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    Photometric system
    73.
    发明专利
    Photometric system 有权
    光学系统

    公开(公告)号：JP2011137789A

    公开(公告)日：2011-07-14

    申请号：JP2010000259

    申请日：2010-01-04

    Applicant: Hioki Ee Corp ,  日置電機株式会社

    Inventor： NARISAWA FUMIO ,  MARUYAMA TOMOYUKI

    IPC: G01J3/36 ,  G01J1/00 ,  G01J3/50 ,  G01M11/00

    Abstract: PROBLEM TO BE SOLVED: To provide a photometric system for separating light from a light source for detection, capable of reducing a measurement error in leading the light through bundled optical fibers to an integrating sphere. SOLUTION: The photometric system 100 includes the integrating sphere 1, an optical fiber bundle cable 2, and a photodetector 30. Edges of a plurality of optical fiber strands 21 at a first end 22 disposed adjacently to an incident aperture 12 of the integrating sphere 1 of the optical fiber bundle cable 2 are arranged to be long in one direction along a first axial direction. A plurality of photoelectric conversion elements of the photodetector 30 are arranged to be long in one direction along a second axial direction. When a plane orthogonal to a plane containing an emitting aperture 13 of the integrating sphere 1 and parallel to the second axial direction is a reference plane, the first end 22 of the optical fiber bundle cable 2 is disposed adjacently to the incident aperture 12 to have the first axial direction crossing the reference plane. COPYRIGHT: (C)2011,JPO&INPIT

    Abstract translation: 要解决的问题：提供一种用于从用于检测的光源分离光的光度系统，其能够减少将通过束状光纤引导到积分球的测量误差。 光度系统100包括积分球1，光纤束电缆2和光电检测器30.在第一端22处与多个光纤束21的入射孔12相邻设置的多个光纤线21的边缘 光纤束电缆2的积分球1沿着第一轴向沿一个方向布置成长。 光电检测器30的多个光电转换元件沿着第二轴向在一个方向上布置成长。 当与包含积分球1的发射孔13并平行于第二轴向方向的平面正交的平面是参考平面时，光纤束电缆2的第一端22邻近入射孔12设置以具有 第一轴向方向与参考平面交叉。 版权所有（C）2011，JPO＆INPIT

    Method and circuit for self-calibration control device
    74.
    发明专利
    Method and circuit for self-calibration control device 审中-公开

    公开(公告)号：JP2011519169A

    公开(公告)日：2011-06-30

    申请号：JP2011506507

    申请日：2009-06-24

    Applicant: アトメル・コーポレイションAtmel Corporation

    Inventor： サント、ヘンドリック ,  ダーヤグド、トゥスハー

    IPC: H01L33/00 ,  G01J1/00 ,  G01M11/00 ,  H05B37/02

    CPC classification number: H05B33/0866 ,  G09G3/342

    Abstract: 本発明は１以上のＬＥＤまたはＬＥＤドライバを制御する回路及び方法に関する。 回路は１以上の検出器に結合されたプログラム可能な分散された制御装置を具備し、１以上の検出器は１以上のＬＥＤまたはＬＥＤドライバの１以上の測定可能なパラメータを検出するように構成されている。 制御装置は１以上の測定可能なパラメータに関する情報を１以上の検出器から受信するように構成されている。 制御装置は、ＬＥＤまたはＬＥＤドライバのうちの１つの１以上の測定可能なパラメータが基準条件を満たすことを１以上の検出器が示すまで、１以上の制御可能なパラメータを調節するようにも構成されている。 制御装置は、１以上の制御可能なパラメータが基準条件が満たされた制御可能なパラメータの値に関する値において動作するよう設定するように構成されている。
    【選択図】図５

    Accelerated particle and high energy radiation sensor
    77.
    发明专利
    Accelerated particle and high energy radiation sensor 有权
    加速颗粒和高能辐射传感器

    公开(公告)号：JP2011017722A

    公开(公告)日：2011-01-27

    申请号：JP2010218034

    申请日：2010-09-29

    Applicant: Science & Technology Facilities Council ,  ザ サイエンス アンド テクノロジー ファシリティーズ カウンシルThe Science And Technology Facilities Council

    Inventor： TURCHETTA RENATO ANDREA DANILO ,  VILLANI GIULIO ENRICO ,  PRYDDERCH MARK LYNDON

    IPC: G01T1/24 ,  G01J1/00 ,  H01J37/244 ,  H01L27/146 ,  H01L31/09

    CPC classification number: H01L27/14601 ,  H01J2237/2446 ,  H01L27/14643 ,  H01L27/14659

    Abstract: PROBLEM TO BE SOLVED: To provide a monolithic sensor which is capable of withstanding incident accelerated particles and high energy radiation.SOLUTION: An accelerated electron detector includes an array of monolithic sensors in a CMOS structure, each sensor including a substrate (10), an epi layer (11), a p+ well (12) and n+ wells (13) which are separated from the p+ well (12) by the epi layer (11). Integrated in the p+ well are a plurality of NMOS transistors. The sensor also includes a deep n region (15) beneath the p+ well (12) which establishes within the epi layer a depletion layer so that carriers generated in the epi layer are caused to drift to the n+ well (13) on application of a biasing voltage charge. The detector has improved radiation hardness and it therefore suitable for the detection and imaging of accelerated electrons such as in electron microscopes.

