ENERGY DEGRADER AND CHARGED-PARTICLE IRRADIATION SYSTEM PROVIDED WITH SAME
    1.
    发明公开
    ENERGY DEGRADER AND CHARGED-PARTICLE IRRADIATION SYSTEM PROVIDED WITH SAME 有权
    ENERGIEABSCHWÄCHER在ZUGEHÖRIGES系统ZUR BESTRAHLUNG GELADENER PARTIKEL

    公开(公告)号:EP2660825A1

    公开(公告)日:2013-11-06

    申请号:EP11835319.2

    申请日:2011-11-16

    发明人: UEDA Takamasa

    IPC分类号: G21K3/00 A61N5/10 G21K5/04

    摘要: There are provided an energy degrader that can adjust the amount of energy attenuation of charged particles and can adjust the increase in beam diameter of a charged-particle beam, and a charged particle irradiation system including the energy degrader. The energy degrader (10) includes an attenuation member (11), and attenuates energy by decelerating charged particles entering the attenuation member. The energy degrader includes energy adjustment drive means for driving the attenuation member 11 in a first axial direction X, and can adjust the amount of attenuated energy of the charged particles by changing the incident position of the charged particles on the first attenuation member. In addition, the energy degrader includes a beam diameter adjustment drive means for driving the attenuation member (11) in a second axial direction Y, and can adjust the increase in beam diameter by changing the position of the attenuation member 11 in a traveling direction of a charged-particle beam.

    摘要翻译: 提供了一种能够调节带电粒子的能量衰减量的能量降解器,并且可以调节带电粒子束的束直径的增加以及包括能量降解器的带电粒子照射系统。 能量降解器(10)包括衰减构件(11),并且通过使进入衰减构件的带电粒子减速来衰减能量。 能量降解器包括用于在第一轴向X上驱动衰减构件11的能量调节驱动装置,并且可以通过改变第一衰减构件上的带电粒子的入射位置来调节带电粒子的衰减能量的量。 此外,能量降解器包括用于沿第二轴向Y驱动衰减构件(11)的光束直径调节驱动装置,并且可以通过改变衰减构件11在行进方向上的位置来调节光束直径的增加 带电粒子束。

    REFLECTOR RACK, FABRICATION METHOD THEREOF, AND NARROW BAND X-RAY FILTER AND SYSTEM INCLUDING SAME
    3.
    发明公开
    REFLECTOR RACK, FABRICATION METHOD THEREOF, AND NARROW BAND X-RAY FILTER AND SYSTEM INCLUDING SAME 审中-公开
    反射器支架,方法和X射线,窄带滤光片和系统

    公开(公告)号:EP1882258A2

    公开(公告)日:2008-01-30

    申请号:EP06799918.5

    申请日:2006-05-19

    发明人: CHO, Yong Min

    IPC分类号: G21K3/00 F21V7/00

    摘要: A stackable rack may comprise: at least two rails, a cross-section of each rail having a shape resembling a staircase, first step portion of which represents a first surface upon which a reflector can be disposed; and a second step portion of which represents a second surface which can support another rail. A method of making a narrow band x-ray filter may comprise: providing a substrate; and stacking one or more reflection units in succession upon the substrate, each reflection unit including a rack (such as mentioned above) and a reflector held by the rack. An apparatus to produce a substantially narrow band x-ray beam may include such a filter. An apparatus to make an x-ray image of a subject may include: the apparatus to produce a substantially narrow band x-ray beam, e.g., as set forth above, and an x-ray detector arranged to receive the narrow band x-ray.

    X-RAY EXAMINATION APPARATUS INCLUDING AN X-RAY FILTER
    4.
    发明授权
    X-RAY EXAMINATION APPARATUS INCLUDING AN X-RAY FILTER 有权
    X射线测试装置含有X射线FILTER

    公开(公告)号:EP0998746B1

    公开(公告)日:2003-08-20

    申请号:EP99917032.7

    申请日:1999-05-14

    IPC分类号: G21K3/00

    摘要: The X-ray examination apparatus (1) comprises and X-ray source (2), an X-ray detector (5) and an X-ray filter (6) which is located between the X-ray source (2) and the X-ray detector (5). The X-ray filter (6) includes filter elements (7), notably capillary tubes, and the X-ray absorption of separate filter elements can be controlled by controlling a quantity of X-ray absorbing liquid (32) in the respective filter elements (7). The quantity of X-ray absorbing liquid in the individual filter elements is controlled by way of electric voltages applied to the individual filter elements. The filter elements (7) are formed as spaces between deformed foils (10) which are arranged in a stack which is expanded in the direction transversely of the foils. Adjacent foils are locally attached to one another along seams (30). The stack is arranged between rigid plates (11) and buffer elements (12) are provided between the rigid plates and the stack. The buffer elements are contractable in the direction transversely of the direction of expansion of the stack. The shape of the cross section of the capillary tubes is dependent on the ratio of the width of the seams to the spacing of the seams.

    X-RAY EXAMINATION APPARATUS INCLUDING AN X-RAY FILTER
    5.
    发明公开
    X-RAY EXAMINATION APPARATUS INCLUDING AN X-RAY FILTER 有权
    X射线测试装置含有X射线FILTER

    公开(公告)号:EP0998746A2

    公开(公告)日:2000-05-10

    申请号:EP99917032.7

    申请日:1999-05-14

    IPC分类号: G21K3/00

    摘要: The X-ray examination apparatus (1) comprises and X-ray source (2), an X-ray detector (5) and an X-ray filter (6) which is located between the X-ray source (2) and the X-ray detector (5). The X-ray filter (6) includes filter elements (7), notably capillary tubes, and the X-ray absorption of separate filter elements can be controlled by controlling a quantity of X-ray absorbing liquid (32) in the respective filter elements (7). The quantity of X-ray absorbing liquid in the individual filter elements is controlled by way of electric voltages applied to the individual filter elements. The filter elements (7) are formed as spaces between deformed foils (10) which are arranged in a stack which is expanded in the direction transversely of the foils. Adjacent foils are locally attached to one another along seams (30). The stack is arranged between rigid plates (11) and buffer elements (12) are provided between the rigid plates and the stack. The buffer elements are contractable in the direction transversely of the direction of expansion of the stack. The shape of the cross section of the capillary tubes is dependent on the ratio of the width of the seams to the spacing of the seams.

    X-RAY EXAMINATION APPARATUS COMPRISING A FILTER
    8.
    发明授权
    X-RAY EXAMINATION APPARATUS COMPRISING A FILTER 失效
    一个过滤含有X射线设备

    公开(公告)号:EP0786139B1

    公开(公告)日:1999-11-24

    申请号:EP96918818.4

    申请日:1996-07-10

    IPC分类号: G21K3/00

    CPC分类号: G21K1/10

    摘要: An X-ray examination apparatus in accordance with the invention comprises a filter (4) for limiting the dynamic range of an X-ray image which is formed on an X-ray detector (4) by irradiation of an object (3), for example a patient to be examined, by means of X-rays (15). The filter (4) comprises filter elements (5), being capillary tubes (5), one end of which communicates with an X-ray absorbing liquid. The adhesion of the X-ray absorbing liquid to the inner side of the capillary tubes is adjustable by means of an electric voltage which can be applied to an electrically conductive layer (36) provided on the inner side of the capillary tubes (5). The filling of the capillary tubes (5) with the X-ray absorbing liquid is adjusted on the basis of the period of time during which the electric voltage is applied. This period of time can be subdivided into a number of fractions and individual rows of capillary tubes are then filled with the X-ray absorbing liquid partly in parallel.