）以接收样品; 以及可选地在另一端的第二开口（b）用光照亮。 填充通道（a）包括保持在尖端体填充通道内的微粒（c），并且当样品被接收在填充通道中时可与样品混合。 尖端中的样品被仪器照射，并且照射到微粒上的照射被微粒引导回待检测的仪器，从而能够确定至少一个参数。 尖端可以包括连接到填充通道（a）的储存腔（g，图2）。 该系统可以操作以进行光度测量，荧光测量，微量测量，肾脏测量，发光度或折射率测量。

公开(公告)号：EP3102716A1

公开(公告)日：2016-12-14

申请号：EP14891164.7

申请日：2014-05-08

申请人： Halliburton Energy Services, Inc.

发明人： PRICE, James M. ,  NAYAK, Aditya B. ,  PERKINS, David L.

IPC分类号： C23C14/54 ,  C23C14/32

CPC分类号： C23C14/54 ,  C23C14/22 ,  C23C14/30 ,  C23C14/545 ,  C23C14/547 ,  G01B11/06 ,  G01N21/41 ,  G02B1/12 ,  G02B5/285

摘要： Systems and methods of controlling a deposition rate during thin-film fabrication are provided. A system as provided may include a chamber, a material source contained within the chamber, an electrical component to activate the material source, a substrate holder to support the multilayer stack and at least one witness sample. The system may further include a measurement device and a computational unit. The material source provides a layer of material to the multilayer stack and to the witness sample at a deposition rate controlled at least partially by the electrical component and based on a correction value obtained in real-time by the computational unit. In some embodiments, the correction value is based on a measured value provided by the measurement device and a computed value provided by the computational unit according to a model.

摘要翻译： 提供了在薄膜制造期间控制沉积速率的系统和方法。 所提供的系统可以包括腔室，容纳在腔室内的材料源，用于激活材料源的电气部件，用于支撑多层叠层和至少一个见证样品的衬底保持器。 该系统还可以包括测量装置和计算单元。 材料源以至少部分地由电气部件控制的沉积速率并且基于由计算单元实时获得的校正值，向层叠堆叠和证明样品提供一层材料。 在一些实施例中，校正值基于由测量装置提供的测量值和由计算单元根据模型提供的计算值。

公开(公告)号：EP3060752A1

公开(公告)日：2016-08-31

申请号：EP13900315.6

申请日：2013-12-24

申请人： Halliburton Energy Services, Inc.

发明人： PERKINS, David L. ,  FREESE, Robert Paul ,  JONES, Christopher Michael ,  GARDNER, Richard Neal

IPC分类号： E21B47/00

CPC分类号： G01B11/0683 ,  E21B47/12 ,  E21B47/123 ,  E21B49/08 ,  G01N21/41 ,  G01N2201/06113 ,  G01N2201/12 ,  G01V8/12

摘要： Techniques include receiving a design of an integrated computational element (ICE), the ICE design including specification of a substrate and a plurality of layers, their respective target thicknesses and complex refractive indices, complex refractive indices of adjacent layers being different from each other, and a notional ICE fabricated in accordance with the ICE design being related to a characteristic of a sample over an operational wavelength range; forming at least some of the layers of the ICE in accordance with the ICE design; optically monitoring, during the forming, optical properties of the formed layers using quasi-monochromatic probe-light having a probe wavelength that is outside of the operational wavelength range of the ICE; and adjusting the forming, at least in part, based on the optically monitored optical properties of the formed layers of the ICE.