OUTDOOR PHOTOLUMINESCENCE IMAGING OF PHOTOVOLTAIC ARRAYS VIA OPTICAL STRING MODULATION

    公开(公告)号:US20240283402A1

    公开(公告)日:2024-08-22

    申请号:US18570848

    申请日:2022-06-17

    IPC分类号: H02S50/15 G01N21/64 G01N21/88

    摘要: Methods and apparatus are presented for determining data indicative of a photoluminescence (PL) response to solar irradiation from at least one photovoltaic module in a first string of series-connected modules that is one of a plurality of parallel-connected strings connected to an operating inverter. Two or more signals from a module in the first string are measured while modulating its operating point by modulating the illumination intensity incident on selected portions of one or more modules in that string. Measured signals are processed to determine data indicative of a PL response from the module, discriminating the response from the much brighter reflected sunlight. Importantly, this approach has an extended effect whereby modulating the illumination incident on a subset of modules in a string affects the operating point (PL intensity) of all modules in the string, offering increased throughput, reduced cost and improved versatility for outdoor PL imaging of photovoltaic arrays.

    PHOTOVOLTAIC DEVICE TEST METHOD AND TEST APPARATUS

    公开(公告)号:US20240048099A1

    公开(公告)日:2024-02-08

    申请号:US18548307

    申请日:2022-03-22

    申请人: PASAN SA

    IPC分类号: H02S50/15

    CPC分类号: H02S50/15

    摘要: Disclosed is a method for measuring and calculating a current-voltage curve and a current mismatch between junctions of a tandem solar cell, including at least two solar subcells, the method being performed under simulated solar irradiance according to the international standard illumination AM1.5. The method implies the illumination by a first broad-spectral band light source S1 and includes steps for calculating the necessary light intensities of narrow-band second and the third light sources. The steps of the method achieve to determine adapted gains for second and the third light sources, so that the combination of the light sources S21 and S22 provide the same test results of the solar cell as when illuminated with the first light source S1 only. Also disclosed is a solar cell test apparatus configured to realize the method of the invention.

    Solar panel inspection by unmanned aerial vehicle

    公开(公告)号:US11840334B2

    公开(公告)日:2023-12-12

    申请号:US16960151

    申请日:2018-01-24

    摘要: A method for detecting a fault in a solar panel in a solar farm is disclosed. In some examples, the method includes obtaining, by a computing system (106), a first image of the solar panel captured by an unmanned aerial vehicle (UAV) (102) during a first flight and a second image of the solar panel captured by the UAV (102) during a second flight. In some examples, the method also includes determining, by the computing system (106), a first score for the solar panel based on the first image and determining a second score for the solar panel based on the second image. In some examples, the method further includes determining, by the computing system (106), whether the solar panel has the fault based on the first score and the second score and outputting an indication that the solar panel has the fault in response to determining that the solar panel has the fault.

    INSPECTION METHOD AND INSPECTION SYSTEM OF SOLAR CELL

    公开(公告)号:US20180375470A1

    公开(公告)日:2018-12-27

    申请号:US16013917

    申请日:2018-06-20

    申请人: CHROMA ATE INC.

    摘要: A method for inspecting a solar cell and configured to inspect a peeling state of a three-dimensional pattern of the solar cell includes obliquely illuminating the three-dimensional pattern of the solar cell using a light beam. An image of the solar cell is normally captured. An intensity of the light beam is increased to increase a contrast between the three-dimensional pattern and a shadow of the three-dimensional pattern in the image and increase a contrast between an ink pattern of the solar cell and the shadow in the image to overexpose the ink pattern in the image. Determine if the three-dimensional pattern is peeling according to the shadow of the three-dimensional pattern in the image.

    OPTICALLY STIMULATED ELECTRON EMISSION APPARATUS

    公开(公告)号:US20180309405A1

    公开(公告)日:2018-10-25

    申请号:US15962827

    申请日:2018-04-25

    发明人: Todd Ferrante

    IPC分类号: H02S50/15

    CPC分类号: H02S50/15

    摘要: An apparatus for inspecting a surface includes a housing and a probe. The housing includes a light source to direct light along a longitudinal axis and a shutter to selectively allow light to pass through to the probe. The probe includes a body portion and a head portion. The head portion of the probe includes a collector to detect photoelectrons emitted from the surface in response to light from the light source impinging on the surface. A proximal portion of the head portion moves relative to a distal portion of the head portion to allow for variations in angle relative to the surface.