摘要:
The invention relates to a method of controlling a product analysis spectrometer, the method comprising steps consisting in: acquiring a measurement (LFL, TPL) representative of the operation of a light source (LS), determining as a function of the measurement a value of supply current (LCx) of the light source, and/or a value of duration of integration (ITy) of photosensitive cells (y) of a sensor (OPS), which are disposed on a path of a light beam (LB) emitted by the light source and having interacted with a product to be analyzed, and if the value of duration of integration and/or of supply current lies between threshold values, providing to the light source a supply current corresponding to the determined value of supply current, adjusting the duration of integration of a photosensitive cell to the determined value of duration of integration, and acquiring measurements of luminous intensity (MSy) which are provided by the sensor, making it possible to form a spectrum.
摘要:
The invention relates to a method of controlling a product analysis spectrometer, the spectrometer comprising a light source (LS) comprising several light-emitting diodes (LD1-LD4) having respective emission spectra covering in combination a band of analysis wavelengths, the method comprising steps consisting in: providing a supply current (I1-I4) to at least one of the light-emitting diodes so as to illuminate it, measuring a luminous intensity (LFL1- LFL4) emitted by the light source by measuring a current at a terminal of at least one other of the light-emitting diodes which is kept unlit, determining as a function of each measurement of luminous intensity a setpoint value (LC1-LC4) of the supply current for each lit diode, and regulating the supply current for each lit diode so that it corresponds to the setpoint value.