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公开(公告)号：US20140103917A1
公开(公告)日：2014-04-17
申请号：US13868482
申请日：2013-04-23
发明人： Austin Blew , Michael Bronko , Steven C. Murphy , Steve Bell
IPC分类号： G01N27/04
CPC分类号： G01N27/04 , A61B5/02028 , A61B5/053 , G01N27/023 , G01N27/028
摘要： An apparatus for testing of electrical or physical properties of a material include a single coil sensor mounted adjacent to a sample of the material. Sheet conductance of a wide variety of materials may be measured using the single coil to determine if the material conforms to generally accepted standards for the use to which the material will be put. In some examples, the material is a semiconductor wafer or flat panel. In other examples, the material is the body tissue of a patient. A non-invasive technique using the apparatus is also disclosed for monitoring the health of patient tissue such as musculature, and/or to determine whether healthy circulation is present, by measuring the conductance of the patient tissue in response to a magnetic field applied by the single coil. The single coil may be hand held, or it may be movable using an automated positioning system under computer control.
摘要翻译： 用于测试材料的电学或物理性质的装置包括邻近材料样品安装的单个线圈传感器。 可以使用单个线圈测量各种材料的片材电导，以确定材料是否符合通常接受的材料使用标准。 在一些示例中，材料是半导体晶片或平板。 在其他实例中，材料是患者的身体组织。 还公开了使用该装置的非侵入性技术，用于通过响应于由所述装置施加的磁场来测量患者组织的电导，来监测患者组织的健康，例如肌肉组织和/或确定是否存在健康的循环 单线圈 单个线圈可以是手持的，或者可以在计算机控制下使用自动定位系统来移动。
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公开(公告)号：US20160313388A1
公开(公告)日：2016-10-27
申请号：US15104281
申请日：2014-12-21
发明人： William H. Howland
IPC分类号： G01R31/265 , H02S50/15
CPC分类号： G01R31/2656 , G01R31/308 , H02S50/15
摘要： An apparatus for noncontact sensing of a voltage response characteristic and/or maximum open-circuit voltage (MOCV) of photovoltaic semiconductor specimens includes a high intensity wide spectrum light source adapted to emit light through a conductive probe tip; the conductive probe tip is situated in spatial relationship with a vacuum chuck to form a capacitive specimen wafer interrogation space upon which specimen wafers are located; the high intensity light source emits light through the conductive probe tip, said light impinges a specimen wafer located within the interrogation space, and voltage response across the probe tip, wafer interrogation space, and vacuum chuck is amplified and recorded.
摘要翻译： 用于非接触感测光伏半导体样品的电压响应特性和/或最大开路电压（MOCV）的装置包括适于通过导电探针针头发光的高强度宽谱光源; 导电探针尖端与真空卡盘处于空间关系，形成电容性试样晶片询问空间，试样晶片位于该电极上; 高强度光源通过导电探针尖端发光，所述光照射位于询问空间内的试样晶片，并且扩大和记录穿过探针尖端，晶片询问空间和真空卡盘的电压响应。
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公开(公告)号：US08996103B2
公开(公告)日：2015-03-31
申请号：US13868482
申请日：2013-04-23
发明人： Austin Blew , Michael Bronko , Steven C. Murphy , Steve Bell
CPC分类号： G01N27/04 , A61B5/02028 , A61B5/053 , G01N27/023 , G01N27/028
摘要： An apparatus for testing of electrical or physical properties of a material include a single coil sensor mounted adjacent to a sample of the material. Sheet conductance of a wide variety of materials may be measured using the single coil to determine if the material conforms to generally accepted standards for the use to which the material will be put. In some examples, the material is a semiconductor wafer or flat panel. In other examples, the material is the body tissue of a patient. A non-invasive technique using the apparatus is also disclosed for monitoring the health of patient tissue such as musculature, and/or to determine whether healthy circulation is present, by measuring the conductance of the patient tissue in response to a magnetic field applied by the single coil. The single coil may be hand held, or it may be movable using an automated positioning system under computer control.
摘要翻译： 用于测试材料的电学或物理性质的装置包括邻近材料样品安装的单个线圈传感器。 可以使用单个线圈测量各种材料的片材电导，以确定材料是否符合通常接受的材料使用标准。 在一些示例中，材料是半导体晶片或平板。 在其他实例中，材料是患者的身体组织。 还公开了使用该装置的非侵入性技术，用于通过响应于由所述装置施加的磁场来测量患者组织的电导，来监测患者组织的健康，例如肌肉组织和/或确定是否存在健康的循环 单线圈 单个线圈可以是手持的，或者可以在计算机控制下使用自动定位系统来移动。
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