LIGHT DETECTING ELEMENT, AND LIGHT DETECTING DEVICE

    公开(公告)号:EP4412238A1

    公开(公告)日:2024-08-07

    申请号:EP22872986.9

    申请日:2022-09-22

    IPC分类号: H04N25/76 H01L27/146

    CPC分类号: H01L27/146 H04N25/76

    摘要: A pixel layout is optimized. An amplification unit generates a signal corresponding to a charge held in a charge holding unit and outputs the signal to a predetermined first output node. A first capacitive element has one end connected to the first output node and holds a reset level that is a level of the signal at the time of resetting by a first reset unit. A second capacitive element has one end connected to the first output node and holds an image signal level that is a level of the signal when the charge is transferred to the charge holding unit. A readout circuit is connected to a second output node, reads each of the reset level held in the first capacitive element and the image signal level held in the second capacitive element, and outputs the reset level and the image signal level as a reset signal and an image signal, respectively.

    SOLID-STATE IMAGING ELEMENT, IMAGING DEVICE, AND METHOD FOR CONTROLLING SOLID-STATE IMAGING UNIT

    公开(公告)号:EP4261890A1

    公开(公告)日:2023-10-18

    申请号:EP21903196.0

    申请日:2021-11-25

    发明人: BANDO, Masashi

    摘要: A solid-state imaging element according to an aspect of the present disclosure includes: a first photoelectric conversion unit (31) having a light incident surface on which light is incident; a first gate electrode (36) provided in the first photoelectric conversion unit (31) via an insulating film (35); a second photoelectric conversion unit (32) provided on a side of the light incident surface with respect to the first photoelectric conversion unit (31); and a voltage application unit that applies a voltage corresponding to the number of charges accumulated by the second photoelectric conversion unit (32) to the first gate electrode (36).

    IMAGING ELEMENT AND IMAGING DEVICE
    4.
    发明公开

    公开(公告)号:EP4160685A1

    公开(公告)日:2023-04-05

    申请号:EP21812547.4

    申请日:2021-04-07

    IPC分类号: H01L27/146 H04N5/369

    摘要: An imaging element according to an embodiment of the present disclosure includes: a semiconductor substrate; a multilayer wiring layer; a plurality of structures; and a light reflecting layer. The semiconductor substrate has a first surface and a second surface. The first surface serves as a light incidence surface. The second surface is opposite to the first surface. The semiconductor substrate includes a light receiving section for each of pixels. The light receiving section generates electric charge through photoelectric conversion. The electric charge corresponds to an amount of received light. The multilayer wiring layer is provided on the second surface side of the semiconductor substrate. The multilayer wiring layer has a plurality of wiring layers stacked therein with an interlayer insulating layer interposed in between. The plurality of structures is provided on the second surface of the semiconductor substrate in the multilayer wiring layer. The light reflecting layer is provided in the multilayer wiring layer. The light reflecting layer forms a reflective region or a non-reflective region in a region with the interlayer insulating layer interposed in between. The region has none of the structures formed therein. The reflective region is substantially symmetrical with respect to an optical center of the pixel. The non-reflective region is substantially symmetrical with respect to the optical center of the pixel.