ANOMALY DIAGNOSTIC DEVICE AND INDUSTRIAL MACHINE
    2.
    发明公开
    ANOMALY DIAGNOSTIC DEVICE AND INDUSTRIAL MACHINE 有权
    况诊断设备和工业机器

    公开(公告)号:EP2634660A4

    公开(公告)日:2016-04-13

    申请号:EP11836137

    申请日:2011-10-20

    申请人: HITACHI LTD

    摘要: An object of the present invention is to provide an abnormality diagnostic system that can enhance diagnostic precision even if a computer arranged on the machine side does not have sufficient throughput in diagnosing a condition of a machine or equipment based upon time series data generated by a sensor and can reduce communication capacity because communication data volume decreases and industrial machinery provided with the abnormality diagnostic system. A diagnostic device on the machine side 2 diagnoses time series data generated by a sensor, acquires a primary diagnostic result, extracts time series data related to the primary diagnostic result and outputs it to a diagnostic device on the server side 3 together with the primary diagnostic result, the diagnostic device on the server side 3 diagnoses the time series data, acquires a secondary diagnostic result, and displays the secondary diagnostic result together with the primary diagnostic result. Besides, the diagnostic device on the server side compares the diagnostic results and updates a diagnostic process of the diagnostic device on the machine side 2 when the diagnostic results are different as a result of the comparison.