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1.发明授权LOW-COST CONFIGURATION FOR MONITORING AND CONTROLLING PARAMETRIC MEASUREMENT UNITS IN AUTOMATIC TEST EQUIPMENT 有权实价配置用于检测和控制参数测量单元在自动测试设备
公开(公告)号：EP1157279B1
公开(公告)日：2007-04-18
申请号：EP00914494.0
申请日：2000-02-03
申请人： Teradyne, Inc.
IPC分类号： G01R31/319
CPC分类号： G01R31/31908 , G01R31/3191 , G01R31/31924
摘要： Pin slice circuitry used in automatic test equipment is disclosed. The pin slice circuitry includes a portion implemented using CMOS technology and a portion implemented using bipolar technology. The CMOS portion includes a plurality of timing generator circuits, digital sigma delta modulator circuitry used to generate digital bit streams representative of analog reference levels, and programmable digital signal processing circuitry. The bipolar portion includes driver/receiver channels, a parametric measurement unit, and decoder circuitry, which produces the analog reference levels from the digital bit streams generated by the modulator circuitry. The analog reference levels are used by the driver/receiver channels and the parametric measurement unit; and, the digital signal processing circuitry is used to monitor and control levels produced by the parametric measurement unit. The disclosed pin slice circuitry has the advantages of reduced size and cost as compared with conventional pin slice circuitry.
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2.发明公开AUTOMATIC TEST EQUIPMENT USING SIGMA DELTA MODULATION TO CREATE REFERENCE LEVELS 有权Σ-Δ调制的用于产生参考水平自动测试设备
公开(公告)号：EP1149298A1
公开(公告)日：2001-10-31
申请号：EP00908478.1
申请日：2000-02-03
申请人： TERADYNE, INC.
IPC分类号： G01R31/319 , H03M3/02
CPC分类号： G01R31/31908 , G01R31/31924
摘要： Pin slice circuitry used in automatic test equipment is disclosed. The pin slice circuitry includes a portion implemented using CMOS technology and a portion implemented using bipolar technology. The CMOS portion includes a plurality of timing generator circuits and sigma delta modulator circuitry, which is used to generate digital bit streams representative of analog reference levels. The bipolar portion includes driver/receiver channels, a parametric measurement unit, and decoder circuitry, which produces the analog reference levels from the digital bit streams generated by the modulator circuitry. The analog reference levels are used by the driver/receiver channels and the parametric measurement unit. The disclosed pin slice circuitry has the advantages of reduced size and cost as compared with conventional pin slice circuitry.
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3.发明授权AUTOMATIC TEST EQUIPMENT USING SIGMA DELTA MODULATION TO CREATE REFERENCE LEVELS 有权Σ-Δ调制的用于产生参考水平自动测试设备
公开(公告)号：EP1149298B1
公开(公告)日：2003-05-21
申请号：EP00908478.1
申请日：2000-02-03
申请人： TERADYNE, INC.
IPC分类号： G01R31/319 , H03M3/02
CPC分类号： G01R31/31908 , G01R31/31924
摘要： Pin slice circuitry used in automatic test equipment is disclosed. The pin slice circuitry includes a portion implemented using CMOS technology and a portion implemented using bipolar technology. The CMOS portion includes a plurality of timing generator circuits and sigma delta modulator circuitry, which is used to generate digital bit streams representative of analog reference levels. The bipolar portion includes driver/receiver channels, a parametric measurement unit, and decoder circuitry, which produces the analog reference levels from the digital bit streams generated by the modulator circuitry. The analog reference levels are used by the driver/receiver channels and the parametric measurement unit. The disclosed pin slice circuitry has the advantages of reduced size and cost as compared with conventional pin slice circuitry.
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4.发明公开LOW-COST CONFIGURATION FOR MONITORING AND CONTROLLING PARAMETRIC MEASUREMENT UNITS IN AUTOMATIC TEST EQUIPMENT 有权实价配置用于检测和控制参数测量单元在自动测试设备
公开(公告)号：EP1157279A1
公开(公告)日：2001-11-28
申请号：EP00914494.0
申请日：2000-02-03
申请人： TERADYNE, INC.
IPC分类号： G01R31/319
CPC分类号： G01R31/31908 , G01R31/3191 , G01R31/31924
摘要： Pin slice circuitry used in automatic test equipment is disclosed. The pin slice circuitry includes a portion implemented using CMOS technology and a portion implemented using bipolar technology. The CMOS portion includes a plurality of timing generator circuits, digital sigma delta modulator circuitry used to generate digital bit streams representative of analog reference levels, and programmable digital signal processing circuitry. The bipolar portion includes driver/receiver channels, a parametric measurement unit, and decoder circuitry, which produces the analog reference levels from the digital bit streams generated by the modulator circuitry. The analog reference levels are used by the driver/receiver channels and the parametric measurement unit; and, the digital signal processing circuitry is used to monitor and control levels produced by the parametric measurement unit. The disclosed pin slice circuitry has the advantages of reduced size and cost as compared with conventional pin slice circuitry.
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