公开(公告)号：EP3026464A4

公开(公告)日：2017-03-29

申请号：EP13890165

申请日：2013-09-10

申请人： SHANGHAI INST MICROSYSTEM & INFORMATION TECH CAS

发明人： QIAO SHAN ,  WAN WEISHI ,  JI FUHAO

IPC分类号： H01J37/244 ,  G01T1/32 ,  H01J37/147 ,  H01J37/29

CPC分类号： H01J37/29 ,  H01J37/147 ,  H01J37/244 ,  H01J37/252 ,  H01J2237/24557 ,  H01J2237/2544

摘要： Provided is an image type electron spin polarimeter. It at least comprises a scattering target, a two-dimensional electron detector and an electron bending unit, wherein the electron bending unit is used for bending the orbit of the incident (scattered) electrons to a first (second) angle to arrive the scattering target (two-dimensional electron detector) with an optimal incident angle, and to transfer the image of the electron intensities from the entrance plane (scattering target) to the scattering target (two-dimensional electron detector) with small aberrations, and to separate the orbits of incident and scattered electrons to increase the degree of freedom of the geometric configuration of each component of the spin polarimeter. At least one of the first and second angles is not 0°, thereby achieving the first transfer of the two-dimensional image of electron intensities on the entrance plane to the scattering target and the second transfer from scattering target to the two-dimensional electron detector respectively with small aberrations, and then achieving multichannel measurements of the electron spin.