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1.发明公开METHOD AND SYSTEM FOR DETECTING DEFECTS OF TRANSPARENT SUBSTRATE 审中-公开VERFAHREN UND SYSTEM ZUR ERKENNUNG VON DEFEKTEN EINES TRANSPARENTEN SUBSTRATS
公开(公告)号：EP2430431A1
公开(公告)日：2012-03-21
申请号：EP10774567.1
申请日：2010-05-14
IPC分类号： G01N21/896 , G01N21/958
CPC分类号： G01N21/896 , G01N21/88 , G01N2021/8825 , G06K9/00 , H04N7/18
摘要： A method and system for detecting defects of a transparent substrate (120) is disclosed. The system comprises: a plurality of detection channels, each of which includes an illumination component (142, 144) for providing illumination to the substrate (120) and an imaging component (162, 164) for scanning the substrate (120) to provide image of the substrate (120); a transport module (130), for producing relative motion between the substrate (120), and the illumination components (142, 144) and the imaging components (162, 164) included in the plurality of detection channels; and a controlling module (190), which is used for controlling the illumination components (142, 144) and the imaging components (162, 164) included in the plurality of detection channels, so that at least two illumination components of the illumination components (142, 144) included in the plurality of detection channels provide illumination to the substrate (120) alternately and the imaging component (142, 144) included in any of the plurality of detection channels scans the substrate (120) when the illumination component (142, 144) included in that detection channel illuminates the substrate (120), wherein the imaging components (162, 164) included in at least two detection channels of the plurality of detection channels are the same imaging component. The method and system described by the present invention is capable of discriminating real defects from fake defects, which enables the substrate to be inspected without cleaning.
摘要翻译： 提供了一种用于检测透明基板的缺陷的方法和系统。 该系统包括：多个检测通道，每个检测通道包括用于向基板提供照明的照明部件和用于扫描基板以提供基板的图像的成像部件; 传输模块，用于在所述基板和所述照明部件之间产生相对运动和所述多个检测通道中包括的成像部件; 以及控制模块，用于控制多个检测通道中包括的照明部件和成像部件，使得包括在多个检测通道中的照明部件的至少两个照明部件交替地向基板提供照明，并且成像部件 当所述检测通道中包含的照射元件照亮所述基板时，包括在所述多个检测通道中的任一个中的所述多个检测通道中的任一个扫描所述基板，其中，所述多个检测通道中的至少两个检测通道中包括的成像部件是相同的成像部件。 本发明描述的方法和系统能够区分真实的缺陷和假缺陷，从而使基片无需清洗即可被检查。
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公开(公告)号：EP3131731B1
公开(公告)日：2020-02-12
申请号：EP15780081.4
申请日：2015-04-15
发明人： ZHANG, Shuai , LIN, Xiaofeng , LI, Ping , SUN, Xiaowei , ZHAO, Xiaoyu
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3.发明公开
公开(公告)号：EP2798337A1
公开(公告)日：2014-11-05
申请号：EP11878545.0
申请日：2011-12-31
发明人： GUO, Xiaofeng , LI, Huifen , LIN, Xiaofeng , SUN, Xiaowei , DENG, Wenhua
IPC分类号： G01N21/958 , G01N21/896
CPC分类号： G01N21/8806 , F21K9/27 , F21Y2103/10 , F21Y2115/10 , G01N21/896 , G01N21/958 , G01N2021/8816 , G01N2201/0633 , G01N2201/105
摘要： This invention relates to illumination device for providing near isotropic illumination, and particularly to an illumination system for detecting the defect in a transparent substrate and a detection system comprising the same. According to an embodiment of the invention, an illumination system is provided, which comprises: an illumination system for detecting the defect in a transparent substrate, comprising light source receptacle in bar shape; a plurality of first spot light sources, each emitting a respective first light, the respective first lights being substantially parallel to each other and the first spot light sources being arranged to a first line of spot light sources along the longitudinal direction of the receptacle; and a plurality of second spot light sources, each emitting a respective second light, the respective second lights being substantially parallel to each other and the second spot light sources being arranged to a second line of spot light sources along the longitudinal direction of the receptacle, wherein the first line of spot light sources and the second line of spot light sources are substantially arranged in a line, the first line of spot light sources and the second line of spot light sources locate in difference half of the receptacle in the longitudinal direction, the first light and the second light converge to a scan line, and the projections of the first and the second lights, which are converged at each point on the scan line, in a plane P passing the scan line and perpendicular to the transparent substrate are located at different sides of a line in the plane P, which passes the point and is perpendicular to the scan line.
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公开(公告)号：EP2401603A1
公开(公告)日：2012-01-04
申请号：EP10745839.0
申请日：2010-02-26
IPC分类号： G01N21/896
CPC分类号： G01N21/896 , G01N21/898 , G01N2021/8854 , G01N2021/8874 , H02S50/15
摘要： A system and a method for detecting defects of a substrate are provided. The system comprises: a first illuminating component (140), disposed at one side of the substrate (120) and adapted to emit diffused light to the substrate (120); a first imaging component (160), disposed at the other side of the substrate (120) and adapted to scan the substrate (120) by sensing light emitted by the first illuminating component (140) and transmitted through the substrate (120), the first illuminating component (140) and the first imaging component (160) constructing a first detection channel; and a transport module (130), adapted to produce relative motion between the substrate (120), and the first illuminating component (140) and the first imaging component (160).
