Stop seal for application of high temperature and high pressure

    公开(公告)号:US11873905B2

    公开(公告)日:2024-01-16

    申请号:US17783150

    申请日:2019-12-31

    CPC classification number: F16J15/54 F04D29/12

    Abstract: A stop seal for application of high temperature and high pressure is disclosed. A stop seal contains a first seal member and a second seal member, wherein the stop seal can prevent a fluid of high temperature and high pressure from leaking into an atmospheric space because, when the fluid of high temperature is introduced and the first seal member is moved toward a direction adjacent to a pump shaft, an opposite side of the second seal member is moved from a first position to a second position by the first seal member so as to block a gap between a pump side and a housing.

    STOP SEAL FOR APPLICATION OF HIGH TEMPERATURE AND HIGH PRESSURE

    公开(公告)号:US20230014978A1

    公开(公告)日:2023-01-19

    申请号:US17783150

    申请日:2019-12-31

    Abstract: A stop seal for application of high temperature and high pressure is disclosed. A stop seal contains a first seal member and a second seal member, wherein the stop seal can prevent a fluid of high temperature and high pressure from leaking into an atmospheric space because, when the fluid of high temperature is introduced and the first seal member is moved toward a direction adjacent to a pump shaft, an opposite side of the second seal member is moved from a first position to a second position by the first seal member so as to block a gap between a pump side and a housing.

    ELECTROSTATIC CHUCK AND MANUFACTURING METHOD THEREFOR

    公开(公告)号:US20210249260A1

    公开(公告)日:2021-08-12

    申请号:US16973112

    申请日:2019-10-31

    Abstract: Disclosed are: an electrostatic chuck having a high volume resistivity so as to reduce a leakage current, thereby improving the adsorption and desorption response characteristics of a semiconductor wafer; and a manufacturing method therefor. The electrostatic chuck is a sintered body in which an electrode is impregnated so as to fix a semiconductor wafer by electrostatic force, and comprises alumina, a sintering aid, and a rare earth composite oxide comprising two to five different rare earth metals, has adsorption and desorption response characteristics of a semiconductor wafer of two seconds or less, and has a volume resistivity at room temperature of 1.0E+16 Ω·cm to 1.0E+17 Ω·cm.

    Electrostatic chuck and manufacturing method therefor

    公开(公告)号:US11251061B2

    公开(公告)日:2022-02-15

    申请号:US16973112

    申请日:2019-10-31

    Abstract: Disclosed are: an electrostatic chuck having a high volume resistivity so as to reduce a leakage current, thereby improving the adsorption and desorption response characteristics of a semiconductor wafer; and a manufacturing method therefor. The electrostatic chuck is a sintered body in which an electrode is impregnated so as to fix a semiconductor wafer by electrostatic force, and comprises alumina, a sintering aid, and a rare earth composite oxide comprising two to five different rare earth metals, has adsorption and desorption response characteristics of a semiconductor wafer of two seconds or less, and has a volume resistivity at room temperature of 1.0E+16 Ω·cm to 1.0E+17 Ω·cm.

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