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    OPTICAL SPECTRUM ANALYZER
    6.
    发明授权
    OPTICAL SPECTRUM ANALYZER 有权
    光谱分析仪

    公开(公告)号：EP1252489B1

    公开(公告)日：2003-12-17

    申请号：EP01900347.4

    申请日：2001-01-04

    Applicant: EXFO ELECTRO-OPTICAL ENGINEERING INC.

    Inventor： HE, Gang ,  GARIEPY, Daniel ,  SCHINN, Gregory, Walter

    IPC: G01J3/12 ,  G01J4/02 ,  G01J3/447

    CPC classification number: G01J3/12 ,  G01J3/447 ,  G01J4/02

    Abstract: An optical spectrum analyzer comprises a diffraction grating (DG), a polarization decomposing unit (PDM) for decomposing the input light beam into first and second light beams having mutually-perpendicular linear states of polarization, and two output ports (FP2/1, FP2/2) each for receiving from the grating, substantially exclusively, a respective one of the polarized light beams (LT, LR) after diffraction by the diffraction grating (DG). Each of the linearly-polarized light beams is directed onto the diffraction grating with its linear state of polarization at any prescribed angle to a corresponding plane of diffraction of the diffraction grating. The arrangement is such that the state of polarization of the light beams, at any particular wavelength within an operating band of the analyzer remains substantially unchanged with respect to time. The analyzer also may have a reflector (RAM) for reflecting the light beams leaving the diffraction grating after diffraction a first time so as to return them to the diffraction grating for diffraction a second time.

    DISPOSITIF ET PROCÉDÉ D'ANALYSE POLARIMÉTRIQUE À DIVISION DE FRONT D'ONDE, SPECTROPOLARIMÈTRE, CAMÉRA POLARIMÉTRIQUE ET MICROSCOPE OPTIQUE UTILISANT UN TEL DISPOSITIF
    9.
    发明公开
    DISPOSITIF ET PROCÉDÉ D'ANALYSE POLARIMÉTRIQUE À DIVISION DE FRONT D'ONDE, SPECTROPOLARIMÈTRE, CAMÉRA POLARIMÉTRIQUE ET MICROSCOPE OPTIQUE UTILISANT UN TEL DISPOSITIF 有权
    FOR POLARIMETERIC波阵区划分析，spectropo-，POLARIMETERIC摄像机和光学显微镜这样的设备分析方法和设备

    公开(公告)号：EP2877822A1

    公开(公告)日：2015-06-03

    申请号：EP13756601.4

    申请日：2013-07-25

    Applicant: Horiba Jobin Yvon S.A.S.

    Inventor： ACHER, Olivier ,  RICHARD, Simon ,  NGUYEN, Thanh-Liem

    IPC: G01J4/02 ,  G01J4/04

    CPC classification number: G01J4/02 ,  G01J4/04

    Abstract: The invention relates to an accurate and robust wavefront-division polarimetric analysis device, allowing the quasi-instantaneous measurement of the polarisation states of a luminous object. The wavefront-division polarimetric analysis device of the invention can be used to produce a plurality of light beams, all polarised according to different polarisation states, from a single upstream light beam. The polarised light beams, which do not overlap and which carry information items that are complementary in terms of polarisation, are analysed simultaneously by a plurality of detectors that measure the luminous intensity of each beam. Processing means digitally process the luminous intensity values obtained in order to determine the polarisation state of the upstream light beam. According to the invention, the operations performed by the processing means on the luminous intensity values prevent luminous intensity variations in the divided light beams during the division of the wavefront of the upstream light beam. Therefore the wavefront-division polarimetric analysis device of the invention is robust and its accuracy is not hindered by the experimental conditions. The invention further relates to a wavefront-division polarimetric analysis method for determining the polarisation state of an upstream light beam.

    Near-field polarized-light measurement apparatus
    10.
    发明公开
    Near-field polarized-light measurement apparatus 审中-公开
    近场偏振光测量装置

    公开(公告)号：EP1715322A3

    公开(公告)日：2007-04-11

    申请号：EP06111974.9

    申请日：2006-03-30

    Applicant: JASCO CORPORATION

    Inventor： Inoue, Tsutomu ,  Sato, Fuminori ,  Narita, Yoshihito ,  Senuma, Mutsumi

    IPC: G01N13/14 ,  G12B21/06 ,  G01J4/02

    CPC classification number: G01J4/00 ,  G01N21/21 ,  G01Q30/02 ,  G01Q60/22

    Abstract: A near-field polarized-light measurement apparatus 10 comprises a near-field probe 14, an analyzer 18, a detector 22, and an analyzer-rotating unit 20. The near-field probe 14 has at a tip thereof an opening smaller than the wavelength of light used for measurement and generates linearly polarized near-field light from the opening and irradiates a sample with the near-field light. The detector 22 detects light transmitted through the sample via the analyzer 18. The analyzer-rotating unit 20 rotates the analyzer 18 about an optical axis to vary the angle of a transmission axis thereof. And optical rotation of the sample is measured by rotating the analyzer 18 with the analyzer-rotating unit 20.

    Abstract translation: 近场偏振光测量装置10包括近场探头14，分析器18，检测器22和分析器旋转单元20.近场探头14的尖端具有小于 用于测量的光的波长并且从开口产生线性偏振的近场光并且用近场光照射样本。 检测器22通过分析器18检测透过样本的光。分析器旋转单元20围绕光轴旋转分析器18以改变其透射轴的角度。 并且通过用分析器旋转单元20旋转分析器18来测量样品的旋光度。

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