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    Method of simultaneously applying multiple illumination schemes for simultaneous image acquisition in an imaging system
    4.
    发明申请
    Method of simultaneously applying multiple illumination schemes for simultaneous image acquisition in an imaging system 审中-公开
    同时应用多个照明方案以在成像系统中同时进行图像采集的方法

    公开(公告)号：US20010030744A1

    公开(公告)日：2001-10-18

    申请号：US09740270

    申请日：2000-12-19

    Applicant: OG Technologies, Inc.

    Inventor： Tzyy-Shuh Chang

    IPC: G01N021/00

    CPC classification number: G01N21/8806 ,  G01N2021/8845

    Abstract: A method is used for imaging applications so that one can simultaneously apply multiple illumination schemes and simultaneously acquire the images, each associated with one of the multiple illumination schemes. The illumination schemes can be, but not limited to, any combination of reflective illumination, transmitive illumination (backlighting), bright field illumination, dark field illumination, diffused illumination, cloudy-day illumination, and structured illumination. The radiation can be in any wavelengths, ranging from sonic waves, ultra sound, radio waves, microwaves, infrared, near infrared, visible light, ultra violet, X-rays, and gamma rays. The radiation of each of the illumination schemes used in an imaging application is modulated, that is, affixed with a unique signature. One or more imaging devices can be used to collect the radiating rays simultaneously after the rays interact with the object(s). The image signal(s) are then demodulated, separated into several images, each is associated with an illumination scheme, based on the signatures. A preferred embodiment is to use radiation wavelengths of 430 nm, 575 nm or 670 nm as the signatures.

    Abstract translation: 一种方法用于成像应用，使得可以同时应用多个照明方案并且同时获取每个与多个照明方案之一相关联的图像。 照明方案可以是但不限于反射照明，透射照明（背光），亮场照明，暗场照明，漫射照明，阴天照明和结构照明的任何组合。 辐射可以在声波，超声，无线电波，微波，红外线，近红外线，可见光，紫外线，X射线和伽马射线的任何波长范围内。 在成像应用中使用的每个照明方案的辐射被调制，即贴上独特的签名。 可以使用一个或多个成像装置在光线与物体相互作用之后同时收集辐射光线。 然后解调图像信号，分离成几个图像，每个图像基于签名与照明方案相关联。 优选的实施方案是使用430nm，575nm或670nm的辐射波长作为特征。

    METHOD AND APPARATUS OF PROFILE MEASUREMENT
    6.
    发明申请
    METHOD AND APPARATUS OF PROFILE MEASUREMENT 审中-公开
    配置文件测量的方法和装置

    公开(公告)号：US20140152771A1

    公开(公告)日：2014-06-05

    申请号：US14091970

    申请日：2013-11-27

    Applicant: OG Technologies, Inc.

    Inventor： Tzyy-Shuh Chang

    IPC: G01B11/24 ,  H04N13/02 ,  H04N5/225

    CPC classification number: G01B11/24 ,  G01B11/25 ,  G03B35/02 ,  H04N13/239 ,  H04N13/254

    Abstract: A system and method for profile measurement based on triangulation involves arrangement of an image acquisition assembly relative to an illumination assembly such that an imaging plane is parallel to a light plane (measurement plane defined by where the light plane impinges on the object), which supports uniform pixel resolution in the imaging plane. The image acquisition assembly includes an imaging sensor having a sensor axis and a lens having a principal axis, wherein the lens axis is offset from the imaging axis.

    Abstract translation: 用于基于三角测量的轮廓测量的系统和方法涉及相对于照明组件布置图像获取组件，使得成像平面平行于由平面所在的物体所在的光平面所影响的光平面（测量平面），其支撑 在成像平面中的均匀像素分辨率。 图像采集组件包括具有传感器轴和具有主轴的透镜的成像传感器，其中透镜轴偏离成像轴。

    Apparatus and method for detecting surface defects on a workpiece such as a rolled/drawn metal bar
    7.
    发明申请
    Apparatus and method for detecting surface defects on a workpiece such as a rolled/drawn metal bar 有权
    用于检测诸如轧制/拉制金属棒的工件上的表面缺陷的装置和方法

    公开(公告)号：US20040105001A1

    公开(公告)日：2004-06-03

    申请号：US10331050

    申请日：2002-12-27

    Applicant: OG TECHNOLOGIES, INC., a MICHIGAN CORPORATION,

    Inventor： Tzyy-Shuh Chang ,  Daniel Gutchess ,  Hsun-Hau Huang

    IPC: H04N007/18 ,  H04N009/47

    CPC classification number: H04N7/18 ,  G01N21/952 ,  G01N2201/0826 ,  G01N2201/084

    Abstract: The present invention is directed to solving the problems associated with the detection of surface defects on metal bars as well as the problems associated with applying metal flat inspection systems to metal bars for non-destructive surface defects detection. A specially designed imaging system, which is comprised of a computing unit, line lights and high data rate line scan cameras, is developed for the aforementioned purpose. The target application is the metal bars (1) that have a circumference/cross-section-area ratio equal to or smaller than 4.25 when the cross section area is unity for the given shape, (2) whose cross-sections are round, oval, or in the shape of a polygon, and (3) are manufactured by mechanically cross-section reduction processes. The said metal can be steel, stainless steel, aluminum, copper, bronze, titanium, nickel, and so forth, and/or their alloys. The said metal bars can be at the temperature when they are being manufactured.

    Abstract translation: 本发明旨在解决与检测金属棒表面缺陷相关的问题以及将金属平面检查系统应用于金属棒以用于非破坏性表面缺陷检测相关的问题。 为了上述目的开发了一种专门设计的成像系统，由计算单元，线路灯和高数据速率线扫描摄像机组成。 目标应用是当给定形状的横截面积为1时，具有等于或小于4.25的圆周/横截面积比的金属棒（1），（2）横截面为圆形，椭圆形 ，或多边形的形状，（3）通过机械截面缩小工艺制造。 所述金属可以是钢，不锈钢，铝，铜，青铜，钛，镍等，和/或它们的合金。 所述金属棒可以处于制造时的温度。

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