摘要:
A spiral gas stream is generated in a pipeline when a uniform flow of gas flowing in a cylinder having inner diameter larger than that of the pipeline is introduced through a funnelform reducer into the inlet of the pipeline and bringing the mean gas stream velocity in the pipeline faster than 20 meter per second. The uniform flow of gas is formed in the cylinder easily when outside low pressure gas is fed into the cylinder through a feed gas inlet pipe installed diagonally at the side of the cylinder apart from the bottom plate so as to make the flow line of the feed gas to cross the axis of the cylinder and inclined toward the bottom plate. When solid particles are introduced into the spiral gas stream zone, they are transported to the outlet of the pipeline. As the compressed gas layer is formed along the inside wall of the pipeline by the spiral motion of gas stream, solid particles don't contact directly with the inside wall of the pipeline and don't hurt it. As the center part of the cross section of the pipeline becomes very low pressure, especially along the axis of the pipeline, solid particles containing or accompanying volatile matters are desiccated or concentrated as a result of the evaporation of volatile matters while being transported in the pipeline. Solid particles deposited on the bottom of water can be dredged and dehydrated by the spiral gas stream transportation system. When solid particles transported by spiral gas stream in two or more pipelines are arranged to collide with mutually, pulverized fine solid particles are recovered. A chemical reaction which can not or hardly to proceed at normal temperature and pressure is promoted in a spiral gas strearr zone.
摘要:
Radiated light with a specified wavelength from a material (21, P, 201) is detected and a first parameter corresponding to the emissivity ratio is obtained from the detection signal. Since the emissivity takes on different values according to the condition of the surface of the material, the first parameter changes depending on the surface condition of the material. There is a correlation between a physical value indicating a condition of the material surface and the first parameter. The correlation remains equivalent even if a second parameter corresponding to the physical value is used instead of the physical value itself (for example, an optical physical value such as reflectivity and absorptivity, the thickness of a film formed on the material surface, the surface roughness, and the degree of galvannealing). As an example of the parameter corresponding to the physical value, there is the logarithmic ratio between emissivities (ln ε a /ln ε b ) corresponding to the temperature in the vicinity of the surface. Therefore, a second parameter can be obtained on the basis of the correlation and a physical value can be obtained. When the emissivity or logarithmic emissivity ratio is used as the second parameter, the temperature in the vicinity of the material surface can be obtained from the second parameter and the detection signal.
摘要:
There is provided a programmable one-board computer (30) comprising a system board (32) including wiring , one or more microprocessor chips (34) disposed at the centre of the system board, and a plurality of programmable logic devices (PLD) (36) disposed to surround the microprocessor chip(s). Each said PLD may include a memory (38) for defining an internal circuit thereof or may substitute partly for an external memory device. The PLDs may comprise large scale PLDs (36A) as inner PLDs thereof and small scale PLDs (36B) as outer PLDs. The programmable one-board computer (30) can realize an actual circuit altered from a newly designed logic circuit (20) and laid out on the same. The actual circuit laid on the same can be used for verification.
摘要:
An apparatus for controlling a process, in which a control system is structured by having a direct desired value (for example the film thickness d) as the control target, with an emissivity power ratio Ku* ([the λ i power of ε₁]/[the λ j power of ε₂]) used as an indirect desired value, and a measured value of emissivity power ratio Ku obtainable from detection signals (S i (S₁, S₂, ...) of a radiation sensor (160) used as an indirect controlled variable. A process manipulated variable (170) is automatically controlled in accordance with the direct desired value (actual film thickness) such that the indirect controlled variable attains an indirect desired value as target. Thus, the controlling effect of the control apparatus is improved by the use of the excellent control parameter.
摘要:
Radiated light with a specified wavelength from a material (21, P, 201) is detected and a first parameter corresponding to the emissivity ratio is obtained from the detection signal. Since the emissivity takes on different values according to the condition of the surface of the material, the first parameter changes depending on the surface condition of the material. There is a correlation between a physical value indicating a condition of the material surface and the first parameter. The correlation remains equivalent even if a second parameter corresponding to the physical value is used instead of the physical value itself (for example, an optical physical value such as reflectivity and absorptivity, the thickness of a film formed on the material surface, the surface roughness, and the degree of galvannealing). As an example of the parameter corresponding to the physical value, there is the logarithmic ratio between emissivities (ln ε a /ln ε b ) corresponding to the temperature in the vicinity of the surface. Therefore, a second parameter can be obtained on the basis of the correlation and a physical value can be obtained. When the emissivity or logarithmic emissivity ratio is used as the second parameter, the temperature in the vicinity of the material surface can be obtained from the second parameter and the detection signal.
摘要:
There is provided a programmable one-board computer (30) comprising a system board (32) including wiring , one or more microprocessor chips (34) disposed at the centre of the system board, and a plurality of programmable logic devices (PLD) (36) disposed to surround the microprocessor chip(s). Each said PLD may include a memory (38) for defining an internal circuit thereof or may substitute partly for an external memory device. The PLDs may comprise large scale PLDs (36A) as inner PLDs thereof and small scale PLDs (36B) as outer PLDs. The programmable one-board computer (30) can realize an actual circuit altered from a newly designed logic circuit (20) and laid out on the same. The actual circuit laid on the same can be used for verification.