Wave surface measurement device and wave surface measurement method, and object measurement device
    1.
    发明专利
    Wave surface measurement device and wave surface measurement method, and object measurement device 审中-公开
    波形表面测量装置和波面测量方法以及对象测量装置

    公开(公告)号:JP2013007740A

    公开(公告)日:2013-01-10

    申请号:JP2012084441

    申请日:2012-04-03

    摘要: PROBLEM TO BE SOLVED: To provide a wave surface measurement device whose resolution of a wave surface is improved.SOLUTION: A wave surface measurement device has: a detection section 3 which detects a signal regarding electric field strength of an electromagnetic wave pulse 1; a delay optical section which delays the electromagnetic wave pulse which reaches the detection section so as to include a first propagation path and a second propagation path with length different from that of the first propagation path in an area different from the first propagation path as propagation paths of the electromagnetic wave pulse; a waveform constitution section 4a which constitutes time waveform of the electromagnetic wave pulse by using the signal regarding the electric field strength detected by the detection section; and a wave surface acquisition section 4b which acquires the wave surface of the electromagnetic wave pulse on the basis of the time waveform of the electromagnetic wave pulse and information regarding the length of the first and second propagation paths in the delay optical section.

    摘要翻译: 要解决的问题:提供一种提高波面分辨率的波面测量装置。 解决方案:波面测量装置具有:检测部分3,其检测与电磁波脉冲1有关的电场强度的信号; 延迟光学部件,延迟到达检测部分的电磁波脉冲,以便包括与第一传播路径不同的第一传播路径的长度不同于第一传播路径的第一传播路径和第二传播路径作为传播路径 的电磁波脉冲; 波形构成部4a,其通过使用由检测部检测出的电场强度的信号构成电磁波脉冲的时间波形; 以及基于电磁波脉冲的时间波形获取电磁波脉冲的波面的波面取得部4b以及与延迟光学部中的第一和第二传播路径的长度有关的信息。 版权所有(C)2013,JPO&INPIT

    Terahertz wave generating element, terahertz wave detecting element, terahertz wave generator, terahertz wave detector, terahertz wave measuring instrument, and terahertz wave tomographic imaging apparatus
    2.
    发明专利
    Terahertz wave generating element, terahertz wave detecting element, terahertz wave generator, terahertz wave detector, terahertz wave measuring instrument, and terahertz wave tomographic imaging apparatus 审中-公开
    TERAHERTZ波形发生元件,TERAHERTZ波检测元件,TERAHERTZ波形发生器,TERAHERTZ波检测器,TERAHERTZ波形测量仪器和TERAHERTZ波形图像成像设备

    公开(公告)号:JP2012053450A

    公开(公告)日:2012-03-15

    申请号:JP2011152377

    申请日:2011-07-08

    发明人: ITSUJI TAKEAKI

    IPC分类号: G02F1/39

    摘要: PROBLEM TO BE SOLVED: To provide a terahertz wave generating element and the like which are capable of generating a terahertz wave with a comparatively high intensity by taking out terahertz waves generated from a plurality of positions with equiphase surfaces approximately superposed one over the other.SOLUTION: A terahertz wave is generated using terahertz waves generated in first and second optical waveguides (100) and (200) including an electro-optic crystal. In a generation position of the first optical waveguide where a second terahertz wave (9) is generated by exciting light (10), arrival at the generation position of a first terahertz wave (8) generated in the second optical waveguide by exciting light and generation of the second terahertz wave (9) in the generation position are approximately synchronized with each other. Therefore, a first equiphase surface (13) of the first terahertz wave and a second equiphase surface (14) of the second terahertz wave are approximately superposed one over the other.

    摘要翻译: 要解决的问题:为了提供一种能够通过从多个位置产生的太赫兹波来产生具有相当高的强度的太赫兹波的太赫兹波发生元件,其中相位表面近似地叠加在 其他。 解决方案:使用在包括电光晶体的第一和第二光波导(100)和(200)中产生的太赫兹波来产生太赫兹波。 在通过激发光(10)产生第二太赫波(9)的第一光波导的产生位置中,到达通过激发光并产生在第二光波导中产生的第一太赫波(8)的产生位置 在第二个太赫兹波(9)的发生位置近似同步。 因此,第一太赫兹波的第一同相表面(13)和第二太赫兹波的第二同相表面(14)彼此大致重叠。 版权所有(C)2012,JPO&INPIT

