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    MATRICE DE PIXELS
    2.
    发明公开
    MATRICE DE PIXELS 审中-公开

    公开(公告)号：EP4262228A1

    公开(公告)日：2023-10-18

    申请号：EP23166426.9

    申请日：2023-04-04

    申请人： Commissariat à l'énergie atomique et aux énergies alternatives

    发明人： AYEL, François

    IPC分类号： H04N25/709 ,  H04N25/766 ,  H04N25/77 ,  H04N25/78

    摘要： La présente description concerne une matrice de pixels comprenant un ou plusieurs pixels (PIX1). Chaque pixel comprend un premier transistor ayant son noeud de commande couplé à une photodiode, un premier noeud de conduction principal couplé à un premier rail de tension de sortie (VS), et un deuxième noeud de conduction principal couplé à un deuxième rail de tension (VCS). La matrice comprend une impédance variable (404) couplant le premier rail de tension (VS) à un premier rail d'alimentation (VDD) et une source de courant (402) couplant le deuxième rail de tension (VCS) à un deuxième rail d'alimentation (GND), l'impédance variable (404) étant contrôlée sur la base d'une tension sur le deuxième rail de tension (VCS). La matrice comprend un premier commutateur (4002) couplant le deuxième rail de tension (VCS) à un troisième rail de tension (VINIT1).

    RADIATION IMAGING APPARATUS AND RADIATION IMAGING SYSTEM
    7.
    发明公开
    RADIATION IMAGING APPARATUS AND RADIATION IMAGING SYSTEM 审中-公开

    公开(公告)号：EP4358532A1

    公开(公告)日：2024-04-24

    申请号：EP23211422.3

    申请日：2020-11-04

    申请人： CANON KABUSHIKI KAISHA

    发明人： OFUJI, Masato ,  KAWANABE, Jun ,  FUJIYOSHI, Kentaro ,  WATANABE, Minoru ,  SUZUKI, Kai ,  OKADA, Hideyuki

    IPC分类号： H04N25/617 ,  H04N25/709 ,  H04N25/75 ,  H04N25/76

    CPC分类号： H04N25/617 ,  H04N25/709 ,  H04N25/76 ,  H04N25/75 ,  H04N25/30

    摘要： A radiation imaging apparatus (100) comprises a pixel unit (101) in which a plurality of pixels (200) each including a conversion element (202) configured to convert radiation into charges, and a switch element (201) are arranged in a matrix, a driving circuit (214) configured to control the switch elements (201) via a plurality of drive lines (Vg) extending in a row direction, a bias power supply unit (104) configured to supply a bias potential to the conversion element (202) via a bias line (Bs), a plurality of column signal lines (Sig) to which signals are output from the plurality of pixels (200) via the switch elements (201) and a detection unit (106). The plurality of pixels (200) include a first pixel (200a) and a second pixel (200b), which are adjacent to each other in the row direction and are connected to a common column signal line in the plurality of column signal lines (Sig), the switch element (201) of the first pixel (200a) and the switch element (201) of the second pixel (200b) are connected to drive lines different from each other in the plurality of drive lines (Vg), and the detection unit (106) determines presence/absence of radiation irradiation based on a current flowing to the bias line (Bs), the bias power supply unit includes a first bias power supply unit and a second bias power supply unit, the bias line includes a first bias line connected to the first bias power supply unit, and a second bias line connected to the second bias power supply unit and electrically independent of the first bias line, the conversion element of the first pixel is connected to the first bias power supply unit via the first bias line, and the conversion element of the second pixel is connected to the second bias power supply unit via the second bias line. The detection unit acquires a first signal value representing a current flowing to the first bias line when the switch element of a pixel in pixels whose conversion elements are connected to the first bias power supply unit in the plurality of pixels is in a conduction state, and a second signal value representing a current flowing to the second bias line when the switch element of a pixel whose conversion element is connected to the second bias power supply unit in the plurality of pixels is in a non-conduction state such that sampling timings at least partially overlap, and determines the presence/absence of radiation irradiation based on the first signal value and the second signal value.