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公开(公告)号：EP3131731A1
公开(公告)日：2017-02-22
申请号：EP15780081.4
申请日：2015-04-15
发明人： ZHANG, Shuai , LIN, Xiaofeng , LI, Ping , SUN, Xiaowei , ZHAO, Xiaoyu
摘要： An injection molding apparatus for forming a gasket around an edge of a glass is provided. The injection molding apparatus includes: an injection mold die; a fixing component, disposed inside the injection mold die and adapted for fixing the glass inside the injection mold die; a detection unit, mounted to the injection molding apparatus and adapted for detecting an image or vibration of the glass; a determination unit, coupled with the detection unit and adapted for determining whether the glass breaks based on a detection result of the detection unit. The apparatus can determine whether the glass breaks, such that the risk of scratching the injection mold die by glass breaking may be reduced. Therefore, the injection molding yield can be improved, the time for repairing the injection mold die may be reduced and a service life of the injection mold die may be prolonged.
摘要翻译： 提供了一种用于在玻璃的边缘周围形成垫圈的注射成型装置。 注射成型装置包括：注射模具; 固定部件，设置在所述注塑模具内部，并且适于将所述玻璃固定在所述注塑模具内; 检测单元，安装到注射成型设备并适于检测玻璃的图像或振动; 确定单元，与所述检测单元耦合，并且适于基于所述检测单元的检测结果来确定所述玻璃是否破裂。 该装置可以确定玻璃是否断裂，从而可能会降低通过玻璃破碎而刮伤注塑模具的风险。 因此，可以提高注射成型率，可以减少注塑模具的修理时间，延长注塑模具的使用寿命。
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6.发明公开METHOD AND SYSTEM FOR DETECTING AND CLASSIFYING DEFECTS OF SUBSTRATE 审中-公开维多利亚公园系统ZER ERKENNUNG UND KLASSIFIZIERUNG VON SUBSTRATDEFEKTEN
公开(公告)号：EP2459989A1
公开(公告)日：2012-06-06
申请号：EP10803821.7
申请日：2010-02-26
发明人： SCHWEITZER, Jean-Philippe , LI, Huifen , LIN, Xiaofeng , GUO, Xiaofeng , GUO, Feng , SUN, Xiaowei
IPC分类号： G01N21/896
CPC分类号： G01N21/896 , G01N2021/8967
摘要： A method and system for detecting and classifying a defect of a substrate, the system including a first channel, including a first illuminating unit to irradiate a light to a substrate and a first imaging unit to take images by sensing a light from the substrate when it is irradiated; a second channel, including a second illuminating unit to irradiate a light to the substrate and a second imaging unit to take images by sensing a light from the substrate when it is irradiated; an image constructing module to construct two images of the substrate using the images of the first and second imaging units respectively; and an image processing module to detect, when the substrate has a defect, that the defect is a defect on or in the substrate, based on a relationship of positions where the defect of the substrate appears in the two images of the substrate.
摘要翻译： 一种用于检测和分类衬底缺陷的方法和系统，所述系统包括第一通道，所述第一通道包括用于向衬底照射光的第一照明单元和第一成像单元，以通过感测来自所述衬底的光来拍摄图像 被照射 第二通道，包括用于将光照射到所述基板的第二照明单元和第二成像单元，以在被照射时感测来自所述基板的光来拍摄图像; 图像构造模块，用于分别使用第一和第二成像单元的图像来构造基板的两个图像; 以及图像处理模块，用于基于衬底的缺陷在衬底的两个图像中出现的位置的关系来检测当衬底具有缺陷时缺陷是衬底上或衬底中的缺陷。
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7.发明公开DEFECT INSPECTION APPARATUS FOR SEPARATED AND TRANSPARENT OR TRANSLUCENT ARTICLES WITH LOW RIGIDITY AND INSPECTION METHOD THEREOF 审中-公开一个缺陷对于低刚性及其测试方法分离和透明或半透明的文章
公开(公告)号：EP2450694A1
公开(公告)日：2012-05-09
申请号：EP10793618.9
申请日：2010-07-02
发明人： LIN, Xiaofeng , SCHWEITZER, Jean-Philippe , LI, Huifen , DENG, Wenhua , CHEN, Haifeng , CHEN, Dazhi
IPC分类号： G01N21/89
CPC分类号： G01N21/958 , G01N21/9009
摘要： The present invention relates to an apparatus and a method for detecting a defect of a separated low rigidity transparent or translucent body, wherein an image acquiring device includes: a first conveyer and a second conveyer configured to convey a separated low rigidity transparent or translucent body; a transparent bridge disposed between a first conveyer and a second conveyer along a transport path of the separated low rigidity transparent or translucent body, the transparent bridge having a top surface; an illuminating unit disposed on one side of the transparent bridge and configured to project diffusive light onto the top surface of the transparent bridge by transmitting through the transparent bridge; and an image pickup unit disposed on the other side of the transparent bridge and configured to receive light projected from the illuminating unit and transmitting through the separated low rigidity transparent or translucent body to form an image when the separated low rigidity transparent or translucent body enters the top surface of the transparent bridge. With the apparatus and the method, it is possible to detect a defect of the separated low rigidity transparent or translucent body.
摘要翻译： 本发明涉及的装置和用于检测分离的低刚性透明的或半透明体的缺陷，worin图像获取装置的方法包括：第一输送器和用于输送分离的低刚性透明的或半透明体的第二输送器; 透明桥的第一输送器和沿分离的低刚性透明或半透明的本体，具有一顶表面的透明网桥的传送路径的第二输送机之间设置; 到照明单元布置在所述透明桥的一侧，并且被配置为投射光扩散到由穿过透明网桥发射透明网桥的顶表面上; 和图像拾取单元布置在透明网桥的另一侧，并构造成接收光从照明单元投射，并通过分离的低刚性透明或半透明的体传送到当分离的低刚性透明或半透明的体进入形成图像 透明网桥的顶表面上。 随着设备和方法，它能够检测分离的低刚性透明的或半透明体的缺陷。
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