INSPECTION METHOD AND MANUFACTURING METHOD OF ELECTRICAL STORAGE DEVICE

    公开(公告)号:EP3517986A3

    公开(公告)日:2019-08-21

    申请号:EP18204554.2

    申请日:2018-11-06

    摘要: An inspection method of a present electrical storage device (1) includes: constituting a circuit (3) with the electrical storage device (1) being charged and a power supply (4), and passing a current (IB) by the power supply (4) to the circuit (3) in a direction of charging or discharging the electrical storage device (1); and in passing the current (IB), determining the quality of the electrical storage device (1) based on a converging state of the passing current (IB). In passing the current (IB), an output voltage (VS) of the power supply (4) is changed from an initial value with the passage of time.

    METHOD OF INSPECTING ELECTRIC POWER STORAGE DEVICE FOR SHORT CIRCUIT AND METHOD OF MANUFACTURING ELECTRIC POWER STORAGE DEVICE

    公开(公告)号:EP3428670A1

    公开(公告)日:2019-01-16

    申请号:EP18179889.3

    申请日:2018-06-26

    摘要: A method of inspecting an electric power storage device (1) for a short circuit includes voltage measuring (S5) of measuring a pre-detection device voltage (VB1) of the electric power storage device (1) that is pre-charged, current detecting (S6) of detecting a temporal change in a current (IB) flowing to the electric power storage device (1) from an external electric power supply (EP) or a stable current value (IBs) of the current (IB) by continuously applying an output voltage (VS) equal to the pre-detection device voltage (VB1) to the electric power storage device (1) from the external electric power supply (EP), and determining (S9) of determining an internal short circuit in the electric power storage device (1) based on the detected temporal change in the current (IB) or the stable current value (IBs) of the current (IB).