Apparatus and method for generating a spiral gas stream in a pipeline
    1.
    发明公开
    Apparatus and method for generating a spiral gas stream in a pipeline 失效
    装置和用于在管道产生螺旋气流的方法。

    公开(公告)号:EP0138015A1

    公开(公告)日:1985-04-24

    申请号:EP84110434.2

    申请日:1984-09-03

    摘要: A spiral gas stream is generated in a pipeline when a uniform flow of gas flowing in a cylinder having inner diameter larger than that of the pipeline is introduced through a funnelform reducer into the inlet of the pipeline and bringing the mean gas stream velocity in the pipeline faster than 20 meter per second. The uniform flow of gas is formed in the cylinder easily when outside low pressure gas is fed into the cylinder through a feed gas inlet pipe installed diagonally at the side of the cylinder apart from the bottom plate so as to make the flow line of the feed gas to cross the axis of the cylinder and inclined toward the bottom plate. When solid particles are introduced into the spiral gas stream zone, they are transported to the outlet of the pipeline. As the compressed gas layer is formed along the inside wall of the pipeline by the spiral motion of gas stream, solid particles don't contact directly with the inside wall of the pipeline and don't hurt it. As the center part of the cross section of the pipeline becomes very low pressure, especially along the axis of the pipeline, solid particles containing or accompanying volatile matters are desiccated or concentrated as a result of the evaporation of volatile matters while being transported in the pipeline. Solid particles deposited on the bottom of water can be dredged and dehydrated by the spiral gas stream transportation system. When solid particles transported by spiral gas stream in two or more pipelines are arranged to collide with mutually, pulverized fine solid particles are recovered. A chemical reaction which can not or hardly to proceed at normal temperature and pressure is promoted in a spiral gas strearr zone.

    Surface condition measurement apparatus
    4.
    发明公开
    Surface condition measurement apparatus 失效
    表面条件测量装置

    公开(公告)号:EP0543326A3

    公开(公告)日:1993-11-24

    申请号:EP92119607.7

    申请日:1992-11-17

    IPC分类号: G01N21/47 G01J5/60 G01B11/30

    CPC分类号: G01J5/60 G01J2005/0074

    摘要: Radiated light with a specified wavelength from a material (21, P, 201) is detected and a first parameter corresponding to the emissivity ratio is obtained from the detection signal. Since the emissivity takes on different values according to the condition of the surface of the material, the first parameter changes depending on the surface condition of the material. There is a correlation between a physical value indicating a condition of the material surface and the first parameter. The correlation remains equivalent even if a second parameter corresponding to the physical value is used instead of the physical value itself (for example, an optical physical value such as reflectivity and absorptivity, the thickness of a film formed on the material surface, the surface roughness, and the degree of galvannealing). As an example of the parameter corresponding to the physical value, there is the logarithmic ratio between emissivities (ln ε a /ln ε b ) corresponding to the temperature in the vicinity of the surface. Therefore, a second parameter can be obtained on the basis of the correlation and a physical value can be obtained. When the emissivity or logarithmic emissivity ratio is used as the second parameter, the temperature in the vicinity of the material surface can be obtained from the second parameter and the detection signal.

    A single-board computer incorporating programmable logic devices and its use in the automatic implementation and testing of logic circuits
    5.
    发明公开
    A single-board computer incorporating programmable logic devices and its use in the automatic implementation and testing of logic circuits 失效
    兼容可编程逻辑器件的单板计算机及其在逻辑电路自动实现和测试中的应用

    公开(公告)号:EP0403061A3

    公开(公告)日:1991-12-27

    申请号:EP90304570.6

    申请日:1990-04-26

    IPC分类号: G06F15/60 G06F15/76

    CPC分类号: G06F17/5027

    摘要: There is provided a programmable one-board computer (30) comprising a system board (32) including wiring , one or more microprocessor chips (34) disposed at the centre of the system board, and a plurality of programmable logic devices (PLD) (36) disposed to surround the microprocessor chip(s). Each said PLD may include a memory (38) for defining an internal circuit thereof or may substitute partly for an external memory device. The PLDs may comprise large scale PLDs (36A) as inner PLDs thereof and small scale PLDs (36B) as outer PLDs. The programmable one-­board computer (30) can realize an actual circuit altered from a newly designed logic circuit (20) and laid out on the same. The actual circuit laid on the same can be used for verification.

    Method and apparatus for process control of material emitting radiation
    6.
    发明公开
    Method and apparatus for process control of material emitting radiation 失效
    Verfahren und Vorrichtung zur Prosesssteuerung eines Strahlung aussendenden材料。

    公开(公告)号:EP0555544A1

    公开(公告)日:1993-08-18

    申请号:EP92121157.9

    申请日:1992-12-11

    IPC分类号: G01B11/06 G01J5/00 G01J5/60

    CPC分类号: G01B11/0658

    摘要: An apparatus for controlling a process, in which a control system is structured by having a direct desired value (for example the film thickness d) as the control target, with an emissivity power ratio Ku* ([the λ i power of ε₁]/[the λ j power of ε₂]) used as an indirect desired value, and a measured value of emissivity power ratio Ku obtainable from detection signals (S i (S₁, S₂, ...) of a radiation sensor (160) used as an indirect controlled variable. A process manipulated variable (170) is automatically controlled in accordance with the direct desired value (actual film thickness) such that the indirect controlled variable attains an indirect desired value as target. Thus, the controlling effect of the control apparatus is improved by the use of the excellent control parameter.

