公开(公告)号：EP1994419A4

公开(公告)日：2012-04-04

申请号：EP07751196

申请日：2007-02-19

申请人： MENTOR GRAPHICS CORP

发明人： MRUGALSKI GRZEGORZ ,  RAJSKI JANUSZ ,  TYSZER JERZY ,  CHENG WU-TUNG ,  MUKHERJEE NILANJAN ,  KASSAB MARK

IPC分类号： G01R31/3185 ,  G06F11/267

CPC分类号： G01R31/3177 ,  G01R31/2851 ,  G01R31/31723 ,  G01R31/31727 ,  G01R31/318547 ,  G01R31/318563 ,  G01R31/318566

摘要： Disclosed herein are exemplary embodiments of a so-called "X-press" test response compactor. Certain embodiments of the disclosed compactor comprise an overdrive section and scan chain selection logic. Certain embodiments of the disclosed technology offer compaction ratios on the order of 1000x. Exemplary embodiments of the disclosed compactor can maintain about the same coverage and about the same diagnostic resolution as that of conventional scan-based test scenarios. Some embodiments of a scan chain selection scheme can significantly reduce or entirely eliminate unknown states occurring in test responses that enter the compactor. Also disclosed herein are embodiments of on-chip comparator circuits and methods for generating control circuitry for masking selection circuits.

公开(公告)号：EP1743245A4

公开(公告)日：2011-05-04

申请号：EP05732808

申请日：2005-03-21

申请人： MENTOR GRAPHICS CORP

发明人： CHENG WU-TUNG ,  TSAI KUN-HAN ,  HUANG YU ,  TAMARAPALLI NAGESH ,  RAJSKI JANUSZ

IPC分类号： G06F11/30 ,  G06F11/267 ,  G06F15/00

CPC分类号： G01R31/318547 ,  G06F11/267

公开(公告)号：EP1825479A4

公开(公告)日：2008-04-16

申请号：EP05849415

申请日：2005-11-18

申请人： MENTOR GRAPHICS CORP

发明人： MUKHERJEE NILANJAN ,  DU XIAOGANG ,  CHENG WU-TUNG

IPC分类号： G11C29/00

CPC分类号： G01R31/3187 ,  G01R31/31724 ,  G01R31/318519 ,  G11C29/10 ,  G11C29/1201 ,  G11C29/16 ,  G11C29/20 ,  G11C2029/0401 ,  G11C2029/0405 ,  G11C2029/3602 ,  G11C2029/5604

摘要： Programmable memory built-in-self-test (MBIST) methods, apparatus, and systems are disclosed. Exemplary embodiments of the disclosed technology can be used, for example, to test one or more memories located on an integrated circuit during manufacturing testing.