LOGIC DEVICE AND METHOD SUPPORTING SCAN TEST
    1.
    发明公开
    LOGIC DEVICE AND METHOD SUPPORTING SCAN TEST 有权
    LOGIC的系统和方法用于支持扫描测试

    公开(公告)号:EP2030032A2

    公开(公告)日:2009-03-04

    申请号:EP07784466.0

    申请日:2007-06-18

    IPC分类号: G01R31/3185

    摘要: A logic device includes a data input, a scan test input, a clock demultiplexer, and a master latch. The clock demultiplexer is responsive to a clock input to selectively provide a first clock output and a second clock output. The master latch is coupled to the data input and to the scan test input and includes an output. The master latch is responsive to the first clock output of the clock demultiplexer and the second clock output of the clock demultiplexer to selectively couple the data input or the scan test input to the output.

    LOGIC DEVICE AND METHOD SUPPORTING SCAN TEST
    2.
    发明授权
    LOGIC DEVICE AND METHOD SUPPORTING SCAN TEST 有权
    LOGIC的系统和方法用于支持扫描测试

    公开(公告)号:EP2030032B1

    公开(公告)日:2012-05-23

    申请号:EP07784466.0

    申请日:2007-06-18

    IPC分类号: G01R31/3185

    摘要: A logic device includes a data input, a scan test input, a clock demultiplexer, and a master latch. The clock demultiplexer is responsive to a clock input to selectively provide a first clock output and a second clock output. The master latch is coupled to the data input and to the scan test input and includes an output. The master latch is responsive to the first clock output of the clock demultiplexer and the second clock output of the clock demultiplexer to selectively couple the data input or the scan test input to the output.