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公开(公告)号:EP2356692A2
公开(公告)日:2011-08-17
申请号:EP09825456.8
申请日:2009-11-06
发明人: XU, Xixiang , GUHA, Subhendu , YANG, Chi , YUE, Guozhen , BEGLAU, David, Alan , LI, Yang , JONES, Scott , YANG, Baojle
IPC分类号: H01L31/042
CPC分类号: H01L31/075 , H01L31/0284 , H01L31/03762 , H01L31/03765 , H01L31/03767 , H01L31/076 , H01L31/1804 , H01L31/1812 , H01L31/202 , H01L31/204 , Y02E10/547 , Y02E10/548 , Y02P70/521
摘要: A hydrogenated, silicon based semiconductor alloy has a defect density of less than 10
16 cm
-3 . The alloy may comprise a hydrogenated silicon alloy or a hydrogenated silicon- germanium alloy. Hydrogen content of the alloy is generally less than 15%, and in some instances less than 11%. The tandem photovoltaic devices which incorporate the alloy exhibit low levels of photo degradation. In some instances, the material is fabricated by a high speed VHF deposition process.