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公开(公告)号:EP3983152B1
公开(公告)日:2024-07-17
申请号:EP20732822.0
申请日:2020-06-10
IPC分类号: B22F10/28 , B22F10/36 , B22F10/366 , B22F10/38 , B22F12/45 , B22F12/49 , B22F12/90 , B33Y10/00 , B33Y30/00 , B33Y50/02 , B22F12/41 , B22F12/44 , B29C64/268 , B29C64/277 , B29C64/393
CPC分类号: B33Y10/00 , B33Y30/00 , B33Y50/02 , B29C64/393 , B29C64/268 , B29C64/277 , Y02P10/25 , B22F10/28 , B22F10/366 , B22F12/90 , B22F12/45 , B22F10/38 , B22F12/44 , B22F10/36 , B22F12/49 , B22F12/41
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公开(公告)号:EP4338867A1
公开(公告)日:2024-03-20
申请号:EP23190812.0
申请日:2023-08-10
申请人: Arcam AB
发明人: JONNOR, Jimmie , HELLGREN, Jonas
IPC分类号: B22F10/28 , B22F10/31 , B22F10/36 , B22F10/85 , B22F12/41 , B22F12/90 , B23K15/00 , B33Y10/00 , B33Y30/00 , B33Y50/02 , G01N23/2208 , G01N23/225
摘要: A method of monitoring a spot quality of an electron beam (131) includes directing the electron beam (131) to a first measurement point (502) in a powder layer (112) a plurality of times, adjusting a focus offset of the electron beam (131) each of the plurality of times the electron beam (131) is directed to the first measurement point (502), measuring x-ray emissions from the first measurement point (502) each of the plurality of times the electron beam (131) is directed to the first measurement point (502), and determining a drift in a focus or an intensity of the electron beam (131) based on the measured x-ray emissions.
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公开(公告)号:EP4221919A1
公开(公告)日:2023-08-09
申请号:EP21777473.6
申请日:2021-09-13
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公开(公告)号:EP3530382B1
公开(公告)日:2023-06-28
申请号:EP17817095.7
申请日:2017-10-23
发明人: CARVALHO CUNHA DE BRITO E FARO, Tiago Maria , MARTINS ESTEVES, António José , ROSAS COUTINHO, Filipe , CARDOSO DOS SANTOS, João Paulo
IPC分类号: B22F3/105 , B29C64/153 , B29C64/371 , B33Y30/00 , B33Y40/00 , B22F12/41 , B22F12/49 , B22F12/90
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公开(公告)号:EP4183513A1
公开(公告)日:2023-05-24
申请号:EP22202227.9
申请日:2019-11-15
申请人: Directedmetal 3D SL
IPC分类号: B23K26/06 , B23K26/14 , B23K26/342 , B29C64/00 , B33Y10/00 , B33Y40/00 , B23K26/70 , B23K26/211 , B22F10/85 , B22F12/41 , B22F12/45 , B22F12/53 , B22F12/55 , B33Y30/00 , B33Y50/02
摘要: Disclosed is a multi-mode laser device for metal manufacturing applications including additive manufacturing (AM), laser cladding, laser welding, laser cutting, laser texturing and laser polishing. The multi-mode laser device configures off-axis, solid-state diode or diode-pumped lasers into an array to perform precision controlled, direct metal deposition printing, cladding, laser welding, laser cutting, laser texturing and laser polishing through a single device. Dual-mode printing, cladding and welding capability using metal wire and powder feedstock sources in the same device is provided with in-line control, precision wire feed driver/controller, adjustable shield gas diffuser, and nozzles tailored to wire feedstock diameter.
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公开(公告)号:EP3729484B1
公开(公告)日:2022-11-02
申请号:EP18826556.5
申请日:2018-12-14
发明人: BACKLUND, Johan , FAGER, Mattias
IPC分类号: B22F10/28 , B22F12/41 , B22F12/44 , B22F12/49 , B22F12/70 , B23K15/00 , B23K15/06 , B29C64/153 , B29C64/268 , B29C64/393 , B33Y10/00 , B33Y30/00 , B33Y50/02 , H01J37/301 , H01J37/305
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公开(公告)号:EP3538293B1
公开(公告)日:2022-07-13
申请号:EP17793939.4
申请日:2017-11-03
发明人: HUBER, Uwe , BAUER, Johannes , THIELMANN, Michael , WAGNER, Joachim , ALLENBERG-RABE, Matthias , ORTMANN, Jürgen , BREITLING, Detlef , BUCHBINDER, Damien , KRIST, Florian
IPC分类号: B22F12/41 , B22F10/28 , B33Y50/02 , B33Y10/00 , B22F12/45 , B22F10/366 , B29C64/277 , B29C64/153
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公开(公告)号:EP4008455A1
公开(公告)日:2022-06-08
申请号:EP20211402.1
申请日:2020-12-03
摘要: In summary the invention concerns a method for fusing one or more cross sections (C1, C2) in a powder bed (PB), a method for building an object (1, 2) and an electron beam powder bed fusion system (100). To provide an improved smoke-free process for electron beam powder bed fusion, enabling more complex geometries and reducing the need for postproduction/postprocessing of the built object following steps are proposed:
- pre-sintering (S2) the cross sections (C1, C2) in the powder layer (Ln) by scanning the cross sections (C1, C2) with a first line energy,
- fusing (S3) the cross sections (C1, C2) by scanning the cross sections (C1, C2) with a second line energy,
wherein the second line energy exceeds the first line energy, preferably by at least a factor of 2 or at least a factor of 5.-
公开(公告)号:EP3416770B1
公开(公告)日:2021-08-18
申请号:EP17710595.4
申请日:2017-02-17
IPC分类号: B22F10/25 , B22F10/38 , B22F10/50 , B22F12/86 , B23K26/144 , B23K26/342 , B23P15/00 , B33Y10/00 , B33Y30/00 , C21D7/06 , B23K101/00 , B29C64/118 , B22F12/41 , B24C1/10 , C21D9/50 , B22F3/16
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公开(公告)号:EP3285944B1
公开(公告)日:2021-08-04
申请号:EP16715513.4
申请日:2016-04-08
IPC分类号: B22F10/322 , B22F10/366 , B22F10/85 , B22F12/70 , B22F12/90 , B33Y30/00 , B22F10/28 , B33Y50/02 , B29C64/153 , B22F10/38 , B22F10/20 , B22F10/30 , B22F10/77 , B22F12/41
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