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1.
公开(公告)号:EP4391730A3
公开(公告)日:2024-09-04
申请号:EP23216794.0
申请日:2023-12-14
发明人: POEHLMANN-MARTINS, Flavio , SABEV, Ogy , MAIN, William Thompson , CAHILL, Alexander , ALIBAZI BEHBAHANI, Reza , PAI, Raj
摘要: A radiation system includes a modulator (218) and at least one voltage regulator circuit (30, 302, 402, 602, 1002, 1202, 1402). The modulator (218) is configured to output a voltage for operation of a magnetron (216) and an electron gun (220) of the radiation system. The at least one voltage regulator circuit (30, 302, 402, 602, 1002, 1202, 1402) is electrically connected between the modulator and at least one of the magnetron (216) or the electron gun (220), and configured to control a magnitude of the voltage output from the modulator (218) for operation of the magnetron (216) and the electron gun (220).
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2.
公开(公告)号:EP4381906A1
公开(公告)日:2024-06-12
申请号:EP22754556.3
申请日:2022-07-28
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公开(公告)号:EP3745826A1
公开(公告)日:2020-12-02
申请号:EP18901222.2
申请日:2018-08-31
申请人: RIKEN
摘要: An accelerator (30, 40, 50) includes: a plurality of acceleration cavities (31, 41, 51) having one or two acceleration gaps; and a plurality of first control means (33, 43, 53) provided with respect to each of the plurality of acceleration cavities, each of the plurality of first control means independently generating an oscillating electric field and controlling a motion of an ion beam inside a corresponding acceleration cavity. In addition, M-number of multipole magnets (32, 42, 52) which generate a magnetic field and which control a motion of an ion beam may be provided downstream to N-number of acceleration cavities. The first control means independently controls acceleration voltage and a phase thereof and supplies radiofrequency power. Accordingly, particularly in a front stage of acceleration, a DC beam from an ion generation source can be adiabatically captured.
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公开(公告)号:EP3554199A8
公开(公告)日:2020-01-08
申请号:EP18167210.6
申请日:2018-04-13
发明人: CALDARA, Michele , GALIZZI, Francesco , JEFF, Adam
摘要: A time-of-flight (TOF) measurement system for measuring energy of a pulsed hadron beam, wherein each pulse of the beam is structured into a series of bunches (B) of charged particles, said bunches being repeated according to a repetition rate of the order of magnitude of radiofrequency. The system comprises
a first detector (1), a second detector (2) and a third detector (3) arranged along a beam path (10), each of the detectors being configured to detect the passage of a bunch (B) of charged particles and provide an output signal (v PP,1 , v PP,2 , v PP,3 ) dependent on phase of the detected bunch (B), wherein the second detector (2) is spaced apart from the first detector (1) by a first distance (L 12 ) and wherein the third detector (3) is spaced apart from the second detector (2) by a second distance (L 23 ), wherein the first distance is set out in such a way as that time of flight (t 12 ) of the bunch (B) from the first detector (1) to the second detector (2) is approximately equal to, or lower than a repetition period (T RFQ ) of the bunches (B), and wherein the second distance is set out in such a way as that time of flight (T 23 ) of the bunch (B) from the second detector (2) to the third detector (3) is greater than a multiple of the repetition period (T RFQ ) of the bunches (B), and
a processing unit (7) configured to
a) calculate phase shifts (Δ ϕ12 , Δ ϕ13 , Δ ϕ23 ) between the output signals (v PP,1 , v PP,2 , v PP,3 ) of the detectors (1, 2, 3), and
b) calculate energy (E) of the pulse based on the calculated phase shifts.-
公开(公告)号:EP3563646A1
公开(公告)日:2019-11-06
申请号:EP17886440.1
申请日:2017-12-29
发明人: MILLER, Kenneth E. , PRAGER, James R. , ZIEMBA, Timothy M. , CARSCADDEN, John G. , BOWMAN, Christopher Matthew , SLOBODOV, Ilia
IPC分类号: H05H9/00
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公开(公告)号:EP2738887B1
公开(公告)日:2019-05-22
申请号:EP13170626.9
申请日:2013-06-05
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公开(公告)号:EP2940460B1
公开(公告)日:2019-02-06
申请号:EP13869709.9
申请日:2013-10-31
发明人: KANG, Kejun , TANG, Chuanxiang , ZHAO, Ziran , ZHANG, Zhe
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公开(公告)号:EP3176809A4
公开(公告)日:2018-07-04
申请号:EP15827523
