公开(公告)号：EP3080618B1

公开(公告)日：2020-11-11

申请号：EP14869807.9

申请日：2014-11-19

申请人： Intel Corporation

发明人： HUTCHISON, David N. ,  HECK, John

IPC分类号： G01P15/14 ,  G01P15/02 ,  G01C19/5656 ,  B81B7/02 ,  G01C19/5712 ,  G01C19/5733 ,  G01C19/5776 ,  G01P15/093 ,  G01P15/08 ,  G01B9/02

公开(公告)号：EP3160345A1

公开(公告)日：2017-05-03

申请号：EP15811935.4

申请日：2015-06-22

申请人： Intel Corporation

发明人： KIM, Kyu Hyun ,  HUTCHISON, David N.

IPC分类号： A61B5/145 ,  A61B5/00

CPC分类号： G01J1/1626 ,  A61B5/0059 ,  A61B5/1118 ,  A61B5/14551 ,  A61B5/165 ,  A61B5/4266 ,  A61B5/7214 ,  G01J1/0204 ,  G01J1/0271 ,  G01J1/08 ,  G01J2001/0257 ,  G01J2001/1647 ,  G01N21/552

摘要： Systems and methods may provide for receiving an electrical measurement signal from a first photodetector coupled to a first waveguide and determining a total intensity level of reflected light in the first waveguide based on the electrical measurement signal. Additionally, a perspiration level of skin in contact with the first waveguide may be determined based on the total intensity level of the reflected light in the first waveguide. In one example, an electrical control signal is received from a second photodetector coupled to a second waveguide that is physically isolated from the skin, wherein the total intensity level of the reflected light in the first waveguide is determined further based on the electrical control signal.

摘要翻译： 系统和方法可以提供用于从耦合到第一波导的第一光电检测器接收电测量信号，并且基于电测量信号确定第一波导中的反射光的总强度水平。 此外，可以基于第一波导中的反射光的总强度水平确定与第一波导接触的皮肤的出汗水平。 在一个示例中，从耦合到与皮肤物理隔离的第二波导的第二光电检测器接收电控制信号，其中基于电控制信号进一步确定第一波导中的反射光的总强度水平。

公开(公告)号：EP3077860A1

公开(公告)日：2016-10-12

申请号：EP13898555.1

申请日：2013-12-03

申请人： Intel Corporation

发明人： HUTCHISON, David N. ,  RONG, Haisheng ,  HECK, John

IPC分类号： G02B6/12

CPC分类号： G02B6/422 ,  G02B6/12002 ,  G02B6/12004 ,  G02B6/12016 ,  G02B6/1203 ,  G02B6/12033 ,  G02B6/122 ,  G02B6/14 ,  G02B6/4208 ,  G02B6/4266

摘要： A portion of an optical waveguide extending laterally within a photonic integrated circuit (PIC) chip is at least partially freed from the substrate to allow physical displacement of a released waveguide end relative to the substrate and relative to an adjacent photonic device also fabricated in the substrate. The released waveguide end may be displaced to modulate interaction between the photonic device and an optical mode propagated by the waveguide. In embodiments where the photonic device is an optical coupler, employing for example an Echelle grating or arrayed waveguide grating (AWG), mode propagation through the coupler may be modulated via physical displacement of the released waveguide end. In one such embodiment, thermal sensitivity of an integrated optical wavelength division multiplexer (WDM) is reduced by displacing the released waveguide end relative to the coupler in a manner that counters a temperature dependence of the optical coupler.

公开(公告)号：EP3080617B1

公开(公告)日：2018-12-26

申请号：EP14870402.6

申请日：2014-11-19

申请人： Intel Corporation

发明人： HUTCHISON, David N. ,  HECK, John

IPC分类号： G01P3/68 ,  H01S3/10 ,  B81B7/02 ,  G01P15/093

CPC分类号： G01P15/093 ,  G01C19/56 ,  G01D5/268 ,  G01P15/14 ,  G02B26/0858 ,  G02F1/025

摘要： Embodiments of the present disclosure are directed towards a micro-electromechanical system (MEMS) sensing device, including a laser arrangement configured to generate a light beam, a first waveguide configured to receive and output a first portion of the light beam, and a second waveguide having a section that is evanescently coupled to the first waveguide and configured to receive and output a second portion of the light beam. The section of the second waveguide is configured to be movable substantially parallel to the first waveguide, wherein a movement of the section of the second waveguide may be caused by an inertial change applied to the sensing device. The movement of the section may cause a detectable change in light intensity between the first and second portions of the light beam. Based on the detected change, the inertial change may be determined. Other embodiments may be described and/or claimed.

公开(公告)号：EP3080618A1

公开(公告)日：2016-10-19

申请号：EP14869807.9

申请日：2014-11-19

申请人： Intel Corporation

发明人： HUTCHISON, David N. ,  HECK, John

IPC分类号： G01P15/14 ,  G01P15/02 ,  G01C19/5656 ,  B81B7/02

摘要： Embodiments of the present disclosure are directed towards techniques and configurations for MEMS sensing device configured to determine inertial change applied to the device. In one instance, the device may comprise a laser arrangement configured to generate a light beam, and a waveguide configured to split the light beam into two portions. The waveguide may include two arms through which the respective portions of the light beam may respectively pass, and disposed substantially parallel with each other and joined together around their respective ends to recombine the portions into a light beam. One of the arms may be deformable. A deformation of the arm may result in a change of an optical path length of a portion of the light beam traveling through the arm, causing a detectable change in light intensity of the recombined light beam outputted by the waveguide. Other embodiments may be described and/or claimed.

公开(公告)号：EP3080617A1

公开(公告)日：2016-10-19

申请号：EP14870402.6

申请日：2014-11-19

申请人： Intel Corporation

发明人： HUTCHISON, David N. ,  HECK, John

IPC分类号： G01P3/68 ,  H01S3/10 ,  B81B7/02

CPC分类号： G01P15/093 ,  G01C19/56 ,  G01D5/268 ,  G01P15/14 ,  G02B26/0858 ,  G02F1/025

摘要： Embodiments of the present disclosure are directed towards a micro-electromechanical system (MEMS) sensing device, including a laser arrangement configured to generate a light beam, a first waveguide configured to receive and output a first portion of the light beam, and a second waveguide having a section that is evanescently coupled to the first waveguide and configured to receive and output a second portion of the light beam. The section of the second waveguide is configured to be movable substantially parallel to the first waveguide, wherein a movement of the section of the second waveguide may be caused by an inertial change applied to the sensing device. The movement of the section may cause a detectable change in light intensity between the first and second portions of the light beam. Based on the detected change, the inertial change may be determined. Other embodiments may be described and/or claimed.