Test strip identification
    1.
    发明公开
    Test strip identification 失效
    测试条的识别。

    公开(公告)号:EP0225474A1

    公开(公告)日:1987-06-16

    申请号:EP86115132.2

    申请日:1986-10-31

    申请人: MILES INC.

    IPC分类号: G01N27/04

    摘要: Test device apparatus is disclosed containing a electrically conductive region which provides infor­mation concerning the nature of the test device and/or its position. In a preferred embodiment a conductive strip is applied to a test device and used to determine the identification of the test device, the position of the test device and/or calibrate an instrument which is used to read the test device. The conductive strip generates a signal by measuring the resistance ratio of the electrical path through its conductive region using three or more electrodes or probes. The signal obtained by the electrodes is used to determine the characteristics indicated above or to program operational parameters within an instrument used to analyze the test device.

    Test strip identification
    4.
    发明授权
    Test strip identification 失效
    测试条标识

    公开(公告)号:EP0225474B1

    公开(公告)日:1990-11-28

    申请号:EP86115132.2

    申请日:1986-10-31

    申请人: MILES INC.

    IPC分类号: G01N27/04

    摘要: Test device apparatus is disclosed containing a electrically conductive region which provides information concerning the nature of the test device and/or its position. In a preferred embodiment a conductive strip is applied to a test device and used to determine the identification of the test device, the position of the test device and/or calibrate an instrument which is used to read the test device. The conductive strip generates a signal by measuring the resistance ratio of the electrical path through its conductive region using three or more electrodes or probes. The signal obtained by the electrodes is used to determine the characteristics indicated above or to program operational parameters within an instrument used to analyze the test device.