Semiconductor relay system and method for controlling the semiconductor relay system
    3.
    发明公开

    公开(公告)号:EP1207622A2

    公开(公告)日:2002-05-22

    申请号:EP01127038.6

    申请日:2001-11-14

    申请人: Omron Corporation

    IPC分类号: H03K17/082

    CPC分类号: H03K17/18 H03K17/0824

    摘要: Because a semiconductor relay system of this invention comprises an across-element voltage detecting circuit 116 which delivers an across-element voltage detection signal depending on the presence/absence of an across-element voltage exceeding a predetermined threshold; an element driving circuit 112 for delivering an element driving signal in response to a control input signal; a logic-based judgement circuit 119 for delivering a logic-based judgement signal depending on the presence/absence of an across-element voltage detection signal; and a filtration circuit for removing a logic-based judgement signal of external disturbing elements to produce an element safety check signal, it is possible to reliably detect the disorder of a triac 114.

    摘要翻译: 因为本发明的半导体继电器系统包括跨元件电压检测电路116,其根据超过预定阈值的跨元件电压的存在/不存在传送跨元件电压检测信号; 元件驱动电路112,用于响应于控制输入信号传送元件驱动信号; 基于逻辑的判断电路119,用于根据跨单元电压检测信号的存在/不存在来递送基于逻辑的判断信号; 以及用于去除外部干扰元件的基于逻辑的判断信号以产生元件安全检查信号的过滤电路,可以可靠地检测三端双向可控硅开关元件114的无序性。