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6 条记录 (耗时 0.014 秒)

    VOID-ARRANGED STRUCTURE AND MEASUREMENT METHOD USING SAME
    1.
    发明公开
    VOID-ARRANGED STRUCTURE AND MEASUREMENT METHOD USING SAME 审中-公开
    在EINEM LEERRAUM ANGEORDNETE STRUKTUR UND MESSVERFAHREN DAMIT

    公开(公告)号：EP2878943A1

    公开(公告)日：2015-06-03

    申请号：EP13822692.3

    申请日：2013-07-03

    申请人： Murata Manufacturing Co., Ltd.

    发明人： KONDO, Takashi ,  KAMBA, Seiji ,  OGAWA, Yuichi

    IPC分类号： G01N21/35 ,  G01N21/01

    CPC分类号： G01N21/01 ,  G01N21/3586 ,  G02B5/005

    摘要： The present invention is an aperture array structure used in a method of measuring characteristics of a specimen by applying an electromagnetic wave to an aperture array structure on which the specimen is held, and detecting frequency characteristics of the electromagnetic wave scattered by the aperture array structure. The aperture array structure includes a first principal surface, a second principal surface opposed to the first principal surface, and a plurality of apertures extending through the aperture array structure in a direction perpendicular to the first principal surface and the second principal surface. An opening area of each aperture at the first principal surface is smaller than an opening area of each aperture at the second principal surface.

    摘要翻译： 本发明是一种孔径阵列结构，其用于通过对保持试样的孔径阵列结构施加电磁波并检测由孔径阵列结构散射的电磁波的频率特性来测量试样的特性。 孔径阵列结构包括第一主表面，与第一主表面相对的第二主表面和沿垂直于第一主表面和第二主表面的方向延伸穿过孔阵列结构的多个孔。 第一主表面处的每个孔的开口面积小于第二主表面处的每个孔的开口面积。

    PRODUCTION METHOD FOR PERFORATED STRUCTURAL BODY, MEASUREMENT DEVICE, AND MEASUREMENT METHOD
    2.
    发明公开
    PRODUCTION METHOD FOR PERFORATED STRUCTURAL BODY, MEASUREMENT DEVICE, AND MEASUREMENT METHOD 审中-公开
    HERSTELLUNGSVERFAHRENFÜREINEN PERFORIERTENSTRUKTURKÖRPER，MESSVORRICHTUNG UND MESSVERFAHREN

    公开(公告)号：EP2902770A1

    公开(公告)日：2015-08-05

    申请号：EP13841765.4

    申请日：2013-08-09

    申请人： Murata Manufacturing Co., Ltd.

    发明人： KONDO, Takashi ,  KAMBA, Seiji ,  HARA, Tetsuzo ,  SUZUKI, Masayuki

    IPC分类号： G01N21/01 ,  G01N21/35

    CPC分类号： G01N21/59 ,  G01N21/01 ,  G01N21/03 ,  G01N21/3581 ,  G01N2021/0339 ,  G01N2201/02 ,  G01N2201/061 ,  G02B5/18 ,  G02B21/34 ,  H01J37/20 ,  H01J37/3178 ,  Y10T29/49

    摘要： Provided is a perforated-structure body that has high mechanical strength and is not likely to bend or be damaged when being handled.
    In a perforated-structure body 1, which is used in measurement of a characteristic of a measurement target performed by radiating electromagnetic waves, a plurality of perforations 2c are provided in a perforated plate 2, which has a first main surface 2a and a second main surface 2b that opposes the first main surface 2a, so as to penetrate from the first main surface 2a to the second main surface 2b, and support substrates 3 and 4 are stacked on at least one main surface among the first main surface 2a and the second main surface 2b of the perforated plate 2 so as to have an opening or a cut out portion through which at least one of the perforations 2c is exposed.

    摘要翻译： 具有机械强度高，处理时不易弯曲或损坏的穿孔结构体。 在用于测量通过辐射电磁波执行的测量目标的特性的穿孔结构体1中，多孔板2设置有多个穿孔板2，多孔板2具有第一主表面2a和第二主体 表面2b与第一主表面2a相对，从第一主表面2a穿透到第二主表面2b，并且支撑基板3和4堆叠在第一主表面2a和第二主表面2a中的至少一个主表面上 多孔板2的主表面2b具有开口或切口部分，至少一个穿孔2c通过该开口或切口部分露出。

    PERIODIC STRUCTURE AND MEASUREMENT METHOD EMPLOYING SAME
    4.
    发明公开
    PERIODIC STRUCTURE AND MEASUREMENT METHOD EMPLOYING SAME 审中-公开
    塞维利亚大使馆

    公开(公告)号：EP2781908A1

    公开(公告)日：2014-09-24

    申请号：EP12850549.2

    申请日：2012-08-17

    申请人： Murata Manufacturing Co., Ltd.

