摘要:
A download system for programming decoders for redundancy. Auxiliary fuse banks (10, 15) have sets of nonvolatile storage elements, such as fuses that store logic states that (a) select a redundant decoder and (b) indicate the address of a faulty row/column of memory cells (MEMORY MARCO n). When the chip (100) is first powered up, each set of nonvolatile storage elements (10A, 10B, 15A, 15Z) is accessed and downloaded to program selected redundant decoders. Because the sets of nonvolatile storage elements can be dynamically assigned to redundant decoders on an any-for-any basis, the fault tolerance of the redundancy system is enhanced.
摘要翻译:用于冗余编程解码器的下载系统。 辅助熔丝组(10,15)具有一组非易失性存储元件,例如存储逻辑状态的熔丝,(a)选择冗余解码器和(b)指示存储器单元的错误行/列的地址(MEMORY MARCO n )。 当芯片(100)首次上电时,访问和下载每组非易失性存储元件(10A,10B,15A,15Z)以编程所选择的冗余解码器。 由于非易失性存储元件的集合可以在任何基础上动态分配给冗余解码器,所以冗余系统的容错能力得到提高。
摘要:
A dual-port DRAM in which a single serial latch is shared between two pairs of folded bit lines from two arrays of memory cells (10, 20). A first set of multiplexer devices (14, 24) selects one of the two pairs of folded bit lines from each of the arrays (10, 20), and a second set of multiplexer devices (16, 26) selectively couple one of the remaining folded bit line pairs to either the parallel port or the serial latch for access to the serial port. This arrangement greatly decreases the consumption of chip real estate. At the same time, it makes unlimited vertical scrolling possible through the use of a copy mode that can be carried out in two operating cycles, and facilitates masked writing, while at the same time reducing clocking complexity.
摘要:
A semiconductor memory system in which wordline redundancy is implemented without impacting the access time. A redundant decoder circuit generates a wordline drive inhibit signal which inhibits the generation of a normal wordline signal. Deselection also deselects the normally accessed reference cells, requiring that the redundant cells provide their own reference signal. This last requirement is accomplished by utilization of twin cells for the redundant memory. Placing the redundant memory cells on the sense node side of the bit line isolators enables the effective doubling of the number of redundant cells available for each of a plurality of sub-arrays of a normal memory.
摘要:
An invention is disclosed which implements bit line redundancy in a memory module, such as a dynamic random access memory (DRAM), in accordance with a block write operation. The block write operation is commonly used in dual port RAMs, sometimes referred to as video random access memories (VRAM). Specifically, a block write operation allows a plurality of bits of data to be written to any combination of a plurality of adjacent bit lines defined by a column address. The precise combination of adjacent bit lines selected by the column address is designated by an address mask. The invention provides a memory module with a redundant bit decoder that incorporates the address masking function into the redundant bit decoder during block write operations and also bypasses the masking function during normal read and write operations. This redundant bit decoder allows a single redundant bit line to replace any single defective bit line of the selected group of block write bit lines. It eliminates the need for replacing all the selected bit lines and, thereby, saves silicon area and maximizes the utilization of the available redundant bit elements.
摘要:
In a video random access memory which includes an implementation of a serial access memory register facility which allows the external selection of the portion of the SAM to be scanned out, a control signal is provided which causes the reloading of serial access memory address counter causing the serial scanning to shift from one to another of the serial access memory registers, resulting in an ability to select a stopping point when scanning out of the serial access memory, thereby allowing both the starting and ending points of the data to be scanned out of the serial access memory, to be specified.
摘要:
A dual-port DRAM in which a single serial latch is shared between two pairs of folded bit lines from two arrays of memory cells (10, 20). A first set of multiplexer devices (14, 24) selects one of the two pairs of folded bit lines from each of the arrays (10, 20), and a second set of multiplexer devices (16, 26) selectively couple one of the remaining folded bit line pairs to either the parallel port or the serial latch for access to the serial port. This arrangement greatly decreases the consumption of chip real estate. At the same time, it makes unlimited vertical scrolling possible through the use of a copy mode that can be carried out in two operating cycles, and facilitates masked writing, while at the same time reducing clocking complexity.
摘要:
A semiconductor memory system in which wordline redundancy is implemented without impacting the access time. A redundant decoder circuit generates a wordline drive inhibit signal which inhibits the generation of a normal wordline signal. Deselection also deselects the normally accessed reference cells, requiring that the redundant cells provide their own reference signal. This last requirement is accomplished by utilization of twin cells for the redundant memory. Placing the redundant memory cells on the sense node side of the bit line isolators enables the effective doubling of the number of redundant cells available for each of a plurality of sub-arrays of a normal memory.
摘要:
A semiconductor memory system in which wordline redundancy is implemented without impacting the access time. A redundant decoder circuit generates a wordline drive inhibit signal which inhibits the generation of a normal wordline signal. Deselection also deselects the normally accessed reference cells, requiring that the redundant cells provide their own reference signal. This last requirement is accomplished by utilization of twin cells for the redundant memory. Placing the redundant memory cells on the sense node side of the bit line isolators enables the effective doubling of the number of redundant cells available for each of a plurality of sub-arrays of a normal memory.