中科微点-全球专利检索

  1. Login
  2. Sign Up

Search Results

117 records (took 0.028 seconds)

    PROFILING SYSTEM AND METHODS
    1.
    发明申请
    PROFILING SYSTEM AND METHODS 有权

    公开(公告)号：US20240403057A1

    公开(公告)日：2024-12-05

    申请号：US18733006

    申请日：2024-06-04

    Applicant: Norwegian University of Science and Technology (NTNU) ,  Universiteit Gent

    Inventor： Magnus Jahre ,  Björn Gottschall ,  Lieven Eeckhout

    IPC: G06F9/38 ,  G06F11/34

    Abstract: A processing system has a processor and profiling circuitry. The processor is configured to commit instructions in a program order, and comprises circuitry for determining and storing performance-event data for each instruction committed by the processor. The performance-event data for each instruction indicates whether the instruction experiences any of a predetermined set of one or more performance events. The profiling circuitry generates sample data at intervals, and writes the sample data to a sample register or memory. The sample data generated at each interval identifies one or more instructions that are next-to-be committed by the processor or one or more instructions that were last committed by the processor, and comprises the respective performance-event data for each of the identified instructions.

    FAULT DETECTION IN SYNCHRONOUS MACHINES
    2.
    发明申请
    FAULT DETECTION IN SYNCHRONOUS MACHINES 有权

    公开(公告)号：US20240369634A1

    公开(公告)日：2024-11-07

    申请号：US17754840

    申请日：2020-10-04

    Applicant: NORWEGIAN UNIVERSITY OF SCIENCE AND TECHNOLOGY (NTNU)

    Inventor： Hossein EHYA ,  Arne NYSVEEN

    IPC: G01R31/34

    Abstract: A method of fault detection in synchronous machines includes using at least one sensor to determine parameters linked to the magnetic field generated within the synchronous machine including parameters based on one or more of magnetic field strength, rotor current or voltage, stator current or voltage, and vibration. The sensor measurements are processed to identify data artefacts linked to the magnetic field, wherein the processing includes one or more signal processing techniques based on time, frequency, and both time and frequency. Subsequently, the output of the signal processing is analysed in order to identify and categorise irregularities in the magnetic field that are indicative of a fault in the synchronous machine. The analysing step includes recognising patterns in the processed sensor measurements, via use of computer aided pattern recognition techniques such as via machine learning algorithms.

    Optical Sensing Apparatus
    5.
    发明申请
    Optical Sensing Apparatus 有权

    公开(公告)号：US20230134264A1

    公开(公告)日：2023-05-04

    申请号：US17912327

    申请日：2021-03-18

    Applicant: NORWEGIAN UNIVERSITY OF SCIENCE AND TECHNOLOGY (NTNU)

    Inventor： Mukesh YADAV ,  Astrid AKSNES ,  Dag Roar HJELME ,  Jens HØVIK

    IPC: G01N21/77 ,  G01N21/39 ,  G01N21/45 ,  B01L3/00

    Abstract: An optical sensing apparatus is provided comprising: an input interface for receiving input light into the optical sensing apparatus; an input waveguide and a reference waveguide, both arranged to receive input light from the input interface; a closed loop resonator, wherein the input waveguide is optically coupled to the closed loop resonator at an input point for introducing input light to the closed loop resonator; a sample region, adjacent the closed loop resonator, for receiving a sample such that evanescent coupling can occur between light in the closed loop resonator and the sample; a drop-port waveguide, optically coupled to the closed loop resonator at a drop point for receiving dropped light from the closed loop resonator; an output waveguide; and an output interface. The reference waveguide and the drop-port waveguide are arranged to direct interfering light through the output waveguide to produce an output signal at the output interface.

    Detection of manipulated images
    7.
    发明授权
    Detection of manipulated images 有权

    公开(公告)号：US11450152B2

    公开(公告)日：2022-09-20

    申请号：US16625951

    申请日：2018-06-29

    Applicant: Norwegian University of Science and Technology

    Inventor： Raghavendra Ramachandra ,  Kiran Bylappa Raja ,  Sushma Venkatesh ,  Christoph Busch

    IPC: G06V40/40 ,  G06N20/00 ,  G06K9/62 ,  G06N3/04 ,  G06N3/08 ,  G06N5/04 ,  G06V10/44 ,  G06V40/16

    Abstract: An apparatus for detecting morphed or averaged images, wherein the morphed or averaged images are synthetically generated images including information from two or more different source images corresponding to two or more subjects. The apparatus may include a feature extraction module for receiving an input image and outputting a set of descriptor feature(s) characteristic of the image and a classifier module configured to allocate the input image either to a first class indicating that the image has been morphed or averaged or a second class indicating that it has not been morphed or averaged, based on the descriptor feature(s). The feature extraction module may include a plurality of neural networks providing complementary descriptor feature(s) to the classifier module. The apparatus further may include a fusion module for combining descriptor feature data from each neural network and transmitting the fused feature data to the classifier module.

    Solar cells
    8.
    发明授权
    Solar cells 有权

    公开(公告)号：US11257967B2

    公开(公告)日：2022-02-22

    申请号：US16504868

    申请日：2019-07-08

    Applicant: NORWEGIAN UNIVERSITY OF SCIENCE AND TECHNOLOGY (NTNU)

    Inventor： Helge Weman ,  Bjørn-Ove Fimland ,  Dong Chul Kim

    IPC: H01L31/0352 ,  H01L31/0304 ,  H01L31/18 ,  H01L31/0224

    Abstract: A composition of matter, in particular a photovoltaic cell, comprising: at least one core semiconductor nanowire on a graphitic substrate, said at least one core nanowire having been grown epitaxially on said substrate wherein said nanowire comprises at least one group III-V compound or at least one group II-VI compound or at least one group IV element; a semiconductor shell surrounding said core nanowire, said shell comprising at least one group III-V compound or at least one group II-VI compound or at least one group IV element such that said core nanowire and said shell form a n-type semiconductor and a p-type semiconductor respectively or vice versa; and an outer conducting coating surrounding said shell which forms an electrode contact.

    Method and Apparatus for Calibrating an Instrument for Surgical Intervention
    9.
    发明申请
    Method and Apparatus for Calibrating an Instrument for Surgical Intervention 有权

    公开(公告)号：US20210322107A1

    公开(公告)日：2021-10-21

    申请号：US17272451

    申请日：2019-09-13

    Applicant: Norwegian University of Science and Technology (NTNU)

    Inventor： Daniel Fossum Bratbak

    IPC: A61B34/20 ,  G06T7/73

    Abstract: A method of calibrating an instrument for surgical intervention is provided. The instrument to be calibrated has a tip at a distal end thereof and a navigation array that is spaced from the distal end and is detectable in space. The navigation array has a fixed spatial and angular relationship with the tip. The method comprises the steps of: placing a calibrator on the tip of the instrument such that the tip is positioned within the calibrator at a known displacement from the centre of the calibrator, the calibrator having a circular shape and being detectable as a single point in space; detecting the position of the navigation array and the centre of the calibrator; and determining the position of the centre of the calibrator relative to the navigation array, thereby calibrating the position of the tip of the instrument relative to the navigation array. There is also provided a calibrator for use in such a method.

Patent Agency Ranking