申请日:2015-07-29
申请人: HOSAKA TAKASHI
发明人: HOSAKA TAKASHI
IPC分类号: H01J49/00 , H01J49/32 , H01J49/38 , H01J49/42 , H05H5/03 , H05H7/04 , H05H7/22 , H05H9/00 , H05H13/04
CPC分类号: H01J49/06 , G01N27/62 , H01J49/0018 , H01J49/20 , H01J49/22 , H01J49/326 , H01J49/38 , H01J49/4205 , H01J49/4215 , H05H5/03 , H05H7/04 , H05H7/22 , H05H9/00 , H05H13/04
摘要: The objective of the present invention is to manufacture an acceleration device and a mass analysis device inexpensively and with a compact size, enabling them to be used by any person. The mass analysis device (300) is configured from a plurality of substrates, including a first main substrate (301), a first upper substrate (302) adhered to the upper surface of the first main substrate (301), and a first lower substrate (303) adhered to the lower surface of the first main substrate (301). A mass analysis chamber (308) is a passage formed in the first main substrate (301) and running from the upper surface of the first main substrate (301) to the lower surface of the first main substrate (301), and enclosed in the direction perpendicular to the substrate surfaces (the Z direction) by the upper substrate (302) and the lower substrate (303), enclosed on both sides in the direction (the direction X) which is orthogonal to the Z direction and is the direction of advance of charged particles (318) by first main substrate side plates (301-4, 301-5), and enclosed on both side surfaces in the direction (the Y direction) orthogonal to the Z direction and the X direction by the first main substrate (301). A center hole (310-4) is opened in the first main substrate side plate (301-4) to which the charged particles (318) are incident, and the charged particles (318) enter the mass analysis chamber (308) from the center hole (310-4) formed in the first main substrate side plate (301-4).
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公开(公告)号:EP3319404A1
公开(公告)日:2018-05-09
申请号:EP16817499.3
申请日:2016-02-18
发明人: HARA Hiroshi , SENNYU Katsuya
摘要: This superconducting accelerator comprises: an accelerating cavity that forms a space in which a charged particle beam is accelerated in a superconducting state; and a refrigerant vessel (11) that is disposed on the outer peripheral side of the acceleration cavity and in which a refrigerant for cooling the accelerating cavity is filled in a gap to the accelerating cavity. The superconducting accelerator further comprises a pair of pressing members (21) that are provided on the outer peripheral section of the refrigerant vessel (11) and are respectively provided to both end sections of the charged particle beam in the beam axis direction in the acceleration cavity or to both end sections in a direction orthogonal to the beam axis direction. The superconducting accelerator further comprises: a wire (22) that is continuously provided on the outer peripheral section of the refrigerant vessel (11) and that generates tension in a direction that brings the pair of pressing members (21) closer to each other; and a tension adjustment part (25) that adjusts the tension generated by the wire (22).
摘要翻译: 该超导加速器包括:加速腔,形成其中带电粒子束在超导状态下被加速的空间; 和配置在该加速空腔的外周侧的制冷剂容器(11),用于冷却该加速空腔的制冷剂填充到该加速空腔的间隙中。 超导加速器还包括设置在制冷剂容器(11)的外周部上的一对加压部件(21),该一对加压部件(21)分别设置在带电粒子束的束轴方向上的加速腔 或者在与光束轴方向正交的方向上连接到两端部分。 超导加速器还包括:线材(22),其连续地设置在制冷剂容器(11)的外周部上,并且使得一对按压部件(21)彼此靠近的方向产生张力; 和调整由所述线(22)产生的张力的张力调整部(25)。
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10.
公开(公告)号:EP3157630A4
公开(公告)日:2018-03-07
申请号:EP15810058
申请日:2015-06-19
CPC分类号: G16H40/40 , A61N5/1075 , A61N2005/1054 , G06F19/3412
摘要: The present invention is a method or system for acceptance testing and commissioning of a LINAC and treatment planning system (TPS). For a LINAC commissioning, the present invention collects reference data from a fully calibrated LINAC and compares the reference data with machine performance data collected from a testing LINAC. The compared results are analyzed to assess accuracy of the testing LINAC. For a TPS commissioning, the present invention collects standard reference data from standard treatment plans and standard input data and compares the standard reference data with results from standard tests that are performed by a testing treatment plan system. The compares results are analyzed to assess accuracy of the testing treatment plan system.
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