中科微点-全球专利检索

  1. Login
  2. Sign Up

Search Results

5 records (took 0.008 seconds)

    CONTACT PROBE AND PROBE UNIT
    1.
    发明公开
    CONTACT PROBE AND PROBE UNIT 有权
    接触探针和探针单元

    公开(公告)号：EP2587267A1

    公开(公告)日：2013-05-01

    申请号：EP11798243.9

    申请日：2011-06-23

    Applicant: NHK Spring Co., Ltd.

    Inventor： KAZAMA, Toshio ,  SOUMA, Kazuya ,  MATSUI, Akihiro

    IPC: G01R1/067 ,  G01R1/073

    CPC classification number: G01R1/067 ,  G01R1/06722 ,  G01R1/07314 ,  H01L24/72 ,  H01L2924/14 ,  H01R13/2421 ,  H05K7/1069 ,  H01L2924/00

    Abstract: Equipped are a conductive first plunger (21) including, on a same axis, a distal end portion (21a) having a tapered distal end shape, a flange portion (21c) extending from a base end side of the distal end portion (21a) and having a diameter larger than a diameter of the distal end portion (21a), a boss portion (21d) having a diameter smaller than a diameter of the flange portion (21c), and a base end portion (21e) having a diameter smaller than a diameter of the boss portion (21d), a conductive second plunger (22) including, on the same axis, a second distal end portion having a tapered distal end shape and a boss portion (22c) having a diameter substantially equal to a diameter of the base end portion (21e), and a coil spring (23) including a coarsely wound portion (23a) formed by winding at a predetermined pitch with an inner diameter equal to or larger than the diameter of the boss portion (21d) and a tightly wound portion (23b) formed by tightly winding with an inner diameter substantially equal to the diameter of the boss portion (22c), so that the first plunger (21) and the second plunger (22) are connected to each other on the same axis.

    Abstract translation: 所述导电性第一柱塞（21）在同一轴上具有前端渐缩形状的前端部（21a），从该前端部（21a）的基端侧延伸的凸缘部（21c） 并具有比所述前端部（21a）的直径大的直径，具有比所述凸缘部（21c）的直径小的直径的凸台部（21d）以及直径变小的基端部（21e） 导电性的第二柱塞（22），其在同一轴上具有前端渐细形状的第二前端部和直径与第一柱塞部的直径大致相同的凸台部（22c） （21e）的直径以及包括通过以等于或大于轮毂部分（21d）的直径的内径的预定间距缠绕而形成的粗卷部分（23a）的螺旋弹簧（23） 以及紧密卷绕部分（23b），该紧密卷绕部分（23b）通过紧密卷绕内径子而形成 与轴套部分（22c）的直径大致相等，从而第一柱塞（21）和第二柱塞（22）在同一轴线上相互连接。

    CONTACT PROBE AND PROBE UNIT
    2.
    发明公开
    CONTACT PROBE AND PROBE UNIT 审中-公开
    接触探针和探针单元

    公开(公告)号：EP2560010A1

    公开(公告)日：2013-02-20

    申请号：EP11756259.5

    申请日：2011-03-14

    Applicant: NHK Spring Co., Ltd.

    Inventor： MOTEGI, Takahiro ,  MATSUI, Akihiro ,  ISHIKAWA, Koji

    IPC: G01R1/067 ,  G01R1/073 ,  G01R31/26

    CPC classification number: G01R1/0466 ,  H01R13/2435 ,  H01R13/2442

    Abstract: A contact probe (20) having a substantially flat plate shape, used to connect different substrates and having a uniform plate thickness includes: a first contact portion (21) which has a side surface curved in an arc shape and which makes contact with one substrate at the side surface thereof; a second contact portion (22) which has a side surface curved in an arc shape and which makes contact with the other substrate at the side surface thereof; a connection portion (23) which connects the first contact portion (21) and the second contact portion (22); and an elastic portion (24) which extends from the second contact portion (22), has a portion curved in an arc shape, and is elastically deformed by a load applied to the first contact portion (21) and the second contact portion (22).

    Abstract translation: 一种用于连接不同基板并具有均匀板厚度的基本上平板形状的接触探针（20），包括：第一接触部分（21），其具有弯曲成弧形的侧表面并且与一个基板 在其侧表面; 第二接触部分（22），其具有弯曲成弧形的侧表面并且在其侧表面处与另一基板接触; 连接第一接触部分（21）和第二接触部分（22）的连接部分（23）; 和从所述第二接触部分（22）延伸的弹性部分（24）具有弯曲成弧形的部分，并且通过施加到所述第一接触部分（21）和所述第二接触部分（22）的负载而弹性变形， ）。

    PROBE UNIT
    3.
    发明公开
    PROBE UNIT 有权
    探头组

    公开(公告)号：EP2765427A1

    公开(公告)日：2014-08-13

    申请号：EP12837740.5

    申请日：2012-10-04

    Applicant: NHK Spring Co., Ltd.

    Inventor： MATSUI, Akihiro ,  MORI, Takashi

    IPC: G01R1/067 ,  G01R1/073 ,  H01L21/66

    CPC classification number: G01R1/07314 ,  G01R1/06722 ,  G01R31/2886 ,  G01R31/2889 ,  G09G3/006

    Abstract: Provided is a probe unit which is capable of obtaining a reliable conduction with a contact target in case of flowing a large current. The probe unit includes: contact probes, each including a plunger including a contact portion contacting the electrode of the contacted body, a flange portion extending from a base end of the contact portion and having a diameter larger than a diameter of the contact portion, a boss portion extending from an end of the flange portion different from an end continuing to the contact portion and having a diameter smaller than the diameter of the flange portion, and a base end portion extending from an end of the boss portion different from an end continuing to the flange portion and having a substantially same diameter with the boss portion, and a spring coil attached to the boss portion; and a probe holder made of a conductive material and including a plurality of holder holes, each having a stepped shape in which diameters at both ends in a thickness direction are decreased and accommodating the respective contact probes, and the flange portion abuts one of step portions of the stepped shape, and the spring coil abuts another one of the step portions such that the spring coil biases the plunger.

    Abstract translation: 本发明提供一种探针单元，其能够在流过大电流的情况下获得与接触对象的可靠导电。 探针单元包括：接触探针，每个接触探针包括：柱塞，其包括与接触体的电极接触的接触部分;凸缘部分，其从接触部分的基端延伸并且具有大于接触部分的直径的直径; 凸缘部分，从凸缘部分的一端延伸到与接触部分连续的一端，并具有比凸缘部分的直径小的直径;以及基端部分，从凸缘部分的端部延伸， 所述凸缘部分具有与所述凸台部分基本相同的直径，以及附接到所述凸台部分上的弹簧圈; 以及由导电材料制成并且包括多个保持孔的探针保持件，每个保持件孔具有阶梯形状，其中厚度方向上的两端的直径减小并且容纳各个接触探针，并且所述凸缘部分抵靠一个台阶部分 并且弹簧线圈抵靠另一个台阶部分，使得弹簧线圈偏压柱塞。

Patent Agency Ranking