公开(公告)号：EP1361450B1

公开(公告)日：2004-12-29

申请号：EP02010478.2

申请日：2002-05-08

Applicant: Infineon Technologies AG

Inventor： Chee Hong, Liau, Eric

IPC: G01R31/30 ,  G11C29/00

CPC classification number: G11C29/56004 ,  G01R31/3004 ,  G11C29/50 ,  G11C29/56 ,  G11C2029/5006

公开(公告)号：EP1361450A1

公开(公告)日：2003-11-12

申请号：EP02010478.2

申请日：2002-05-08

Applicant: Infineon Technologies AG

Inventor： Chee Hong, Liau, Eric

IPC: G01R31/30 ,  G11C29/00

CPC classification number: G11C29/56004 ,  G01R31/3004 ,  G11C29/50 ,  G11C29/56 ,  G11C2029/5006

Abstract: The present invention relates to a method for testing an electronic component (2), especially a memory chip, which is connected to a computer system (1). At first test patterns and AC-/DC-parameters are read into the computer system (1). Then the computer system (1) generates an input test pattern for the electronic component (2). After that, a simulation process is performed processing the input test pattern by the electronic component (2) and measuring the current flowing in the electronic component (2). Afterwards the input test pattern, the measured and the expected values of current are stored in the computer system (1). The generating of the input test pattern, the simulation process and the data storage are subsequently repeated for further AC- or DC-parameters, until all AC- or DC-parameters are processed. Finally, the stored data is analysed and a statement concerning the functionality of the tested electronic component (2) is made.

Abstract translation: 本发明涉及一种用于测试连接到计算机系统（1）的电子部件（2），特别是存储芯片的方法。 首先将测试模式和AC / DC参数读入计算机系统（1）。 然后，计算机系统（1）产生用于电子部件（2）的输入测试图案。 之后，通过电子部件（2）处理输入的测试图案并测量在电子部件（2）中流动的电流，进行模拟处理。 之后，输入测试模式，测量和预期的电流值存储在计算机系统（1）中。 随后重复生成输入测试模式，模拟过程和数据存储，以获得更多的AC或DC参数，直到处理所有AC或DC参数为止。 最后，对所存储的数据进行分析，并且对所测试的电子部件（2）的功能进行说明。