Barrierless high-temperature Lift-off process for forming a patterned interconnection layer
    6.
    发明公开
    Barrierless high-temperature Lift-off process for forming a patterned interconnection layer 失效
    用于形成图案化互连层的无障碍高温剥离工艺

    公开(公告)号:EP0200082A2

    公开(公告)日:1986-12-10

    申请号:EP86105142.3

    申请日:1986-04-15

    IPC分类号: H01L21/90

    摘要: A lift-off metal deposition process in which a high-temperature polyimide layer (16) (i.e. a polyimide having a high imidization temperature) is applied to a first polyimide layer (14). The two layers (14, 16) are anisotropically etched through a photoresist mask to form via holes in the first polyimide layer (14). After application of a metal layer (20), the high-temperature polyimide layer (16) is lifted off the first polyimide layer (14), which remains as a passivation layer.

    摘要翻译: 其中将高温聚酰亚胺层(16)(即具有高酰亚胺化温度的聚酰亚胺)施加到第一聚酰亚胺层(14)的剥离金属沉积工艺。 通过光刻胶掩模对两个层(14,16)进行各向异性蚀刻,以在第一聚酰亚胺层(14)中形成通孔。 在施加金属层(20)之后,将高温聚酰亚胺层(16)从第一聚酰亚胺层(14)上抬起,该第一聚酰亚胺层保留为钝化层。