    Abstract translation: 要解决的问题：提供能够承受入射的加速颗粒和高能量辐射的单片传感器。解决方案：加速电子检测器包括CMOS结构中的单片传感器阵列，每个传感器包括基板（10）， 外延层（11），p +阱（12）和n +阱（13），其由外延层（11）与p +阱（12）分离。 集成在p +阱中的是多个NMOS晶体管。 传感器还包括在p +阱（12）下面的深n区（15），其在外延层内建立耗尽层，使得在外延层中产生的载流子在施加时产生漂移到n +阱（13） 偏置电压充电。 检测器具有改善的辐射硬度，因此适用于加速电子的检测和成像，如电子显微镜。

    Photodetector used for testing led
    79.
    发明专利
    Photodetector used for testing led 审中-公开
    用于测试LED的光电二极管

    公开(公告)号：JP2010249718A

    公开(公告)日：2010-11-04

    申请号：JP2009100702

    申请日：2009-04-17

    Applicant: Micronics Japan Co Ltd ,  株式会社日本マイクロニクス

    Inventor： WASHIO KENICHI ,  HASEGAWA MASASHI

    IPC: G01J1/00 ,  G01M11/00 ,  H01L33/00

    Abstract: PROBLEM TO BE SOLVED: To test a plenty of LEDs in several times without complexing and increasing a price of an apparatus, thereby reducing a time and labor required for testing.
    SOLUTION: A photodetector for LEDs includes a support having a top surface and a bottom surface respectively penetrating the support in a vertical direction, and provided with a plurality of light passages allowing light emitted by the LEDs to enter from the downside and advance to the upside; a wiring board disposed above the support and having a plurality of internal wiring; and a plurality of photoreceptors disposed below the wiring board to receive light advancing through the light passages and generate an electric signal, and electrically connected to the internal wiring. The plurality of light passages and the plurality of photoreceptors are disposed at least in one row in the same direction at the same pitches.
    COPYRIGHT: (C)2011,JPO&INPIT

    Abstract translation: 要解决的问题：多次测试大量LED，而不会使设备的价格变得复杂并增加，从而减少了测试所需的时间和人力。 解决方案：用于LED的光电检测器包括具有分别在垂直方向上穿透支撑件的顶表面和底表面的支撑件，并且设置有多个光通道，其允许由LED发射的光从下侧进入并提前 向上 布线板，其布置在所述支撑件上方并且具有多个内部布线; 以及多个感光体，其设置在所述布线板的下方，以接收通过所述光通路的光，并产生电信号，并且电连接到所述内部布线。 多个光通道和多个感光体以相同的间距在相同的方向上至少布置成一行。 版权所有（C）2011，JPO＆INPIT

    Thermal image sensor
    80.
    发明专利
    Thermal image sensor 审中-公开
    热图像传感器

    公开(公告)号：JP2010185704A

    公开(公告)日：2010-08-26

    申请号：JP2009028660

    申请日：2009-02-10

    Applicant: Chino Corp ,  Yamagata-Chino Corp ,  株式会社チノー ,  株式会社山形チノー

    Inventor： YAMAZAWA HIROYUKI ,  SUZUKI YUKIHISA ,  KADOWAKI YOSHINORI ,  GOTO HIDEO

    IPC: G01V8/10 ,  G01J1/00 ,  G01J1/02 ,  G01J5/00 ,  G01J5/48 ,  G08B13/191

    Abstract: PROBLEM TO BE SOLVED: To provide a thermal image sensor which obtains only desired thermal image data in a stand-alone state, and also stores the thermal image data in a sensor body. SOLUTION: The dose of infrared radiations in a monitoring area is detected by an infrared detecting part 11. Infrared detection information based on the detected amount of infrared radiations is compared with a threshold for abnormality discrimination stored in a storage part 13 and thereby it is determined whether or not any abnormality arises in the monitoring area. When the abnormality is determined to arise, the thermal image data prepared on the basis of the infrared detection information and image processing information at this time are stored in a thermal image data storage area 13a of the storage part 13. COPYRIGHT: (C)2010,JPO&INPIT

    Abstract translation: 要解决的问题：提供一种在独立状态下仅获得期望的热图像数据的热图像传感器，并且还将热图像数据存储在传感器主体中。 解决方案：通过红外检测部分11检测监视区域中的红外辐射的剂量。将基于检测到的红外辐射量的红外检测信息与存储在存储部分13中的异常判别阈值进行比较，从而 确定监视区域是否发生异常。 当确定出现异常时，基于红外检测信息准备的热图像数据和此时的图像处理信息被存储在存储部分13的热图像数据存储区域13a中。（COPYRIGHT：（ C）2010，JPO＆INPIT

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