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1.
公开(公告)号:EP1817557A4
公开(公告)日:2010-06-16
申请号:EP05851362
申请日:2005-11-03
申请人: OMNIPROBE INC
IPC分类号: H01J37/26
CPC分类号: H01J37/22 , B82Y35/00 , H01J37/20 , H01J37/3056 , H01J2237/20 , H01J2237/202 , H01J2237/204 , H01J2237/206 , H01J2237/208 , H01J2237/2482 , H01J2237/28 , H01J2237/31745
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2.METHOD AND APPARATUS FOR IN-SITU PROBE TIP REPLACEMENT INSIDE A CHARGED PARTICLE BEAM MICROSCOPE 审中-公开
标题翻译: METHOD AND APPARATUS FOR在显微镜原位探针尖端更改与带电粒子束公开(公告)号:EP1782435A4
公开(公告)日:2010-06-16
申请号:EP05773762
申请日:2005-07-21
申请人: OMNIPROBE INC
IPC分类号: G21K7/00
CPC分类号: H01J37/20 , H01J37/26 , H01J2237/2005 , H01J2237/2006 , H01J2237/2007 , H01J2237/201 , H01J2237/204 , H01J2237/208 , H01J2237/26 , H01J2237/262 , H01J2237/31745 , H01J2237/31749
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3.METHOD AND APPARATUS FOR THE AUTOMATED PROCESS OF IN-SITU LIFT-OUT 有权
标题翻译: VERFAHREN UND VORRICHTUNGFÜRDEN AUTOMATISIERTEN VORGANG DES IN-SITU-AUSHEBENS公开(公告)号:EP1812945A4
公开(公告)日:2009-11-18
申请号:EP05821396
申请日:2005-11-03
申请人: OMNIPROBE INC
IPC分类号: H01J37/26
CPC分类号: H01J37/302 , B82Y15/00 , G01N1/32 , H01J37/20 , H01J37/22 , H01J37/3056 , H01J2237/20 , H01J2237/202 , H01J2237/204 , H01J2237/206 , H01J2237/208 , H01J2237/2482 , H01J2237/28 , H01J2237/30411 , H01J2237/30472 , H01J2237/31745
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