Abstract:
PROBLEM TO BE SOLVED: To provide a system for generating a ribbon ion beam having desired energy and high-grade profile uniformity.SOLUTION: An ion implantation system 10 comprises: an ion source 12 generating a ribbon ion beam 8; and at least one correction device 42 for adjusting a current density along a longitudinal dimension of the ion beam 8 in such a manner that a current density profile exhibits desired uniformity. The ion implantation system 10 may also include other elements such as an analysis magnet 20, an electrostatic deflector 52 and a convergent lens 48 for shaping the ion beam 8, guiding the ion beam to an end station 24 and making the ion beam incident to a substrate 26. In some embodiments, a nominally one-dimensional ribbon beam 8 having a longitudinal dimension larger than a diameter of the substrate is generated, such that ions can be implanted into the substrate while having high-grade longitudinal profile uniformity.
Abstract:
PROBLEM TO BE SOLVED: To provide an improved ion source capable of creating a relatively uniform ion beam profile.SOLUTION: An ion source includes at least one electron gun 104. The electron gun 104 includes an electron source 302 generating a beam 308 of electrons and an inlet 312 receiving gas. The electron gun 104 also includes a plasma region defined by at least an anode 304 and a grounding element 306, and the plasma region is capable of generating plasma 310 from the gas received via the inlet 312. The plasma 310 is maintained by at least a portion of the beam 308 of electrons. The electron gun 104 further includes an outlet 312 for taking out at least either (i) ions created by the plasma 310 or (ii) at least a portion of the beam 308 of electrons created by the electron source 302.
Abstract:
PROBLEM TO BE SOLVED: To provide an improved ion source capable of creating a relatively uniform ion beam profile.SOLUTION: A ion source comprises an ionization chamber 102 and two magnetic field sources 502. The ionization chamber 102 has a longitudinal axis extending through the chamber and includes two opposing chamber walls 504, and the chamber walls 504 are parallel to the longitudinal axis. Each of the two magnetic field sources 502 includes (i) a core and (ii) a coil substantially wound around the core. The magnetic field sources 502 are disposed along an outer surface of each of the opposing chamber walls 504 and proximately to each other, and directed substantially in parallel with the longitudinal axis. The cores of the magnetic field sources 502 are physically separated and electrically insulated from each other.