-
公开(公告)号:US11873905B2
公开(公告)日:2024-01-16
申请号:US17783150
申请日:2019-12-31
Applicant: FLOWSERVE KSM CO., LTD.
Inventor: Yun Ho Kim , Joo Hwan Kim
IPC: F16J15/3284 , F16J15/54 , F04D29/12
Abstract: A stop seal for application of high temperature and high pressure is disclosed. A stop seal contains a first seal member and a second seal member, wherein the stop seal can prevent a fluid of high temperature and high pressure from leaking into an atmospheric space because, when the fluid of high temperature is introduced and the first seal member is moved toward a direction adjacent to a pump shaft, an opposite side of the second seal member is moved from a first position to a second position by the first seal member so as to block a gap between a pump side and a housing.
-
公开(公告)号:US20230175591A1
公开(公告)日:2023-06-08
申请号:US17922117
申请日:2021-06-30
Applicant: FLOWSERVE KSM CO., LTD.
Inventor: Yun Ho KIM , Joo Hwan KIM
IPC: F16J15/34 , F16J15/328 , F16J15/3284 , C04B35/52 , C04B35/565
CPC classification number: F16J15/3496 , C04B35/522 , C04B35/565 , F16J15/328 , F16J15/3284
Abstract: The present invention provides a sealing member which includes a substrate including silicon carbide; and a plurality of cylindrical or polygonal columnar graphites dispersed in the substrate, and a method for manufacturing the same.
-
公开(公告)号:US20230014978A1
公开(公告)日:2023-01-19
申请号:US17783150
申请日:2019-12-31
Applicant: FLOWSERVE KSM CO., LTD.
Inventor: Yun Ho KIM , Joo Hwan KIM
Abstract: A stop seal for application of high temperature and high pressure is disclosed. A stop seal contains a first seal member and a second seal member, wherein the stop seal can prevent a fluid of high temperature and high pressure from leaking into an atmospheric space because, when the fluid of high temperature is introduced and the first seal member is moved toward a direction adjacent to a pump shaft, an opposite side of the second seal member is moved from a first position to a second position by the first seal member so as to block a gap between a pump side and a housing.
-
公开(公告)号:US20210249260A1
公开(公告)日:2021-08-12
申请号:US16973112
申请日:2019-10-31
Applicant: KSM COMPONENT CO., LTD. , FLOWSERVE KSM CO., LTD.
Inventor: Yun Ho KIM , Joo Hwan KIM , Ki Ryong LEE
IPC: H01L21/02
Abstract: Disclosed are: an electrostatic chuck having a high volume resistivity so as to reduce a leakage current, thereby improving the adsorption and desorption response characteristics of a semiconductor wafer; and a manufacturing method therefor. The electrostatic chuck is a sintered body in which an electrode is impregnated so as to fix a semiconductor wafer by electrostatic force, and comprises alumina, a sintering aid, and a rare earth composite oxide comprising two to five different rare earth metals, has adsorption and desorption response characteristics of a semiconductor wafer of two seconds or less, and has a volume resistivity at room temperature of 1.0E+16 Ω·cm to 1.0E+17 Ω·cm.
-
公开(公告)号:US09957456B2
公开(公告)日:2018-05-01
申请号:US14083511
申请日:2013-11-19
Applicant: KSM Co., LTD.
Inventor: Dae Soon Lim , Min-gun Jeong , Seo-hyun Yoon
IPC: B23B9/00 , C10M103/02 , C04B35/52
CPC classification number: C10M103/02 , C04B35/521 , C04B2235/3826 , C04B2235/963 , C10M2201/0613 , C10N2230/06 , C10N2250/08 , C10N2270/00 , C10N2280/00 , Y10T428/24355 , Y10T428/30
Abstract: Provided is a carbon layer derived from carbide ceramics, wherein metal or non-metal atoms are extracted selectively from the surface of carbide ceramics to form voids, which, in turn, are filled with carbon synthesized by a carbon compound, thereby providing improved roughness and hardness, as well as to a method for preparing the same.
-
公开(公告)号:US11251061B2
公开(公告)日:2022-02-15
申请号:US16973112
申请日:2019-10-31
Applicant: KSM COMPONENT CO., LTD. , FLOWSERVE KSM CO., LTD.
Inventor: Yun Ho Kim , Joo Hwan Kim , Ki Ryong Lee
IPC: H01L21/02 , C04B35/111 , H01L21/683 , H01L21/687 , C04B35/645 , C04B35/117
Abstract: Disclosed are: an electrostatic chuck having a high volume resistivity so as to reduce a leakage current, thereby improving the adsorption and desorption response characteristics of a semiconductor wafer; and a manufacturing method therefor. The electrostatic chuck is a sintered body in which an electrode is impregnated so as to fix a semiconductor wafer by electrostatic force, and comprises alumina, a sintering aid, and a rare earth composite oxide comprising two to five different rare earth metals, has adsorption and desorption response characteristics of a semiconductor wafer of two seconds or less, and has a volume resistivity at room temperature of 1.0E+16 Ω·cm to 1.0E+17 Ω·cm.
-
-
-
-
-