公开(公告)号：EP1128765A1

公开(公告)日：2001-09-05

申请号：EP99961661.8

申请日：1999-11-12

申请人： The Johns Hopkins University

发明人： ATALAR, Ergin ,  LESHO, Jeffrey, C. ,  CHARLES, Harry, K., Jr. ,  CARKHUFF, Bliss, G. ,  BOTTOMLEY, Paul, A.

IPC分类号： A61B5/055

CPC分类号： G01R33/34084 ,  G01R33/34007 ,  G01R33/341 ,  G01R33/3657 ,  G01R33/3678

摘要： An electrically insulate generally rectangular flexible circuit board (200) has a first surface (202) on which an electrically conductive path containing a first coil (204) consisting of a first coil segment (210), a generally parallel second coil segment (212), and an end electrically connecting portion (214) are provided. A first capacitor (220), and a second capacitor (222) are provided in the circuit.

公开(公告)号：EP1121602B1

公开(公告)日：2004-04-07

申请号：EP99954850.6

申请日：1999-10-12

申请人： The Johns Hopkins University ,  The United States of America as represented by The Secretary of The Navy

发明人： CHARLES, Harry, K., Jr. ,  MECHTEL, Deborah, M. ,  FRANCOMACARO, Arthur, S.

IPC分类号： G01R15/24

CPC分类号： G01R31/311 ,  G01R31/318513 ,  H05K1/0269 ,  H05K1/0373 ,  H05K3/4644 ,  H05K2201/0154 ,  H05K2203/105 ,  H05K2203/107 ,  H05K2203/161

摘要： The present invention improves multi-chip module (MCM) testability by using a new technique to detect on-substrate electric field strength. The invention employs a non-invasive, laser-based instrument to probe the MCM structures fabricated with poled polyimide interlayer dielectrics and thin film metallizations on silicon carriers. Circuit element characteristics of MCMs are probed with laser to detect electric field strength. The electrical, mechanical and optical properties of the electro-optical dielectric layers are determined to investigate the effect of the poling and processing operations on the efficacy of the polyimide as both a dielectric layer and an electro-optic material suitable for laser probing.

公开(公告)号：EP1121602A1

公开(公告)日：2001-08-08

申请号：EP99954850.6

申请日：1999-10-12

申请人： The Johns Hopkins University

发明人： CHARLES, Harry, K., Jr. ,  MECHTEL, Deborah, S. ,  FRANCOMACARO, Arthur, S.

IPC分类号： G01R15/24

CPC分类号： G01R31/311 ,  G01R31/318513 ,  H05K1/0269 ,  H05K1/0373 ,  H05K3/4644 ,  H05K2201/0154 ,  H05K2203/105 ,  H05K2203/107 ,  H05K2203/161

摘要： The present invention improves multi-chip module (MCM) testability by using a new technique to detect on-substrate electric field strength. The invention employs a non-invasive, laser-based instrument to probe the MCM structures fabricated with poled polyimide interlayer dielectrics and thin film metallizations on silicon carriers. Circuit element characteristics of MCMs are probed with laser to detect electric field strength. The electrical, mechanical and optical properties of the electro-optical dielectric layers are determined to investigate the effect of the poling and processing operations on the efficacy of the polyimide as both a dielectric layer and an electro-optic material suitable for laser probing.

公开(公告)号：EP1379172A2

公开(公告)日：2004-01-14

申请号：EP01994328.1

申请日：2001-10-24

申请人： THE JOHNS HOPKINS UNIVERSITY

发明人： CHARLES, Harry, K., Jr. ,  BECK, Thomas, J. ,  FELDMESSER, Howard, S. ,  MAGEE, Thomas, C. ,  LEE, David, M. ,  DAWSON, Douglas, J. ,  WEINER, Joel, A. ,  BENNETT, Clifford, E., Jr.

IPC分类号： A61B6/00

CPC分类号： A61B6/482 ,  A61B6/032 ,  A61B6/06 ,  A61B6/4007 ,  A61B6/4035 ,  A61B6/405 ,  A61B6/4233 ,  A61B6/4291 ,  A61B6/4441 ,  A61B6/505 ,  A61B6/542 ,  A61B6/563 ,  A61B6/583 ,  G01N23/046 ,  G01N2223/419 ,  G01N2223/612

摘要： Methods and apparatuses for advanced, multiple-projection, dual-energy X-ray absorptiometry scanning systems include combinations of a conical collimator; a high-resolution two-dimensional detector; a portable, power-capped, variable-exposure-time power supply; an exposure-time control element; calibration monitoring; a three-dimensional anti-scatter-grid; and a gantry-gantry base assembly that permits up to seven projection angles for overlapping beams. Such systems are capable of high precision bone structure measurements that can support three dimensional bone modeling and derivations of bone strength, risk of injury, and efficacy of countermeasures among other properties.

公开(公告)号：EP1357832A2

公开(公告)日：2003-11-05

申请号：EP01989985.5

申请日：2001-11-08

申请人： THE JOHNS HOPKINS UNIVERSITY

发明人： CHARLES, Harry, K., Jr. ,  BECK, Thomas, J. ,  FELDMESSER, Howard, S. ,  MAGEE, Thomas, C.

IPC分类号： A61B5/00

CPC分类号： A61B6/505 ,  A61B6/032 ,  A61B6/4035 ,  A61B6/405 ,  A61B6/4233 ,  A61B6/4291 ,  A61B6/4441 ,  A61B6/467 ,  A61B6/482 ,  A61B6/542 ,  A61B6/563 ,  A61B6/583 ,  G01N23/06 ,  G01N2223/1003 ,  Y10S378/901

摘要： Techniques for deriving bone properties from images generated by a dual-energy x-ray absorptiometry apparatus include receiving first image data having pixels indicating bone mineral density projected at a first angle of a plurality of projection angles. Second image data and third image data are also received. The second image data indicates bone mineral density projected at a different second angle. The third image data indicates bone mineral density projected at a third angle. The third angle is different from the first angle and the second angle. Principal moments of inertia for a bone in the subject are computed based on the first image data, the second image data and the third image data. The techniques allow high-precision, high-resolution dual-energy x-ray attenuation images to be used for computing principal moments of inertia and strength moduli of individual bones, plus risk of injury and changes in risk of injury to a patient.