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公开(公告)号：EP4368954A1
公开(公告)日：2024-05-15
申请号：EP23160910.8
申请日：2023-03-09
发明人： Cao, Liang
CPC分类号： G01J5/025 , G01J5/04 , G01K13/223 , G01J2005/009220130101 , G01J5/48
摘要： The present disclosure discloses a multi-sensor synchronous non-contact measuring probe of an infrared thermometer, comprising a sensor fixing sleeve and a pressing block arranged at the inner end of the sensor fixing sleeve, wherein at least two infrared sensors are arranged on the pressing block, the sensor fixing sleeve is provided with optical channels with the same number as that of the infrared sensors, the detection surface of each of the infrared sensors is interfaced with a corresponding optical channel, and the infrared sensors are connected with MCU chips. According to the present disclosure, a plurality of infrared sensors are used to synchronously detect the skin temperature of a human body, and corresponding compensation is carried out depending on temperature values detected by the plurality of infrared sensors, so that a final value of the human body temperature detection is obtained, and the accuracy of human body temperature detection is effectively improved.
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2.发明公开
公开(公告)号：EP4372337A1
公开(公告)日：2024-05-22
申请号：EP23210589.0
申请日：2023-11-17
发明人： YU, TSAI-CHUNG , LEE, NAN-HUEI
CPC分类号： G01K13/223 , G01K7/01 , G01J5/061 , G01J5/064 , G01J2005/06320130101 , G01J5/12 , G01J5/14 , G01J5/80 , G01J5/0011 , G01K3/08
摘要： Provided is a measurement system including: a first chip including at least one first PN junction element adapted to sense a temperature of the first chip; and a second chip electrically connected to the first chip to form a first loop including the first PN junction element. The second chip includes a second loop. The second loop includes at least one second PN junction element adapted to sense a temperature of the second chip. The second chip provides multiple currents in the first loop and the second loop to generate voltage signals associated with the temperature of the first chip and the temperature of the second chip according to the first PN junction element and the second PN junction element and thus calculate the temperature difference between the first chip and the second chip. A measurement method applicable to the measurement system is further provided.
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3.发明公开
公开(公告)号：EP4372336A1
公开(公告)日：2024-05-22
申请号：EP23210588.2
申请日：2023-11-17
发明人： YU, TSAI-CHUNG , LEE, NAN-HUEI
CPC分类号： G01K13/223 , G01K7/01 , G01J5/061 , G01J5/064 , G01J2005/06320130101 , G01J5/12 , G01J5/14 , G01J5/80 , G01J5/0011 , G01K3/08
摘要： A temperature measurement system and method are provided. The temperature measurement system includes: at least one first PN junction element disposed at a first chip to sense a temperature of the first chip; at least one second PN junction element disposed at a second chip to sense a temperature of the second chip; a second temperature measurement circuit electrically connected to the first and second PN junction elements and disposed at the second chip for measuring to obtain a temperature difference value between the first chip and the second chip; a third temperature measurement circuit comprising at least one third PN junction element and disposed at the second chip for measuring to obtain a temperature value of the second chip; and a processing unit for calculating the temperature difference value and the temperature value of the second chip to obtain a temperature value of the first chip.
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