TARGET ASSEMBLY FOR AN X-RAY EMISSION APPARATUS AND X-RAY EMISSION APPARATUS

    公开(公告)号:EP3394876A1

    公开(公告)日:2018-10-31

    申请号:EP16820256.2

    申请日:2016-12-21

    Abstract: A target assembly for an x-ray emission apparatus is disclosed. The apparatus may comprise a vacuum chamber. The vacuum chamber may have at least one conductive wall. The apparatus may comprise an insulating element. The insulating element may project through the conductive wall. The apparatus may comprise a high voltage element. The high voltage element may extend along the insulating element. The high voltage element may extend from outside the chamber. The high voltage element may extend to an end portion of the insulating element furthest from the conductive wall. The apparatus may comprise an x-ray-generating target. The x-ray-generating target may be arranged at the end portion of the insulating element. The x-ray generating target may be electrically connected to the high voltage element. The apparatus may comprise a suppressive electrode. This suppressive electrode may be arranged at the end portion of the insulating element. This suppressive electrode may be configured to suppress acceleration towards the outer surface of the insulating element of electrons which are emitted from a junction between the outer surface of the insulating element and an inner surface of the conductive wall. An x-ray emission apparatus is also disclosed. The x-ray emission apparatus may comprise the target assembly. The apparatus may comprise an electron beam apparatus. The electron beam apparatus may be arranged to accelerate a beam of electrons towards an x-ray-generating target. The x-ray emission apparatus may thereby generate x-ray radiation.

    FOCUSING AN ELECTRON BEAM IN AN X-RAY SOURCE
    6.
    发明授权
    FOCUSING AN ELECTRON BEAM IN AN X-RAY SOURCE 有权
    聚焦在X射线源中的电子束

    公开(公告)号:EP3089192B1

    公开(公告)日:2018-05-09

    申请号:EP16175161.5

    申请日:2011-12-21

    Applicant: Excillum AB

    CPC classification number: H01J35/14 H01J35/08 H01J2235/082 H05G1/52

    Abstract: The invention provides a technique for indirectly measuring the degree of alignment of a beam in an electron-optical system comprising aligning means, focusing means and deflection means. To carry out the measurements, a simple sensor may be used, even a single-element sensor, provided it has a well-defined spatial extent. When practised in connection with an X-ray source which is operable to produce an X-ray target, the invention further proposes a technique for determining and controlling a width of an electronbeam at its intersection point with the target.

    LIMITING MIGRATION OF TARGET MATERIAL
    7.
    发明授权
    LIMITING MIGRATION OF TARGET MATERIAL 有权
    限制目标材料的迁移

    公开(公告)号:EP2862182B1

    公开(公告)日:2018-01-31

    申请号:EP12730852.6

    申请日:2012-06-14

    Applicant: Excillum AB

    Abstract: In an electron irradiation system, a gas-tight housing encloses a cathode region and an irradiation region, which communicate through at least an aperture. In the cathode region, there is arranged a high-voltage cathode for emitting an electron beam. In the irradiation region, there is an irradiation site arranged to accommodate a stationary or moving object to be irradiated. The migration of cathode-degrading debris is limited by means of an electric field designed to prevent positively charged particles from entering the cathode region via the aperture. The invention can be embodied with an axial electric field, which realizes an energy threshold, or a transversal field which deflects charged particles away from trajectories leading into the cathode region.

    ELECTRONIC FOCAL SPOT ALIGNMENT OF AN X-RAY TUBE
    8.
    发明公开
    ELECTRONIC FOCAL SPOT ALIGNMENT OF AN X-RAY TUBE 审中-公开
    X射线管的电子焦点对准

    公开(公告)号:EP3240011A1

    公开(公告)日:2017-11-01

    申请号:EP17168100.0

    申请日:2017-04-26

    Abstract: Technology is described for electronically aligning a central ray 352 of an x-ray tube 210 to a radiation detector 240. In an example, an x-ray system includes an x-ray tube and a tube control unit (TCU). The x-ray tube includes a cathode that includes an electron emitter configured to emit an electron beam, an anode configured to receive the electron beam and generate x-rays with a central ray from electrons of the electron beam colliding on a focal spot of the anode, and a steering magnetic multipole between the cathode and the anode that is configured to produce a steering magnetic field from a steering signal. At least two poles of the steering magnetic multipole are on opposite sides of the electron beam. The TCU includes at least one steering driver configured to generate the steering signal. The TCU is configured to convert an offset value to the steering signal.

    Abstract translation: 描述了用于将X射线管210的中心射线352与辐射检测器240电子对准的技术。在一个示例中,X射线系统包括X射线管和管控制单元(TCU)。 所述X射线管包括阴极,所述阴极包括被配置为发射电子束的电子发射器,被配置为接收所述电子束并且产生具有来自所述电子束的电子的中心射线的X射线,所述电子束在所述 以及在阴极和阳极之间的转向磁性多极,其被配置为从转向信号产生转向磁场。 转向磁性多极的至少两个极位于电子束的相对侧。 TCU包括至少一个被配置为产生转向信号的转向驱动器。 TCU被配置为将偏移值转换为转向信号。

    X-RAY ABSORPTION MEASUREMENT SYSTEM
    9.
    发明公开
    X-RAY ABSORPTION MEASUREMENT SYSTEM 有权
    X射线吸收测量系统

    公开(公告)号:EP3152554A1

    公开(公告)日:2017-04-12

    申请号:EP15803316.7

    申请日:2015-03-03

    Applicant: Sigray Inc.

    Abstract: This disclosure presents systems for x-ray absorption fine structure (XAFS) measurements that have x-ray flux and flux density several orders of magnitude greater than existing compact systems; for applications of x-ray absorption near-edge spectroscopy (XANES) or extended x-ray fine absorption structure (EXFAS) spectroscopy. The higher brightness is achieved using designs for x-ray targets that comprise aligned microstructures of x-ray generating materials fabricated in close thermal contact with a substrate having high thermal conductivity. This allows for bombardment with higher electron density and/or higher energy electrons, leading to greater x-ray brightness and high flux. The high brightness x-ray source is coupled to an x-ray reflecting optical system to collimate the x-rays, and a monochromator, which selects the exposure energy. Absorption spectra of samples using the high flux monochromatic x-rays can be made using standard detection techniques.

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