SEALER FOR TEST SAMPLE DEVICES
    3.
    发明授权
    SEALER FOR TEST SAMPLE DEVICES 有权
    用于测试样品设备的密封剂

    公开(公告)号:EP1678506B1

    公开(公告)日:2018-02-28

    申请号:EP04781140.1

    申请日:2004-08-13

    申请人: bioMerieux, Inc.

    摘要: A sealer for a sample testing instrument is disclosed that cuts and seals a fluid conduit that connects a test sample device with a fluid receptacle containing a fluid sample. The sealer includes an enclosure and a protective shield to protect a user or technician from contact with the cutting element assembly in the sealer. The cutting element assembly includes a spring-loaded element that engages the test sample device and holds it in a fixed position while a cutting element (e.g., hot wire) cuts the fluid conduit. A motor driving the cutting element assembly is positioned at an angle having both vertical and horizontal components, whereby adjustment of the motor firmware allows for adjustment of the position of the cutting element relative to the instrument in both horizontal and vertical directions.

    SEALER FOR TEST SAMPLE DEVICES
    4.
    发明公开
    SEALER FOR TEST SAMPLE DEVICES 有权
    VERSCHLUSSGERÄTFÜRTESTPROBENVORRICHTUNGEN

    公开(公告)号:EP1678506A1

    公开(公告)日:2006-07-12

    申请号:EP04781140.1

    申请日:2004-08-13

    申请人: Biomerieux, Inc.

    IPC分类号: G01N35/00 G01N35/02 G01N1/00

    摘要: A sealer for a sample testing instrument is disclosed that cuts and seals a fluid conduit that connects a test sample device with a fluid receptacle containing a fluid sample. The sealer includes an enclosure and a protective shield to protect a user or technician from contact with the cutting element assembly in the sealer. The cutting element assembly includes a spring-loaded element that engages the test sample device and holds it in a fixed position while a cutting element (e.g., hot wire) cuts the fluid conduit. A motor driving the cutting element assembly is positioned at an angle having both vertical and horizontal components, whereby adjustment of the motor firmware allows for adjustment of the position of the cutting element relative to the instrument in both horizontal and vertical directions.

    摘要翻译: 公开了一种用于样品测试仪器的密封器,其用于切割和密封将测试样品装置与含有流体样品的流体容器连接的流体导管。 密封件包括外壳和保护罩,用于保护使用者或技术人员不与密封件中的切割元件组件接触。 切割元件组件包括弹簧加载元件,其接合测试样品装置并将其保持在固定位置,同时切割元件(例如热丝)切割流体导管。 驱动切割元件组件的马达定位成具有垂直和水平分量的角度,由此马达固件的调整允许在水平和垂直方向上调节切割元件相对于乐器的位置。

    CARRIER FOR HOLDING TEST SAMPLES
    5.
    发明公开
    CARRIER FOR HOLDING TEST SAMPLES 有权
    载体HOLDING样本

    公开(公告)号:EP1680225A1

    公开(公告)日:2006-07-19

    申请号:EP04781100.5

    申请日:2004-08-13

    申请人: Biomerieux, Inc.

    IPC分类号: B01L9/00 G01N35/00

    摘要: A carrier for holding up to N test sample devices as they are moved through a sample testing instrument. Each of the test sample devices are held in a receiving structure such as a slot in the carrier. The carrier also includes N optical interrupt positioning features, each placed in registry with one of the receiving structures (and thereby in registry with the test sample device). The instrument includes fixed optical interrupt sensors for detecting the position of the positioning feature as the carrier is moved through the instrument. In the illustrated embodiment, the position features comprise voids formed in a rib on the lower surface of the carrier. The optical interrupt sensors are positioned below the path the carrier travels over, whereby as the carrier moves past the sensor the voids, and hence position of the test sample devices, are detected.

    CARRIER FOR HOLDING TEST SAMPLES
    8.
    发明授权
    CARRIER FOR HOLDING TEST SAMPLES 有权
    载体HOLDING样本

    公开(公告)号:EP1680225B1

    公开(公告)日:2012-08-08

    申请号:EP04781100.5

    申请日:2004-08-13

    申请人: bioMerieux, Inc.

    IPC分类号: B01L9/00 G01N35/00

    摘要: A carrier for holding up to N test sample devices as they are moved through a sample testing instrument. Each of the test sample devices are held in a receiving structure such as a slot in the carrier. The carrier also includes N optical interrupt positioning features, each placed in registry with one of the receiving structures (and thereby in registry with the test sample device). The instrument includes fixed optical interrupt sensors for detecting the position of the positioning feature as the carrier is moved through the instrument. In the illustrated embodiment, the position features comprise voids formed in a rib on the lower surface of the carrier. The optical interrupt sensors are positioned below the path the carrier travels over, whereby as the carrier moves past the sensor the voids, and hence position of the test sample devices, are detected.