    发明人： KAMBA, Seiji ,  TAKIGAWA, Kazuhiro ,  KONDO, Takashi ,  TANAKA, Koji

    IPC分类号： G01N21/35 ,  G01N21/01

    CPC分类号： G01N21/01 ,  G01N21/3586 ,  G01N21/774

    摘要： According to the present invention, a plate-shaped periodic structure includes at least two aperture portions extending through the periodic structure in a direction perpendicular to a main surface of the periodic structure and periodically arranged in at least one direction along the main surface. Each of the aperture portions has a shape that is not mirror-symmetric with respect to an imaginary plane that is a plane perpendicular to the main surface. Each of the aperture portions includes a constricted portion at which a gap distance of the aperture portion is partially small, the gap distance being a width in a direction parallel to a line of intersection of the main surface and the imaginary plane.

    摘要翻译： 根据本发明，板状周期性结构包括至少两个沿垂直于周期性结构的主表面的方向延伸穿过周期性结构并且沿着主表面沿至少一个方向周期性布置的开口部分。 每个开口部分具有相对于与主表面垂直的平面的假想平面不是镜像对称的形状。 每个孔径部分包括狭缝部分，在该收缩部分处开口部分的间隙距离部分地小，间隙距离是在平行于主表面和假想平面的交线的方向上的宽度。

    MEASUREMENT DEVICE AND FEATURE MEASUREMENT METHOD OF OBJECT TO BE MEASURED EMPLOYING SAME
    5.
    发明公开
    MEASUREMENT DEVICE AND FEATURE MEASUREMENT METHOD OF OBJECT TO BE MEASURED EMPLOYING SAME 审中-公开
    测量装置和方法用于测量性质AT一种为测量对象，

    公开(公告)号：EP2755017A1

    公开(公告)日：2014-07-16

    申请号：EP12829609.2

    申请日：2012-04-12

    申请人： Murata Manufacturing Co., Ltd.

    发明人： KONDO, Takashi ,  KAMBA, Seiji

    IPC分类号： G01N21/01 ,  G01N21/35

    CPC分类号： G01N21/51 ,  B01L3/50255 ,  B01L2300/0618 ,  G01N21/03 ,  G01N21/253 ,  G01N21/3577 ,  G01N21/3586 ,  G01N2021/0346 ,  G01N2021/3595

    摘要： The present invention is a measurement device that includes a device main unit (21) including at least one cavity (20) for accommodating an analyte containing a specimen and an aperture array structure (1) including a plurality of apertures (10) extending therethrough in a direction perpendicular to a principal surface thereof. The aperture array structure (1) is fixed such that part or all of the aperture array structure (1) is positioned in the cavity (20).

    摘要翻译： 本发明是一种测量装置确实包括：包括至少一个腔体（20），用于容纳试样的分析物的容纳和在孔径阵列结构（1）包括孔径（10）的多个设备主单元（21）通过在延伸有 垂直于其主表面的方向。 固定检查孔阵列结构（1）那样的部分或全部的孔阵列结构的（1）中的空腔（20），其定位。

    MEASUREMENT METHOD FOR OBJECT TO BE MEASURED
    6.
    发明公开
    MEASUREMENT METHOD FOR OBJECT TO BE MEASURED 审中-公开
    MESSVERFAHRENFÜRMESSOBJEKTE

    公开(公告)号：EP2717037A1

    公开(公告)日：2014-04-09

    申请号：EP12792235.9

    申请日：2012-04-09

    申请人： Murata Manufacturing Co., Ltd.

    发明人： KONDO, Takashi ,  KAMBA, Seiji ,  OGAWA, Yuichi ,  TOMITA, Sakura

    IPC分类号： G01N21/35

    CPC分类号： G01N21/3586 ,  G01J3/42 ,  G01N21/03 ,  G01N21/3577 ,  G01N2021/035 ,  G01N2021/3595

    摘要： The present invention provides a measuring method for measuring characteristics of a specimen (2) to be measured by holding the specimen (2) on an aperture array structure (1) having apertures (10), applying an electromagnetic wave to the aperture array structure (1), and detecting frequency characteristics of the electromagnetic wave reflected by the aperture array structure (1), wherein the measuring method includes the steps of attaching a liquid (3) directly or indirectly to at least a part of a first principal surface that is one of principal surfaces of the aperture array structure (1), and applying the electromagnetic wave from side including a second principal surface that is the other principal surface of the aperture array structure (1), the apertures (10) of the aperture array structure (1) have size not allowing the liquid (3) to leak from the first principal surface side to the second principal surface side, and the liquid (3) is attached to the first principal surface of the aperture array structure (1) in a state opened to an atmosphere under air pressure.

    摘要翻译： 本发明提供一种测量方法，用于通过将样本（2）保持在具有孔（10）的孔径阵列结构（1）上，用于测量被测试物（2）的特性，向孔径阵列结构施加电磁波 1），并且检测由孔阵列结构（1）反射的电磁波的频率特性，其中测量方法包括以下步骤：将液体（3）直接或间接地连接到第一主表面的至少一部分 孔阵列结构（1）的主表面之一，并且从包括孔阵列结构（1）的另一个主表面的第二主表面的一侧施加电磁波，孔阵列结构的孔（10） （1）的尺寸不允许液体（3）从第一主表面侧泄漏到第二主表面侧，并且液体（3）附着到第一主表面 孔径阵列结构（1）在空气压力下向大气开放的状态。