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1.
公开(公告)号:EP4462084A1
公开(公告)日:2024-11-13
申请号:EP23882911.3
申请日:2023-09-21
申请人: LG Chem, Ltd.
发明人: LEE, Do Hyun , LEE, Seung Heon
摘要: The present disclosure relates to a film temperature and thickness measurement apparatus and a measurement method using the same, which can enable manufacturing of a film with a uniform thickness by sequentially measuring the surface temperature and thickness of a film at the same point of the film that is extruded or coating molded in an in-line method, and through control of the temperature and the thickness of the film based on the measured data.
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公开(公告)号:EP4080174B1
公开(公告)日:2024-10-09
申请号:EP19956801.5
申请日:2019-12-19
IPC分类号: G01D21/00 , G01K1/08 , G01K1/14 , G01W1/00 , G01W1/11 , A61B5/11 , G01W1/17 , G01J5/00 , G01K1/024 , A61B5/00 , G01W1/02 , G01J5/02 , G01J5/04 , G01J5/06 , G01J5/53
CPC分类号: A61B5/11 , G01K1/08 , G01W1/11 , G01K1/024 , G01W1/02 , A61B5/318 , A61B5/6804 , A61B2560/024220130101 , G01W1/17 , G01K1/14 , G01J5/0265 , G01J5/0205 , G01J5/046 , G01J5/048 , G01J5/06 , G01J5/53
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公开(公告)号:EP4413339A1
公开(公告)日:2024-08-14
申请号:EP22782516.3
申请日:2022-09-22
CPC分类号: G01J5/0025 , G01J2005/007720130101 , G01J5/80 , G01J5/802 , G01J5/0275 , G01J5/07 , A61B5/01
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7.
公开(公告)号:EP3957964B1
公开(公告)日:2024-07-03
申请号:EP21189651.9
申请日:2021-08-04
CPC分类号: G01J5/0025 , G01J5/025 , G01J5/0275 , A61D13/00 , A61B5/01 , A61B5/0002
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公开(公告)号:EP3933360B1
公开(公告)日:2024-06-05
申请号:EP21173635.0
申请日:2021-05-12
IPC分类号: G01J5/02
CPC分类号: G01J5/023 , G01J2005/007720130101
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公开(公告)号:EP4372335A1
公开(公告)日:2024-05-22
申请号:EP23209715.4
申请日:2023-11-14
申请人: TDK Corporation
发明人: HARA, Shinji , OHTA, Naoki , SENRIUCHI, Tadao , AOKI, Susumu , MAEKAWA, Kazuya , KOKUBO, Maiko , KIMOTO, Yusuke
CPC分类号: G01J5/023 , G01J5/024 , G01J5/20 , G01J2005/20220130101 , G01J5/22
摘要: The electromagnetic wave sensor includes: a first substrate; a first wire which extends in a first direction parallel to a substrate surface of the first substrate in a plan view from a direction perpendicular to the substrate surface; a second wire which extends in a direction parallel to the substrate surface and different from the first direction in the plan view; and an electromagnetic wave detector which is electrically connected to the first wire and is electrically connected to the second wire, wherein the first wire is located on the first substrate side in relation to the electromagnetic wave detector in a third direction orthogonal to the first direction and the second direction and the second wire is located on a side opposite to the first substrate in relation to the electromagnetic wave detector in the third direction.
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