    Analyzing apparatus
    3.
    发明专利
    Analyzing apparatus 有权
    分析装置

    公开(公告)号:JP2010190887A

    公开(公告)日:2010-09-02

    申请号:JP2009288818

    申请日:2009-12-21

    发明人: ITSUJI TAKEAKI

    CPC分类号: G01N21/3586

    摘要: PROBLEM TO BE SOLVED: To selectively detect terahertz waves from an optional position of an object from among terahertz waves from the object. SOLUTION: An analyzing apparatus includes: a first optical section 111 for condensing terahertz waves generated by a generation section 101 at a first position 121 in an object 107; a second optical section 112 for condensing terahertz waves from the object 107 at a second position 122; a third optical section 113 for condensing terahertz waves condensed at the second position 122 at a third position 123; and a detection section 102 for detecting terahertz waves condensed at the third position 123. The analyzing apparatus selectively detects terahertz waves from the first position 121 in the object 107 from among terahertz waves from the object 107. COPYRIGHT: (C)2010,JPO&INPIT

    摘要翻译: 要解决的问题:从来自物体的太赫兹波中的对象的可选位置选择性地检测太赫兹波。 解决方案:分析装置包括:第一光学部分111,用于在对象107中的第一位置121处聚集由生成部分101产生的太赫兹波; 用于在第二位置122处聚集来自对象107的太赫兹波的第二光学部分112; 用于在第三位置123处将在第二位置122处聚光的太赫兹波聚合的第三光学部分113; 以及用于检测在第三位置123处聚合的太赫兹波的检测部分102.分析装置从对象107的太赫兹波中选择性地从对象107中的第一位置121检测太赫兹波。(C)2010 ,JPO&INPIT

    Inspection apparatus and inspection method using electromagnetic wave
    4.
    发明专利
    Inspection apparatus and inspection method using electromagnetic wave 有权
    使用电磁波的检查装置和检查方法

    公开(公告)号:JP2009150873A

    公开(公告)日:2009-07-09

    申请号:JP2008288815

    申请日:2008-11-11

    IPC分类号: G01N21/35 G01N21/3586

    CPC分类号: G01N21/3586 G01N21/7703

    摘要: PROBLEM TO BE SOLVED: To provide an apparatus for acquiring information on a time waveform of a terahertz wave by performing terahertz time domain spectroscopy by a method different from a conventional art. SOLUTION: This apparatus has a delay unit 14 for changing the time after the terahertz wave is generated in the generating unit 11 until it is detected as waveform information of the terahertz wave in the detecting unit 12, wherein the delay unit 14 is configured so as to change a propagating distance of the terahertz wave generated by the generating unit 11, and associates waveform information of the terahertz wave, which is detected in the detecting unit 12, and the propagating distance every terahertz wave generated by the generating unit 11. COPYRIGHT: (C)2009,JPO&INPIT

    摘要翻译: 要解决的问题:提供一种用于通过不同于传统技术的方法通过执行太赫兹时域光谱来获取关于太赫兹波的时间波形的信息的装置。 解决方案:该装置具有延迟单元14,用于在生成单元11中产生太赫兹波之后改变时间,直到其被检测为检测单元12中的太赫兹波的波形信息,其中延迟单元14是 被配置为改变由发生单元11产生的太赫兹波的传播距离,并且将在检测单元12中检测到的太赫兹波的波形信息与由发生单元11产生的每太赫兹波的传播距离相关联 版权所有(C)2009,JPO&INPIT

    Image forming apparatus and image forming method
    5.
    发明专利
    Image forming apparatus and image forming method 有权
    图像形成装置和图像形成方法

    公开(公告)号:JP2008249695A

    公开(公告)日:2008-10-16

    申请号:JP2008045941

    申请日:2008-02-27

    CPC分类号: G01V8/005

    摘要: PROBLEM TO BE SOLVED: To provide an image forming apparatus which makes the improvement of S/N ratio and the reduction of the time required to form an image feasible. SOLUTION: The image forming apparatus includes an electromagnetic wave radiation means 405, an electromagnetic wave detection means 406, a drive means 403, a periodical signal generation means 411 for generating periodical signals 413, a memory means 416, processing means 414,415 and an image forming means 420. The drive means 403 changes periodically the relative positional relationship between an object 401 and the radiating part of the electromagnetic wave radiation means 406. The electromagnetic wave detection means 406 acquires electromagnetic waves from the object 401 as a time-series detection signal 412. The processing means 414,415 perform calculation using the time-series detection signal 412 and the periodical signals 413, and make the memory means 416 store. The image forming means 420 forms an image of the object from the information stored in the memory means 416. COPYRIGHT: (C)2009,JPO&INPIT

