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1.发明授权MULTILEVEL SIGNAL INTERFACE TESTING WITH BINARY TEST APPARATUS BY EMULATION OF MULTILEVEL SIGNALS 无效二进制测试者从仿真更多电平信号更多电平信号接口测试
公开(公告)号：EP1425594B1
公开(公告)日：2006-11-29
申请号：EP02798942.5
申请日：2002-09-09
申请人： RAMBUS INC.
发明人： WERNER, Carl, W. , ZERBE, Jared, L. , STOENCYPHER, William, F. , LIAW, Haw-Jyh , CHANG, Timothy, C.
CPC分类号： G11C29/50 , G01R31/31715 , G01R31/31926 , G11C11/22 , G11C11/56 , G11C16/04 , G11C29/00 , G11C2029/5004
摘要： Error detection mechanisms (400) for devices (300) that have multilevel signal interfaces (330) test multilevel signals of an interface with a binary test apparatus(404). The error detection mechanisms include converting between multilevel signals of the interface and binary signals of the test apparatus. The error detection mechanisms also include repeated transmission of multilevel signals stored in a memory of a device having a multilevel signal interface for detection by the test apparatus at different binary levels.
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2.发明公开MULTILEVEL SIGNAL INTERFACE TESTING WITH BINARY TEST APPARATUS BY EMULATION OF MULTILEVEL SIGNALS 无效二进制测试者从仿真更多电平信号更多电平信号接口测试
公开(公告)号：EP1425594A1
公开(公告)日：2004-06-09
申请号：EP02798942.5
申请日：2002-09-09
申请人： Rambus Inc.
发明人： WERNER, Carl, W. , ZERBE, Jared, L. , STOENCYPHER, William, F. , LIAW, Haw-Jyh , CHANG, Timothy, C.
CPC分类号： G11C29/50 , G01R31/31715 , G01R31/31926 , G11C11/22 , G11C11/56 , G11C16/04 , G11C29/00 , G11C2029/5004
摘要： Error detection mechanisms (400) for devices (300) that have multilevel signal interfaces (330) test multilevel signals of an interface with a binary test apparatus(404). The error detection mechanisms include converting between multilevel signals of the interface and binary signals of the test apparatus. The error detection mechanisms also include repeated transmission of multilevel signals stored in a memory of a device having a multilevel signal interface for detection by the test apparatus at different binary levels.
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