公开(公告)号：EP3410133B1

公开(公告)日：2019-06-12

申请号：EP18150285.7

申请日：2018-01-04

申请人： Quanta Computer Inc.

发明人： Ou Yang, Kuang-Hua ,  Hsu, Kuo-Chan ,  Shih, Yun-Teng

IPC分类号： G01R31/28 ,  G01R31/40 ,  G01R31/00 ,  G05B15/02 ,  H02M1/088 ,  H03K17/687 ,  H02M1/00

公开(公告)号：EP3410133A1

公开(公告)日：2018-12-05

申请号：EP18150285.7

申请日：2018-01-04

申请人： Quanta Computer Inc.

发明人： Ou Yang, Kuang-Hua ,  Hsu, Kuo-Chan ,  Shih, Yun-Teng

IPC分类号： G01R31/28

CPC分类号： G01R31/40 ,  G01R31/003 ,  G01R31/2817 ,  G01R31/2849 ,  G01R31/2855 ,  G05B15/02 ,  H02M1/088 ,  H02M2001/0009 ,  H03K17/6871

摘要： The present disclosure provides a system and method enabling a self-burn-in test for a power supply device (PSD) of a server system using a multi-phase scheme. The PSD comprises a power-width modulation (PWM) controller, and a plurality of power stages. Each of the plurality of power stages comprises a driver, a high-side MOSFET, and a low-side MOSFET. In one aspect of the present disclosure, upon receiving a test mode command from a controller of the server system, the PWM controller can send a PWM signal to switch a specific power stage to the On state, and send at least another PWM signal that switches other power stage(s) of the plurality of power stages to the Tri-state. During a subsequent self-burn-in test of the specific power stage, low-side MOSFET(s) of the other power stage(s) can function as a load for the specific power stage.