    摘要翻译: 要解决的问题:提供一种使提高S / N比并减少形成图像所需的时间成为可能的图像形成装置。 解决方案:图像形成装置包括电磁波辐射装置405,电磁波检测装置406,驱动装置403,用于产生周期信号413的周期信号产生装置411,存储装置416,处理装置414,415和 图像形成装置420.驱动装置403周期性地改变物体401和电磁波辐射装置406的辐射部分之间的相对位置关系。电磁波检测装置406从时间序列获取来自物体401的电磁波 检测信号412.处理装置414,415使用时间序列检测信号412和周期信号413进行计算,并使存储装置416存储。 图像形成装置420根据存储在存储装置416中的信息形成对象的图像。版权所有(C)2009,JPO&INPIT

    Planar antenna
    6.
    发明专利
    Planar antenna 审中-公开
    平面天线

    公开(公告)号:JP2006121643A

    公开(公告)日:2006-05-11

    申请号:JP2005077213

    申请日:2005-03-17

    发明人: ITSUJI TAKEAKI

    CPC分类号: H01Q9/28

    摘要: PROBLEM TO BE SOLVED: To provide a planar antenna having a configuration which can carry out matching of an antenna part and a transmission line over the frequency range of a planar type, while at the same time, extending over a comparative wide band.
    SOLUTION: The planar antenna consists of a planar antenna part 101 disposed on a dielectric substrate, and a transmission line 102 making electromagnetic waves propagate to or from the planar antenna part 101. The transmission line 102 includes at least a first conductor 104, and a second conductor 103 which extend overlapping each other. The first conductor 104 has a tapered region 105, in which the distance between the edge part and the second conductor 103, increases substantially monotonically, when approaching the planar antenna part 101 near the connection part to the planar antenna part 101.
    COPYRIGHT: (C)2006,JPO&NCIPI

    摘要翻译: 要解决的问题:为了提供一种具有能够在平面型的频率范围上进行天线部分和传输线的匹配的配置的平面天线,同时延伸到比较的宽带 。 平面天线由设置在电介质基板上的平面天线部101和使电磁波向平面天线部101传播的传输线102构成。传输线102至少包括第一导体104 ,以及彼此重叠的第二导体103。 第一导体104具有锥形区域105,当与平面天线部件101的连接部分附近接近平面天线部分101时,边缘部分和第二导体103之间的距离基本上单调地增加。 (C)2006,JPO&NCIPI

    Optical semiconductor device and its manufacturing method
    7.
    发明专利
    Optical semiconductor device and its manufacturing method 有权
    光学半导体器件及其制造方法

    公开(公告)号:JP2006066864A

    公开(公告)日:2006-03-09

    申请号:JP2005025210

    申请日:2005-02-01

    IPC分类号: H01S1/02 G01N22/00 H01Q1/38

    摘要: PROBLEM TO BE SOLVED: To solve the problem, wherein conventionally, the performance of carriers excited by laser beams has not been controlled efficiently due to the internal electric field in an optical semiconductor film having not been uniform.
    SOLUTION: The present invention is provided with an optical semiconductor film, having photoconductivity and a pair of electrodes for applying an electric field on the inside of the semiconductor film in a direction substantially perpendicular to the inside of the film. There is provided an optical semiconductor device for generating electromagnetic waves from the optical semiconductor film due to the movement of the carriers generated in the semiconductor film by the absorption of light into the region to which the electric field is applied.
    COPYRIGHT: (C)2006,JPO&NCIPI

    摘要翻译: 解决的问题为了解决这个问题,由于光半导体膜的内部电场不均匀,以往由激光束激发的载流子的性能没有得到有效的控制。 解决方案:本发明提供一种具有光导电性的光学半导体膜和用于在基本上垂直于膜内侧的方向上在半导体膜的内部施加电场的一对电极。 提供了一种用于由于通过将光吸收到施加电场的区域中在半导体膜中产生的载流子的移动而从光学半导体膜产生电磁波的光学半导体器件。 版权所有(C)2006,JPO&NCIPI

    Tactile sense exhibition device and drive method therefor
    8.
    发明专利
    Tactile sense exhibition device and drive method therefor 审中-公开
    战术感觉设备及其驱动方法

    公开(公告)号:JP2005085048A

    公开(公告)日:2005-03-31

    申请号:JP2003317500

    申请日:2003-09-09

    发明人: ITSUJI TAKEAKI

    IPC分类号: G09B21/00 G06F3/00 G06F3/01

    摘要: PROBLEM TO BE SOLVED: To provide a tactile sense exhibition device and a drive method for the tactile sense exhibition device, which cope with increase of the number of electrodes of a tactile sense exhibition part with a small number of drivers. SOLUTION: A contact position detection part 102 detects a contact position of a skin surface and the tactile sense exhibition part 101 exhibiting tactile sense information to the skin surface by applying an electric signal to the skin surface, while a contact position monitor part 103 determines a tactile sense information exhibition area of the tactile sense exhibition part 101 applying the electric signal, on the basis of contact position information of the contact position detection part 102. A selection part 104 is provided between the contact position monitor part 103 and an electric signal generation part 105 generating the electric signal applied to the tactile sense information exhibition area, and the selection part 104 selectively applies the electric signal from the electric signal generation part 105 to the tactile sense information exhibition area determined by the contact position monitor part. COPYRIGHT: (C)2005,JPO&NCIPI

