利索-全球专利检索

  1. 登录
  2. 注册

搜索结果

8 条记录 (耗时 0.015 秒)

    VERFAHREN UND ANORDNUNG ZUR MESSUNG VON STRUKTUREN EINES OBJEKTS
    2.
    发明公开
    VERFAHREN UND ANORDNUNG ZUR MESSUNG VON STRUKTUREN EINES OBJEKTS 审中-公开
    方法和装置用于测量对象结构

    公开(公告)号：EP1926967A1

    公开(公告)日：2008-06-04

    申请号：EP06792130.4

    申请日：2006-09-19

    申请人： Werth Messtechnik GmbH

    发明人： ANDRÄS, Matthias ,  CHRISTOPH, Ralf ,  NEUSCHÄFER-RUBE, Ulrich ,  RAUH, Wolfgang

    IPC分类号： G01B11/00

    CPC分类号： G01B5/012 ,  G01B11/007

    摘要： The invention relates to a method and device for determining the structures of an object by means of a shape-gauge element starting from the stylus extension of an calliper associated to a co-ordinate measuring instrument, which is brought into contact with the object and, afterwards, the spatial position of the a shape-gauge element or of a target mark directly associated therewith is determined by means of an optical sensor. The aim of said invention is to determine any structures with a high measuring accuracy, which requires an accurate determination of the shape-gauge element position to be brought into contact with the object. For this purpose, the invention is characterised in that the two-dimensional position of the shape-gauge element and/or of the target mark is determined by means of a two-dimensional optical position sensors associated with each other on the position point of view and the spatial (3-dimensional) position of the shape-gauge element is calculated on the base of the two-dimensional position thereof.

    VERFAHREN ZUM SCANNENDEN MESSEN EINER KONTUR EINES WERKSTÜCKS
    4.
    发明公开
    VERFAHREN ZUM SCANNENDEN MESSEN EINER KONTUR EINES WERKSTÜCKS 审中-公开
    方法扫描结束测量工件的轮廓

    公开(公告)号：EP1570234A2

    公开(公告)日：2005-09-07

    申请号：EP03782407.5

    申请日：2003-12-15

    申请人： Werth Messtechnik GmbH

    发明人： CHRISTOPH, Ralf ,  MÜLLER, Klaus ,  RAUH, Wolfgang

    IPC分类号： G01B11/03 ,  G01B5/008 ,  G01B21/04

    CPC分类号： G01B11/005

    摘要： The invention relates to a method for measuring a contour (202) of a workpiece (200) by scanning, using a first and a second sensor. According to the invention, the contour of the workpiece may be measured with high precision and rapidly, especially in the edge region thereof, whereby the contour of the workpiece in a plane (x, y) is recorded by means of the at least two sensors and the information obtained from at least one sensor is used to influence the actions of at least one other sensor. In particular, a mechanical or opto-tactile scanner is operated by means of contour data, obtained by image processing in several windows (206). The contour of the workpiece may also be measured in a direction perpendicular to the x, y plane by means of a laser sensor.

    COMPUTERTOMOGRAFIE-VERFAHREN UND ANORDNUNG ZUR BESTIMMUNG VON MERKMALEN AN EINEM MESSOBJEKT
    6.
    发明公开
    COMPUTERTOMOGRAFIE-VERFAHREN UND ANORDNUNG ZUR BESTIMMUNG VON MERKMALEN AN EINEM MESSOBJEKT 审中-公开
    同时测定的测量对象特征的计算机断层摄影方法及系统

    公开(公告)号：EP2847620A2

    公开(公告)日：2015-03-18

    申请号：EP13727527.7

    申请日：2013-05-07

    申请人： Werth Messtechnik GmbH ,  Friedrich-Alexander-Universität Erlangen-Nürnberg

    发明人： KACHELRIESS, Marc ,  BAER, Matthias ,  SCHMIDT, Ingomar ,  HAMMER, Michael ,  CHRISTOPH, Ralf ,  SCHUBERT, Tristan ,  RAUH, Wolfgang

    IPC分类号： G01T1/29 ,  G06T11/00

    CPC分类号： G01T1/2985 ,  G06T11/005 ,  G06T2211/416

    摘要： The invention relates to a computer tomography method for dimensionally determining features of a measurement object, through which a radiation is passed in several rotational positions, wherein measurement deviations due to the scattered radiation or other physical effects are corrected. In order to avoid or correct measurement deviations in particular due to scattered radiation or due to other physical effects such as beam hardening, afterglow effects, or the like, it is proposed, for example, that the radiographs are corrected by means of synthetic radiographs, calculated from a geometry that is determined in advance or know or from a model of the geometry, wherein the geometry or the model of the geometry at least roughly corresponds to the measurement object.

    摘要翻译： 本发明涉及一种用于测量对象，通过它辐射在若干旋转位置传递的维确定性采矿特征的计算机断层摄影方法，worin测量偏差由于散射辐射或其他物理效应进行校正。 为了避免或特别是由于散射的辐射或正确的测量偏差是由于其他物理效应：如射束硬化，余辉效应，或类似物，它被提出，例如，DASS模具射线照片通过合成X光片的方式校正， 从几何计算没有被预先确定的开采或知道或从几何形状的模型中，worin的几何形状或几何形状的模型中的至少大致对应于所述检测对象。

    KOORDINATENMESSGERÄT UND VERFAHREN ZUM MESSEN EINES OBJEKTES
    8.
    发明公开
    KOORDINATENMESSGERÄT UND VERFAHREN ZUM MESSEN EINES OBJEKTES 有权
    Verfahren zum Messen eines Objekts mit einemKoordinatenmessgerät，das einen Computer-Tomographenenthält

    公开(公告)号：EP1749190A1

    公开(公告)日：2007-02-07

    申请号：EP05750966.3

    申请日：2005-05-24

    申请人： Werth Messtechnik GmbH

    发明人： CHRISTOPH, Ralf ,  RAUH, Wolfgang

    IPC分类号： G01B21/04 ,  A61B6/00 ,  G01N23/04

    CPC分类号： G01B15/00 ,  A61B6/4417 ,  A61B6/583 ,  A61B6/584 ,  G01B15/04 ,  G01N23/046 ,  G01N23/083 ,  G01N2223/1006 ,  G01N2223/3306 ,  G01N2223/419 ,  G01T7/005 ,  G01T7/10

    摘要： The invention relates to a coordinate measuring apparatus (110) for measuring an object (3), comprising an x-ray sensory mechanism as a first sensory mechanism that is provided with an x-ray source (10) and at least one x-ray sensor (7) which detects the x-rays, and a second sensory mechanism such as a tactile and/or an optical sensory mechanism (8, 11; 9) that can be placed in the x, y, and/or z direction of the coordinate measuring apparatus in relation to the object. In order to be able to easily measure also large-size test objects, the x-ray sensory mechanism (7, 10) can be positioned in the coordinate measuring apparatus (10) according to the second sensory mechanism (8, 11; 9).

    摘要翻译： 物体（3）被放置在转盘（2）上，其可以在X方向上旋转和上下移动。 转盘可以放置在形成主要测量系统的X射线源（10）和X射线接收器（7）之间。 二次测量系统可以是触觉和/或光学感觉机制（8,9,11）。 X射线源可以在Y方向上水平移动，并且传感器可以在Z方向上以直角移动。