公开(公告)号：EP1674851A2

公开(公告)日：2006-06-28

申请号：EP05112430.3

申请日：2005-12-19

Applicant: JASCO CORPORATION

Inventor： Narita, Yoshihito ,  Kimura, Shigeyuki ,  Sato, Fuminori ,  Yamada, Atsushi

IPC: G01N13/14 ,  G12B21/06

CPC classification number: G01Q60/22

Abstract: A near field analysis apparatus comprising: an irradiation optical system and a light collecting optical system, characterized by: the irradiation optical system comprising an irradiation-side adjustable optical system for adjusting the position or angle of optical axis thereof, and irradiating irradiation-side guide light onto an adjustment surface via the adjustable optical system; the light collecting optical system comprising a light-collection-side adjustable optical system for adjusting the position or angle of optical axis thereof, and irradiating light-collection-side guide light onto the adjustment surface via the adjustable optical system; an irradiation-side adjustment device for adjusting the position or angle of the adjustable optical system such that the spots of guide light, which are observed at the adjustment surface, match; and a light-collection-side adjustment device for adjusting the position or angle of the adjustable optical system such that the spots of the guide light, which are observed at the adjustment surface, match.

Abstract translation: 1.一种近场分析装置，包括：照射光学系统和光收集光学系统，其特征在于：所述照射光学系统包括用于调整其光轴的位置或角度的照射侧可调节光学系统，以及照射辐射侧导向件 通过可调光学系统将光线照射到调整表面上; 所述光收集光学系统包括用于调节其光轴的位置或角度的光收集侧可调节光学系统，以及经由所述可调节光学系统将光收集侧引导光照射到所述调节表面上; 照射侧调节装置，用于调节所述可调光学系统的位置或角度，使得在所述调节表面处观察到的所述引导光斑匹配; 以及光线收集侧调节装置，用于调节可调节光学系统的位置或角度，使得在调节表面处观察到的导光的光斑匹配。

公开(公告)号：EP1715322A3

公开(公告)日：2007-04-11

申请号：EP06111974.9

申请日：2006-03-30

Applicant: JASCO CORPORATION

Inventor： Inoue, Tsutomu ,  Sato, Fuminori ,  Narita, Yoshihito ,  Senuma, Mutsumi

IPC: G01N13/14 ,  G12B21/06 ,  G01J4/02

CPC classification number: G01J4/00 ,  G01N21/21 ,  G01Q30/02 ,  G01Q60/22

Abstract: A near-field polarized-light measurement apparatus 10 comprises a near-field probe 14, an analyzer 18, a detector 22, and an analyzer-rotating unit 20. The near-field probe 14 has at a tip thereof an opening smaller than the wavelength of light used for measurement and generates linearly polarized near-field light from the opening and irradiates a sample with the near-field light. The detector 22 detects light transmitted through the sample via the analyzer 18. The analyzer-rotating unit 20 rotates the analyzer 18 about an optical axis to vary the angle of a transmission axis thereof. And optical rotation of the sample is measured by rotating the analyzer 18 with the analyzer-rotating unit 20.

Abstract translation: 近场偏振光测量装置10包括近场探头14，分析器18，检测器22和分析器旋转单元20.近场探头14的尖端具有小于 用于测量的光的波长并且从开口产生线性偏振的近场光并且用近场光照射样本。 检测器22通过分析器18检测透过样本的光。分析器旋转单元20围绕光轴旋转分析器18以改变其透射轴的角度。 并且通过用分析器旋转单元20旋转分析器18来测量样品的旋光度。

公开(公告)号：EP1674851A3

公开(公告)日：2006-09-20

申请号：EP05112430.3

申请日：2005-12-19

Applicant: JASCO CORPORATION

Inventor： Narita, Yoshihito ,  Kimura, Shigeyuki ,  Sato, Fuminori ,  Yamada, Atsushi

IPC: G01N13/14 ,  G12B21/06

CPC classification number: G01Q60/22

Abstract: A near field analysis apparatus comprising: an irradiation optical system and a light collecting optical system, characterized by: the irradiation optical system comprising an irradiation-side adjustable optical system for adjusting the position or angle of optical axis thereof, and irradiating irradiation-side guide light onto an adjustment surface via the adjustable optical system; the light collecting optical system comprising a light-collection-side adjustable optical system for adjusting the position or angle of optical axis thereof, and irradiating light-collection-side guide light onto the adjustment surface via the adjustable optical system; an irradiation-side adjustment device for adjusting the position or angle of the adjustable optical system such that the spots of guide light, which are observed at the adjustment surface, match; and a light-collection-side adjustment device for adjusting the position or angle of the adjustable optical system such that the spots of the guide light, which are observed at the adjustment surface, match.

公开(公告)号：EP1674851B1

公开(公告)日：2007-11-21

申请号：EP05112430.3

申请日：2005-12-19

Applicant: JASCO CORPORATION

Inventor： Narita, Yoshihito ,  Kimura, Shigeyuki ,  Sato, Fuminori ,  Yamada, Atsushi

IPC: G01N13/14 ,  G12B21/06

CPC classification number: G01Q60/22

公开(公告)号：EP1715322A2

公开(公告)日：2006-10-25

申请号：EP06111974.9

申请日：2006-03-30

Applicant: JASCO CORPORATION

Inventor： Inoue, Tsutomu ,  Sato, Fuminori ,  Narita, Yoshihito ,  Senuma, Mutsumi

IPC: G01N13/14 ,  G12B21/06

CPC classification number: G01J4/00 ,  G01N21/21 ,  G01Q30/02 ,  G01Q60/22

Abstract: A near-field polarized-light measurement apparatus 10 comprises a near-field probe 14, an analyzer 18, a detector 22, and an analyzer-rotating unit 20. The near-field probe 14 has at a tip thereof an opening smaller than the wavelength of light used for measurement and generates linearly polarized near-field light from the opening and irradiates a sample with the near-field light. The detector 22 detects light transmitted through the sample via the analyzer 18. The analyzer-rotating unit 20 rotates the analyzer 18 about an optical axis to vary the angle of a transmission axis thereof. And optical rotation of the sample is measured by rotating the analyzer 18 with the analyzer-rotating unit 20.

Abstract translation: 近场偏振光测量装置10包括近场探针14，分析器18，检测器22和分析器旋转单元20.近场探针14的尖端处具有小于 用于测量的光的波长，并从该开口产生线偏振的近场光，并用近场光照射样本。 检测器22通过分析器18检测透过样品的光。分析器旋转单元20使分析器18围绕光轴旋转，以改变其透射轴的角度。 通过用分析仪旋转单元20旋转分析器18来测量样品的旋光度。