    摘要翻译: 要解决的问题:提供一种用于触觉展示装置的触觉展示装置和驱动方法,其可以应对具有少量驱动程序的触觉展示部分的电极数量的增加。 解决方案:接触位置检测部分102通过向皮肤表面施加电信号来检测皮肤表面和触觉感觉信息的触觉感觉信息的接触位置到皮肤表面,同时接触位置监测部分 103根据接触位置检测部102的接触位置信息,判定触觉检测部101施加电信号的触觉信息展示区域。选择部104设置在接触位置监视部103和 电信号生成部105生成施加到触觉信息展示区域的电信号,选择部104选择性地将来自电信号生成部105的电信号应用于由接触位置监视部确定的触觉信息显示区域。 版权所有(C)2005,JPO&NCIPI

    Measuring device using terahertz wave
    9.
    发明专利
    Measuring device using terahertz wave 有权
    使用TERAHERTZ波的测量装置

    公开(公告)号:JP2010169541A

    公开(公告)日:2010-08-05

    申请号:JP2009012454

    申请日:2009-01-23

    发明人: ITSUJI TAKEAKI

    IPC分类号: G01N21/35 G01N21/3586

    CPC分类号: G01J3/42

    摘要: PROBLEM TO BE SOLVED: To reduce measurement time by lowering a noise floor when measuring terahertz waves. SOLUTION: A terahertz wave measuring device for acquiring a time waveform of a terahertz wave pulse T1 by time domain spectroscopy includes a detection section 109, a minute signal detection section 103, and an integral section 104. The minute signal detection section 103 has a time constant τ and detects a signal component of a frequency fs from a signal from the detection section 109. The integral section 104 is connected to the output stage of the minute signal detection section 103, and the time constant is not more than the time constant τ and is larger than 1/(2fs). COPYRIGHT: (C)2010,JPO&INPIT

    摘要翻译: 要解决的问题:通过在测量太赫兹波时降低噪声基准来减少测量时间。 解决方案:用于通过时域光谱获取太赫兹波脉冲T1的时间波形的太赫兹波测量装置包括检测部分109,微小信号检测部分103和积分部分104.微小信号检测部分103 具有时间常数τ,并根据来自检测部分109的信号检测频率fs的信号分量。积分部分104连接到分数信号检测部分103的输出级,时间常数不大于 时间常数τ大于1 /(2fs)。 版权所有(C)2010,JPO&INPIT

    Terahertz wave optical element and device using the same
    10.
    发明专利
    Terahertz wave optical element and device using the same 有权
    TERAHERTZ波光学元件和使用它的设备

    公开(公告)号:JP2010050399A

    公开(公告)日:2010-03-04

    申请号:JP2008215549

    申请日:2008-08-25

    发明人: ITSUJI TAKEAKI

    IPC分类号: H01S1/02 H01Q13/08

    CPC分类号: H01Q9/005 H01S1/02

    摘要: PROBLEM TO BE SOLVED: To provide an element capable of simplifying a process adjusting an angle of incidence of excitation light regarding a terahertz wave optical element, in a form of applying electric field in the thickness direction of a carrier-generating section.
    SOLUTION: The terahertz wave optical element which is available as a terahertz wave generating element, or the like, has an optical switch section 106 which steeply generates carriers by the irradiation of the excitation light and a first electrode section 103 and a second electrode section 104, interposing the optical switch section 106, which are arranged opposite to apply the electric field in the thickness direction of the optical switch section 106. The first electrode section 103 has an antenna section 105, having an antenna function for distributing carriers generated, by the irradiation of the excitation light in the direction crossing with the applying direction of the electric field in at least one part.
    COPYRIGHT: (C)2010,JPO&INPIT

    摘要翻译: 要解决的问题:提供一种能够简化在载流子产生部分的厚度方向上施加电场的方法来调节关于太赫兹波长光学元件的激发光的入射角的处理的元件。 解决方案:作为太赫兹波发生元件等可用的太赫波光学元件具有通过激发光的照射陡峭地产生载流子的光开关部分106和第一电极部分103和第二电极部分103。 电极部分104,插入光开关部分106,其相对设置在光开关部分106的厚度方向上施加电场。第一电极部分103具有天线部分105,其具有用于分配载体的天线功能 通过在至少一部分中沿与电场的施加方向交叉的方向照射激发光。 版权所有(C)2010,JPO&INPIT