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    PROBE UNIT
    1.
    发明公开
    PROBE UNIT 有权
    探头组

    公开(公告)号：EP2765427A1

    公开(公告)日：2014-08-13

    申请号：EP12837740.5

    申请日：2012-10-04

    Applicant: NHK Spring Co., Ltd.

    Inventor： MATSUI, Akihiro ,  MORI, Takashi

    IPC: G01R1/067 ,  G01R1/073 ,  H01L21/66

    CPC classification number: G01R1/07314 ,  G01R1/06722 ,  G01R31/2886 ,  G01R31/2889 ,  G09G3/006

    Abstract: Provided is a probe unit which is capable of obtaining a reliable conduction with a contact target in case of flowing a large current. The probe unit includes: contact probes, each including a plunger including a contact portion contacting the electrode of the contacted body, a flange portion extending from a base end of the contact portion and having a diameter larger than a diameter of the contact portion, a boss portion extending from an end of the flange portion different from an end continuing to the contact portion and having a diameter smaller than the diameter of the flange portion, and a base end portion extending from an end of the boss portion different from an end continuing to the flange portion and having a substantially same diameter with the boss portion, and a spring coil attached to the boss portion; and a probe holder made of a conductive material and including a plurality of holder holes, each having a stepped shape in which diameters at both ends in a thickness direction are decreased and accommodating the respective contact probes, and the flange portion abuts one of step portions of the stepped shape, and the spring coil abuts another one of the step portions such that the spring coil biases the plunger.

    Abstract translation: 本发明提供一种探针单元，其能够在流过大电流的情况下获得与接触对象的可靠导电。 探针单元包括：接触探针，每个接触探针包括：柱塞，其包括与接触体的电极接触的接触部分;凸缘部分，其从接触部分的基端延伸并且具有大于接触部分的直径的直径; 凸缘部分，从凸缘部分的一端延伸到与接触部分连续的一端，并具有比凸缘部分的直径小的直径;以及基端部分，从凸缘部分的端部延伸， 所述凸缘部分具有与所述凸台部分基本相同的直径，以及附接到所述凸台部分上的弹簧圈; 以及由导电材料制成并且包括多个保持孔的探针保持件，每个保持件孔具有阶梯形状，其中厚度方向上的两端的直径减小并且容纳各个接触探针，并且所述凸缘部分抵靠一个台阶部分 并且弹簧线圈抵靠另一个台阶部分，使得弹簧线圈偏压柱塞。

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