    摘要翻译: 一种用于控制处理的装置,其中控制系统通过具有发射功率比Ku *([λ1的λi功率])具有作为控制目标的直接期望值(例如,膜厚度d) / [用于2的λj功率])作为间接期望值,并且可以从使用的辐射传感器(160)的检测信号(Si(S1,S2,...))获得的发射功率比Ku的测量值 作为间接控制变量,根据直接期望值(实际膜厚度)自动控制过程操作变量(170),使得间接控制变量达到作为目标的间接期望值,因此控制的控制效果 通过使用优秀的控制参数改善了设备

    Surface condition measurement apparatus
    7.
    发明公开
    Surface condition measurement apparatus 失效
    Gerätzur Messung derOberflächenbeschaffung。

    公开(公告)号:EP0543326A2

    公开(公告)日:1993-05-26

    申请号:EP92119607.7

    申请日:1992-11-17

    IPC分类号: G01N21/47 G01J5/60 G01B11/30

    CPC分类号: G01J5/60 G01J2005/0074

    摘要: Radiated light with a specified wavelength from a material (21, P, 201) is detected and a first parameter corresponding to the emissivity ratio is obtained from the detection signal. Since the emissivity takes on different values according to the condition of the surface of the material, the first parameter changes depending on the surface condition of the material. There is a correlation between a physical value indicating a condition of the material surface and the first parameter. The correlation remains equivalent even if a second parameter corresponding to the physical value is used instead of the physical value itself (for example, an optical physical value such as reflectivity and absorptivity, the thickness of a film formed on the material surface, the surface roughness, and the degree of galvannealing). As an example of the parameter corresponding to the physical value, there is the logarithmic ratio between emissivities (ln ε a /ln ε b ) corresponding to the temperature in the vicinity of the surface. Therefore, a second parameter can be obtained on the basis of the correlation and a physical value can be obtained. When the emissivity or logarithmic emissivity ratio is used as the second parameter, the temperature in the vicinity of the material surface can be obtained from the second parameter and the detection signal.

    摘要翻译: 从材料(21,P,201)检测出具有指定波长的辐射光,并从检测信号获得与发射率相对应的第一参数。 由于发射率根据材料表面的状况而具有不同的值,所以第一参数根据材料的表面状况而变化。 指示材料表面的状态的物理值与第一参数之间存在相关性。 即使使用与物理值对应的第二参数代替物理值本身,例如反射率和吸收率等光学物理值,材料表面上形成的膜的厚度,表面粗糙度 ,以及合金化退火的程度)。 作为对应于物理值的参数的示例,存在对应于表面附近的温度的发射率(lnεa / lnεb)之间的对数比。 因此,可以基于相关性获得第二参数并且可以获得物理值。 当使用发射率或对数发射率作为第二参数时,材料表面附近的温度可以从第二参数和检测信号获得。

    A single-board computer incorporating programmable logic devices and its use in the automatic implementation and testing of logic circuits
    8.
    发明公开
    A single-board computer incorporating programmable logic devices and its use in the automatic implementation and testing of logic circuits 失效
    SBC采用可编程逻辑器件,其用于自动设计和逻辑电路的测试中使用。

    公开(公告)号:EP0403061A2

    公开(公告)日:1990-12-19

    申请号:EP90304570.6

    申请日:1990-04-26

    IPC分类号: G06F15/60 G06F15/76

    CPC分类号: G06F17/5027

    摘要: There is provided a programmable one-board computer (30) comprising a system board (32) including wiring , one or more microprocessor chips (34) disposed at the centre of the system board, and a plurality of programmable logic devices (PLD) (36) disposed to surround the microprocessor chip(s). Each said PLD may include a memory (38) for defining an internal circuit thereof or may substitute partly for an external memory device. The PLDs may comprise large scale PLDs (36A) as inner PLDs thereof and small scale PLDs (36B) as outer PLDs. The programmable one-­board computer (30) can realize an actual circuit altered from a newly designed logic circuit (20) and laid out on the same. The actual circuit laid on the same can be used for verification.

    摘要翻译: 本发明提供一种可编程的一个机载计算机(30)的系统,包括板(32)包括布线,一个或在系统板的中心设置得更微处理器芯片(34),和可编程逻辑器件有多个(PLD)( 36)设置为围绕微处理器芯片(一个或多个)。 每个所述PLD可以包括用于在其限定的内部电路的存储器(38)或可替代部分地在外部存储装置。 的可编程逻辑器件可以包括大规模的PLD(36A),为它们的内部PLD和小规模的PLD(36B)作为外部的PLD。 可编程一个机载计算机(30)可以在从一个新设计的逻辑电路(20)改变,并且在相同的布局实际电路实现。 铺设在相同的实际电路可以被用于验证。