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公开(公告)号:US20090053401A1
公开(公告)日:2009-02-26
申请号:US11895454
申请日:2007-08-24
IPC分类号: B05D5/12
CPC分类号: C23C14/0617 , H01L41/319 , H03H3/02 , H03H9/175 , H03H2003/025
摘要: Piezoelectric deposition for BAW resonators wherein a thin amorphous layer of AlN over the bottom electrode before depositing a second layer of AlN over the amorphous layer of AlN, the depositing occurring at a temperature allowing the deposited AlN to self-organize into a desired columnar phase. The bottom electrode may have acoustic isolation thereunder, such as a Bragg mirror. Various details of the fabrication process are disclosed.
摘要翻译: 用于BAW谐振器的压电沉积,其中在在AlN的非晶层上沉积第二AlN层之前,在底电极上方形成薄的非晶层AlN,沉积在允许沉积的AlN自组织成所需柱状相的温度下发生。 底部电极可以在其下方具有声学隔离,例如布拉格反射镜。 公开了制造工艺的各种细节。