AUTOMATIC URINE MEASURING DEVICE
    1.
    发明公开

    公开(公告)号:EP4462119A1

    公开(公告)日:2024-11-13

    申请号:EP22859518.7

    申请日:2022-12-13

    IPC分类号: G01N33/493

    摘要: The invention relates to a urinary measuring device for taking and measuring urine samples, configured to be arranged in a urinary receptacle. The device is characterized in that it comprises: a) a funnel for sample collection, comprising a main opening; b) a urine collection unit connected to the opening for receiving the sample from the funnel; and c) a casing for electronics positioned close to the urine collection unit, the casing for electronics containing a light emitter arranged for emitting light on the urine collection unit and a sensor arranged for measuring the light received from the urine collection unit.

    METHOD AND APPARATUS FOR USING RADIATION IMAGING DATA TO ANALYZE COMPONENTS

    公开(公告)号:EP4462108A1

    公开(公告)日:2024-11-13

    申请号:EP24174187.5

    申请日:2024-05-03

    申请人: RTX Corporation

    IPC分类号: G01N23/2055

    摘要: An example system (10) for analyzing a component (12) includes a radiation source (14) configured to transmit an input radiation beam (16A) towards a component (12), at least a portion of the input radiation beam (16A) passing through the component (12) as an output beam pattern (20); a radiation detector (26) configured to detect the output beam pattern (20); and a beam adjustment device (18) disposed between the radiation source (14) and the component (12) and configured to modify a radiation intensity profile of the input radiation beam (16A), wherein the beam adjustment device (18) has an adjustable radiation transparency. A method of analyzing a component (12) is also disclosed, which includes transmitting an input radiation beam (16A) from a radiation source (14) towards a component (12), at least a portion of the input radiation beam (16A) passing through the component (12) as an output beam pattern (20); modifying a radiation intensity profile of the input radiation beam (16A) by passing the input radiation beam (16A) through a beam adjustment device (18) disposed between the radiation source (14) and the component (12), wherein the beam adjustment has an adjustable radiation transparency; and detecting the output beam pattern (20) at a radiation detector (26).

    ELECTROSTATIC PARTICLE SENSOR
    3.
    发明公开

    公开(公告)号:EP4462100A2

    公开(公告)日:2024-11-13

    申请号:EP24202373.7

    申请日:2017-01-16

    IPC分类号: G01N15/06

    摘要: The present disclosure is directed to a sensor assembly. The sensor assembly comprising at least one electrostatic sensor. The electrostatic sensor comprising an outer housing and an electrode configured at least partially within the outer housing. The electrode comprising a first end and a second end separated by a predetermined length, the first end secured within the outer housing and the second end comprising a sensing face that extends beyond an edge of the outer housing. Further, the electrode comprises a plurality of electrons configured to respond to one or more charged particles that flow past the sensing face by moving either towards or away from the second end, and an amplifier configured within the outer housing and electrically coupled to the electrode, the amplifier configured to detect a particle level flowing past the sensing face as a function of electron movement. A circuit board is electrically coupled to the sensor via a cable.

    INTEGRATED SAMPLE PROCESSING SYSTEM WITH MULTIPLE DETECTION CAPABILITY

    公开(公告)号:EP4411387A3

    公开(公告)日:2024-11-13

    申请号:EP24166653.6

    申请日:2018-05-22

    IPC分类号: H01J49/04 G01N33/68 G01N35/10

    摘要: A method performed by a sample processing system comprising an analyzer, a mass spectrometer, a sample introduction apparatus, and a control system, the control system operatively coupled to the analyzer, the mass spectrometer, and the sample introduction apparatus, the method comprising: performing, by the analyzer, a primary analysis of an analyte in a first processed sample aliquot derived from a first sample aliquot of a sample in a reaction vessel; determining, whether a concentration of analyte in the first processed sample aliquot is below, above, or equal to a predetermined threshold; transferring, by the sample introduction apparatus, a second processed sample aliquot derived from a second sample aliquot of the sample from the analyzer to the mass spectrometer; and performing, by the mass spectrometer, a secondary analysis of the analyte or another analyte in the second processed sample aliquot in a secondary analysis.

    ACOUSTIC WAVE MANIPULATION
    9.
    发明公开

    公开(公告)号:EP4366327A3

    公开(公告)日:2024-11-13

    申请号:EP23218313.7

    申请日:2018-02-09

    摘要: A device (20) for manipulating an incident acoustic wave to generate an acoustic output is described wherein the device comprises a plurality of unit cells arranged into an array, at least some of said unit cells being configured to introduce time delays to an incident acoustic wave at the respective positions of the unit cells within the array of unit cells, such that said plurality of unit cells define an array of time delays to thereby define a spatial delay distribution for manipulating an incident acoustic wave to generate an acoustic output (30). The array of time delays may be re-configured to vary the spatial delay distribution of the device in order to generate different acoustic outputs. Also described are methods for designing or configuring such devices.